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2013 IEEE International Test Conference (ITC) (1996)
Washington, D.C.
Oct. 20, 1996 to Oct. 25, 1996
ISBN: 0-7803-3543-0
TABLE OF CONTENTS
Introductory Section
Reviewers (PDF)
pp. 944
Author Index (PDF)
pp. 950
Session 1: Plenary
null (PDF)
pp. null
Keynote Address
Invited Address
Session 2.0: Automatic Test Generation
null (PDF)
pp. null
Peter Wohl , Advanced Test Technologies Inc., Williston, VT
pp. 13
Mitsuo Teramoto , NTT System Electronics Laboratories, Japan
Tomoo Fukazawa , NTT System Electronics Laboratories, Japan
pp. 21
J. Th. van der Linden , Delft University of Technology, The Netherlands
M. H. Konijnenburg , Delft University of Technology, The Netherlands
pp. 29
F. Corno , Politecnico di Torino, Italy
P. Prinetto , Politecnico di Torino, Italy
M. Rebaudengo , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
pp. 39
Session 3.0: BIST: Architectures And Generators
null (PDF)
pp. null
Yuejian Wu , Northern Telecom, Ontario, Canada
Saman Adham , Northern Telecom, Ontario, Canada
pp. 48
Pieter M. Trouborst , Northern Telecom, Ontario, Canada
pp. 58
Charles Stroud , University of Kentucky, Lexington, KY
Srinivasa Konala , University of Kentucky, Lexington, KY
Miron Abramovici , Bell Labs - Lucent Technologies, Murray Hill, NJ
pp. 68
Dimitris Gizopoulos , II&T, NCSR "Demokritos", Athens, Greece
Antonis Paschalis , II&T, NCSR "Demokritos", Athens, Greece
Yervant Zorian , Lucent Bell Laboratories, Princeton, NJ
pp. 76
Session 4.0: New Test Considerations For Mixed-Signal Devices
null (PDF)
pp. null
Seiji Sasho , Asahi Kasei Microsystems Co., Japan
Teruhisa Sakata , Japan Electronic Materials Co., Japan
pp. 86
Koji Asami , Advantest Corporation, Saitama, Japan
pp. 99
Session 5.0: Topics In Test Hardware
null (PDF)
pp. null
Kenji Isawa , ADVANTEST Corporation, Japan
Yoshihiro Hashimoto , ADVANTEST Corporation, Japan
pp. 112
Solomon Max , LTX Corporation - Westwood, MA
pp. 118
Steven DeFoster , IBM AS/400 Division, Rochester, MN
Dennis Karst , IBM AS/400 Division, Rochester, MN
Matthew Peterson , IBM AS/400 Division, Rochester, MN
Paul Sendelbach , IBM AS/400 Division, Rochester, MN
Kirk Kottschade , IBM AS/400 Division, Rochester, MN
pp. 127
Session 6.0: Practical And Higher-Level Fault Simulation
null (PDF)
pp. null
Bejoy G. Oomman , Genesys Testware, Fremont, CA
John Waicukauski , Advanced Test Technologies, Tualatin, OR
pp. 135
Weiwei Mao , Lucent Technologies, Allentown, PA
Ravi K. Gulati , Texas Instruments, Inc., Dallas, TX
pp. 150
Mark Aitken , Intel Corporation
Glidden Martin , Intel Corporation
Srinivasu Pappula , Intel Corporation
Bob Stettler , Intel Corporation
Praveen Vishakantaiah , Intel Corporation
Manuel d?Abreu , Level One Communications
Jacob A. Abraham , University of Texas at Austin
pp. 160
Session 7.0: BIST Pattern Generation
null (PDF)
pp. null
Nur A. Touba , University of Texas, Austin, TX
Edward J. McCluskey , Stanford University
pp. 167
Mohammed F. AlShaibi , Ministry of Interior, Saudi Arabia
pp. 176
J. Rajski , Mentor Graphics Corporation, Wilsonville, OR, USA
N. Zacharia , McGill University, Montr?al, Canada
J. A. Waicukauski , Mentor Graphics Corporation, Wilsonville, OR, USA
pp. 186
Sybille Hellebrand , University of Siegen, Germany
Hans-Joachim Wunderlich , University of Siegen, Germany
Andre Hertwig , University of Siegen, Germany
pp. 195
Session 8.0: Testing of Asynchronous Circuits
null (PDF)
pp. null
Marly Roncken , Philips Research Laboratories, the Netherlands
Eric Bruls , Philips Research Laboratories, the Netherlands
pp. 205
Marly Roncken , Philips Research Laboratories, The Netherlands
Emile Aarts , Philips Research Laboratories, The Netherlands
Wim Verhaegh , Philips Research Laboratories, The Netherlands
pp. 215
Volker Sch?ber , Universit?t Hannover, Institut f?r Theoretische Elektrotechnik
Thomas Kiel , Universit?t Hannover, Institut f?r Theoretische Elektrotechnik
pp. 225
Montek Singh , Columbia University, New York
pp. 232
Session 9.0: Industry Impact: Screening, Test, And Measurement Breakthroughs
null (PDF)
pp. null
Robert C. Aitken , Hewlett-Packard Company
Kathleen R. Kollitz , Hewlett-Packard Company
Allen C. Brown , Hewlett-Packard Company
pp. 250
Alan W. Righter , MCM Applications, Sandia National Laboratories
Richard W. Beegle , CAE and Test, Sandia National Laboratories
pp. 259
H. Sekiguchi , Fujitsu Laboratories Ltd., Japan
S. Wakana , Fujitsu Laboratories Ltd., Japan
K. Ozaki , Fujitsu Laboratories Ltd., Japan
Y. Umehara , Advantest Corporation, Japan
J. Matsumoto , Advantest Corporation, Japan
pp. 269
Session 10.0: Fault Simulation And Diagnosis of Delay Faults
null (PDF)
pp. null
Michael L. Bushnell , Rutgers University, Piscataway, NJ
Marwan A. Gharaybeh , Rutgers University, Piscataway, NJ
pp. 276
C. Landrault , Universite Montpellier II/CNRS, France
S. Pravossoudovitch , Universite Montpellier II/CNRS, France
B. Rodriguez , Universite Montpellier II/CNRS, France
pp. 286
Session 11.0: Memory Test: Design For Testability
null (PDF)
pp. null
Piero Olivo , Istituto di Ingegneria - Universit? di Ferrara, Italy
pp. 303
Anne Meixner , Intel Corporation
Jash Banik , Intel Corporation
pp. 309
Fumihiro Okuda , LTEC Corporation
Ken'ichi Shimomura , Advanced Technology R&D Center
Hiroki Shimano , Advanced Technology R&D Center
Mitsuhiro Hamada , ULSI Laboratory
Tetsuo Tada , System LSI Laboratory
Shinji Komori , Advanced Technology R&D Center
Kazuo Kyuma , Advanced Technology R&D Center
Akihiko Yasuoka , ULSI Laboratory
Haruhiko Abe , Advanced Technology R&D Center
pp. 319
Session 12.0: Board Test Challenges And Solutions
null (PDF)
pp. null
Christophe Vaucher , True Test Techniques and Training
pp. 325
Mick M. V. Tegethoff , Manufacturing Test Division, Hewlett-Packard Company, Loveland, CO
Ken Lee , HP Laboratories, Palo Alto, CA
pp. 333
Gene Wedge , Teradyne, Inc.
pp. 340
Session 13.0: Delay-Fault Testing I
null (PDF)
pp. null
Uwe Sparmann , University of Saarland, Saarbr?cken, Germany
Harry Hengster , Albert-Ludwigs-University, Freiburg, Germany
Sudhakar M. Reddy , University of Iowa, Iowa City
pp. 347
Jonathan T.-Y. Chang , Stanford University
Edward J. McCluskey , Stanford University
pp. 367
Session 14.0: Microprocessor Test
null (PDF)
pp. null
F. Pichon , Common Techniques and Technologies Unit
pp. 377
Hugo Cheung , Rockwell Semiconductor Systems, Newport Beach, CA
pp. 386
Session 15.0: An Evolving Mixed-Signal Boundary-Scan Standard
null (PDF)
pp. null
Robert J. Russell , Bull Electronics, Brighton, MA
pp. 410
Keith Lofstrom , KLIC, Beaverton, Oregon
pp. 417
Session 16.0: Delay Fault Testing II
null (PDF)
pp. null
Angela Krstic , University of California, Santa Barbara
Srimat T. Chakradhar , NEC USA, Princeton, NJ
pp. 423
G. M. Luong , Texas A&M University, College Station, TX
pp. 433
D. Karayiannis , Southern Illinois University, Carbondale
pp. 443
Session 17.0: Software For New Test Strategies
null (PDF)
pp. null
Yasuji Oyama , Advantest Corporation, Japan
Hironobu Niijima , Advantest Corporation, Japan
pp. 453
K. Helmreich , Advantest (Europe) GmbH, Germany
pp. 461
Yuhai Ma , Tsinghua University, China
pp. 471
Session 18.0: Innovations In Current Testing
null (PDF)
pp. null
James F. Plusquellic , University of Pittsburgh
Donald M. Chiarulli , University of Pittsburgh
Steven P. Levitan , University of Pittsburgh
pp. 481
Urbain Swerts , Alcatel Telecom, Belgium
Jos van Sas , Alcatel Telecom, Belgium
pp. 491
James R. Pair , Texas Instruments, Inc., Dallas, TX
Theo J. Powell , Texas Instruments, Inc., Dallas, TX
pp. 501
Session 19.0: Mixed-Signal DFT And Fault Simulation
null (PDF)
pp. null
Jordi P?rez , CNM(CSIC) - University Aut?noma de Barcelona, Spain
Ian A. Grout , Lancaster University, UK
Andrew M. D. Richardson , Lancaster University, UK
Thomas Olbrich , Lancaster University, UK
pp. 511
Prashant Goteti , University of Washington, Seattle
Mani Soma , University of Washington, Seattle
pp. 521
Session 20.0: DFT: Inching Forward With Partial-Scan Design
null (PDF)
pp. null
Vamsi Boppana , University of Illinois, Urbana
W. Kent Fuchs , Purdue University, West Lafayette, IN
pp. 538
Dong Xiang , University of Illinois at Urbana-Champaign
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 548
Paolo Prinetto , Politecnico di Torino, Italy
Maurizio Rebaudengo , Politecnico di Torino, Italy
Fulvio Corno , Politecnico di Torino, Italy
pp. 558
Session 21.0: Test Languages And Tools
null (PDF)
pp. null
Khaled Saab , OPMAX Inc, Montreal, Canada
David Marche , Ecole Polytechnique of the University of Montreal, Canada
Bozena Kaminska , Ecole Polytechnique of the University of Montreal, Canada
Guy Quesnel , Northern Research Ltd. Nepean, Ontario, Canada
pp. 571
Taratip Suwanassart , Illinois Institute of Technology, Chicago
Ilene Burnstein , Illinois Institute of Technology, Chicago
pp. 581
Session 22.0: Application of SPC to IC Design, Manufacturing And Test
null (PDF)
pp. null
Vonkyoung Kim , Colorado State University, Fort Collins
Mick Tegethoff , Hewlett-Packard Company, Loveland, CO
Tom Chen , Colorado State University, Fort Collins
pp. 590
Daniel P. Core , Intel Corporation, Aloha, Oregon
pp. 595
Jos van der Peet , Philips Semiconductors B.V.
pp. 605
Session 23.0: New Techniques For Realistic Faults
null (PDF)
pp. null
David B. Lavo , Computer Engineering University of California, Santa Cruz
Tracy Larrabee , Computer Engineering University of California, Santa Cruz
Brian Chess , Hewlett-Packard Corporation, Palo Alto, CA
pp. 611
L. Dias , INESC / IST, Portugal
F. Celeiro , INESC / IST, Portugal
M. B. Santos , INESC / IST, Portugal
J. P. Teixeira , INESC / IST, Portugal
pp. 620
Li-C Wang , University of Texas at Austin
pp. 629
Session 24: Design-For-Testability Inspirations
null (PDF)
pp. null
Tushar Gheewala , CrossCheck Technology Inc.
Sandeep Bhatia , CrossCheck Technology Inc.
pp. 639
Nagesh Tamarapalli , McGill University, Montreal. Canada
Janusz Rajski , Mentor Graphics Corp., Wilsonville, OR
pp. 649
Robert B. Norwood , Stanford University, CA
pp. 659
Session 25.0: High Frequency And Timing In ATE
null (PDF)
pp. null
Kazunori Chihara , ADVANTEST Laboratories Ltd.
Takashi Sekino , ADVANTEST Corp.
Koji Sasaki , ADVANTEST Laboratories Ltd.
pp. 669
Kenichi Fujisaki , ADVANTEST Corporation
Toshimi Ohsawa , ADVANTEST Corporation
Masaru Tsuto , ADVANTEST Corporation
pp. 677
Session 26.0: Topics In Test Engineering
null (PDF)
pp. null
Piero Franco , Stanford University, CA
Siyad Ma , Stanford University, CA
Jonathan Chang , Stanford University, CA
Yi-Chin Chu , Stanford University, CA
Sanjay Wattal , Stanford University, CA
E. J. McCluskey , Stanford University, CA
Robert L. Stokes , Hughes Aircraft Company, Los Angeles, CA
William D. Farwell , Hughes Aircraft Company, Los Angeles, CA
pp. 691
Session 27.0: System Test: Practical Aspects, Partitioning And Simulation
null (PDF)
pp. null
Wuudiann Ke , Lucent Technologies, Princeton, New Jersey
pp. 717
Yves Le Traon , LSR-IMAG, France
Chantal Robach , LSR-IMAG, France
pp. 725
Pablo S?nchez , ETSIIyT. University of Cantabria
pp. 732
Session 28.0: Test Synthesis Solutions
null (PDF)
pp. null
Tom Eberle , A Lockheed Martin Company
Bob McVay , A Lockheed Martin Company
Chris Meyers , A Lockheed Martin Company
Jason Moore , A Lockheed Martin Company
pp. 741
Chris Ellingham , Synopsys, Inc, Mountain View, CA
James Beausang , Synopsys, Inc, Mountain View, CA
pp. 751
Vishwani D. Agrawal , Lucent Technologies, Murray Hill, NJ
Maurizio Damiani , Synopsys, Inc., Mountain View, CA
pp. 757
Session 29.0: Advanced Fault Modelling Techniques
null (PDF)
pp. null
Yuyun Liao , Texas A&M University, College Station, TX
D. M. H. Walker , Texas A&M University, College Station, TX
pp. 767
R. H. Dennard , IBM, Yorktown, New York
R. Kapur , IBM, Mountain View, CA
T. W. Williams , IBM, Boulder, Colorado
W. Maly , CMU, Pittsburgh, Pennsylvania
pp. 786
Session 30.0: Test Economic Issues
null (PDF)
pp. null
Mick Tegethoff , Hewlett Packard,Loveland, CO
Brenton White , Hewlett Packard Laboratories, Eugene, OR
pp. 800
Matthew Boutin , Stratus Computer, Inc., Marlboro, MA
pp. 809
Session 31.0: MCM Test: Methods And Applications
null (PDF)
pp. null
K. Sasidhar , Georgia Institute of Technology
A. Chatterjee , Georgia Institute of Technology
Y. Zorian , Lucent Bell Laboratories
pp. 818
Andrew Flint , Motorola, Incorporated, Austin, Texas
pp. 828
Edward P. Sayre , North East Systems Associates, Inc.
pp. 834
Session D1.0: Design Validation: Methodologies And Case Studies
null (PDF)
pp. null
Noel R. Strader , Motorola, Inc., Austin, TX
W. C. Bruce , Motorola, Inc., Austin, TX
Jaehong Park , Motorola, Inc., Austin, TX
Matt Kaufmann , Motorola, Inc., Austin, TX
Kurt Shultz , Motorola, Inc., Austin, TX
Michael Burns , Motorola, Inc., Austin, TX
Carl Pixley , Motorola, Inc., Austin, TX
Jun Yuan , Motorola, Inc., Austin, TX
Janet Nguyen , Motorola, Inc., Austin, TX
pp. 839
Neeta Ganguly , Motorola Inc, Austin, TX
Magdy Abadir , Motorola Inc, Austin, TX
Manish Pandey , Motorola Inc, Austin, TX
pp. 857
Session D2.0: Hybrid Validation And Test Techniques
null (PDF)
pp. null
Kwang-Ting Cheng , University of California, Santa Barbara
Kuang-Chien Chen , Fujitsu Labs. of America
Uwe Glaeser , The German National Research
pp. 865
Jacob A. Abraham , University of Texas at Austin, TX
Dinos Moundanos , University of Texas at Austin, TX
pp. 875
Session D3.0: Design Validation: From System Specification to Process Effects
null (PDF)
pp. null
Duncan Clarke , University of Pennsylvania, Philadelphia
pp. 894
Irith Pomeranz , University of Iowa, Iowa City
Richard Reeve , HaL Computer Systems, Campbell, CA
Paritosh Kulkarni , HaL Computer Systems, Campbell, CA
Yan A. Li , HaL Computer Systems, Campbell, CA
pp. 904
Melvin A. Breuer , University of Southern California, Los Angeles
Sandeep K. Gupta , University of Southern California, Los Angeles
pp. 914
Session L1: Unpowered Opens Testing
null (PDF)
pp. null
Kenneth P. Parker , Hewlett Packard Manufacturing Test Division, Loveland, CO
pp. 924
Ted T. Turner , Hewlett-Packard Company
pp. 925
Stig Oresjo , Hewlett-Packard Company, Loveland, Colorado
pp. 929
Session L2: Practical Aspects of IC Diagnosis & Failure Analysis: A Walk Through The Process
null (PDF)
pp. null
David P. Vallett , IBM Microelectronics Division, Essex Junction, Vermont
pp. 930
Robert C. Aitken , Hewlett Packard Co., Palo Alto, CA
pp. 931
Keith Baker , Philips ED&T, Eindhoven, The Netherlands
Jos van Beers , Philips Research Laboratories, Eindhoven, The Netherlands
pp. 932
Karl Johnson , Texas Instruments Incorporated, Stafford, TX
Jeff Platt , Texas Instruments Incorporated, Stafford, TX
Anjali Jones , Texas Instruments Incorporated, Stafford, TX
Jayashree Saxena , Texas Instruments Incorporated, Dallas, TX
pp. 934
Richard E. Anderson , Sandia National Laboratories, Albuquerque, NM
Jerry M. Soden , Sandia National Laboratories, Albuquerque, NM
pp. 935
Panel 1: Why Do We Talk About DFT When The Problem Is Bad Design And Bad CAD Tools
null (PDF)
pp. null
William R. Simpson , Institute for Defense Analyses
pp. 937
Panel 2: Asynchronous Design: Nightmare or Opportunity?
null (PDF)
pp. null
S. B. Furber , The University of Manchester, Oxford Road, UK
pp. 938
Marly Roncken , Philips Research Laboratories, The Netherlands
pp. 939
Panel 5: DFT For Embedded Cores
null (PDF)
pp. null
Panel 6: What Are The Next Generation Test Methodologies For Board And System Test?
null (PDF)
pp. null
Peter Dziel , Stratus Computer, Inc., Marlboro, MA
pp. 941
Panel 7: Will I<sub>DDQ</sub> Testing Leak Away In Deep Sub-Micron Technology?
null (PDF)
pp. null
Manoj Sachdev , Philips Research Laboratories, The Netherlands
pp. 942
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