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International Test Conference 1996 (ITC'96)
A Novel Approach to the Analysis of VLSI Device Test Programs
Washington, D.C.
October 20-October 25
ISBN: 0-7803-3543-0
| ASCII Text | x | ||
| Yuhai Ma, Wanchun Shi, "A Novel Approach to the Analysis of VLSI Device Test Programs," 2012 IEEE International Test Conference, pp. 471, International Test Conference 1996 (ITC'96), 1996. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1996.557059, author = {Yuhai Ma and Wanchun Shi}, title = {A Novel Approach to the Analysis of VLSI Device Test Programs}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1996}, issn = {1089-3539}, pages = {471}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1996.557059}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - A Novel Approach to the Analysis of VLSI Device Test Programs SN - 1089-3539 SP EP A1 - Yuhai Ma, A1 - Wanchun Shi, PY - 1996 KW - FCE (Fuzzy Comprehensive Evaluation) KW - Reference Set KW - Evaluation Space KW - Evaluation Factor KW - Evaluation Remark KW - Fuzzy Relation KW - Test Entity KW - Relevance Coefficient VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
Being short of the formal theory and methodology of program debugging, the aim of the investigation in this paper is to create an approach to support analysis and debugging of VLSI device test programs. In research into the previous work, we find that there are two restrictions in program debugging: computational complexity and diagnostic precision, which greatly influence the effect of program debugging. We apply Fuzzy Mathematics, especially Fuzzy Comprehensive Evaluation, to researches on fuzzy knowledge representation, fuzzy relation, and fuzzy knowledge representation, fuzzy relation, and fuzzy inference, etc. in the test programs analysis. In the paper, we analyze the construction of the test program, present the concept of test entities, and build the evaluation space of the test entities, etc. At last, we address an algorithm, with an example, of the selection of the test entities to be debugged.
Index Terms:
FCE (Fuzzy Comprehensive Evaluation), Reference Set, Evaluation Space, Evaluation Factor, Evaluation Remark, Fuzzy Relation, Test Entity, Relevance Coefficient
Citation:
Yuhai Ma, Wanchun Shi, "A Novel Approach to the Analysis of VLSI Device Test Programs," itc, pp.471, International Test Conference 1996 (ITC'96), 1996
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