ISBN: 1-58113-576-9

Kouji Ohboshi, NTT DoCoMo,Inc.

M. Balakrishnan, Indian Institute of Technology Delhi, India

Anshul Kumar, Indian Institute of Technology Delhi, India

Paolo Ienne, Swiss Federal Institute of Technology Lausanne (EPFL), Switzerland

Anup Gangwar, Indian Institute of Technology Delhi, India

Bhuvan Middha, Indian Institute of Technology Delhi, India

Frank Vahid, University of California, Riverside and the Center for Embedded Computer Systems at UC Irvine

Susan Cotterell, University of California, Riverside

Nader Bagherzadeh, University of California, Irvine, CA

Pai H. Chou, University of California, Irvine, CA

Jinfeng Liu, University of California, Irvine, CA

Daniel Gajski, University of California, Irvine, CA

Junyu Peng, University of California, Irvine, CA

Ahmed A. Jerraya, Laboratoire TIMA, Grenoble cedex, France

Damien Lyonnard, Laboratoire TIMA, Grenoble cedex, France

Samy Meftali, Laboratoire TIMA, Grenoble cedex, France

Fr?d?ric Rousseau, Laboratoire TIMA, Grenoble cedex, France

F?rid Gharsalli, Laboratoire TIMA, Grenoble cedex, France

Hiroto Yasuura, Kyushu University, Kasuga, Japan

Yun Cao, Kyushu University, Kasuga, Japan

Mohammad Mesbah Uddin, Kyushu University, Kasuga, Japan

Guido Araujo, IC-UNICAMP, Campinas, SP, Brazil

Sharad Malik, Princeton University, Princeton, NJ

Zhining Huang, Princeton University, Princeton, NJ

Nahri Moreano, DCT-UFMS, Campo Grande, MS, Brazil

Carles Rodoreda Sala, Sony Espa?a S.A. Design Division, Viladecavalls - Barcelona, Spain

Natalino G. Bus?, Philips Research Laboratories, Eindhoven, The Netherlands

Sanjay Rajopadhye, Colorado State University

Steven Derrien, IRISA, France

Oliver Bringmann, FZI Forschungszentrum Informatik, Karlsruhe, Germany

Wolfgang Rosenstiel, Universit?t T?bingen, T?bingen, Germany

Carsten Menn, FZI Forschungszentrum Informatik, Karlsruhe, Germany

Andrew S. Cassidy, Carnegie Mellon University, Pittsburgh, PA

Christopher P. Andrews, Carnegie Mellon University, Pittsburgh, PA

Donald E. Thomas, Carnegie Mellon University, Pittsburgh, PA

JoAnn M. Paul, Carnegie Mellon University, Pittsburgh, PA

E. A. de Kock, Philips Research, Eindhoven, The Netherlands

Takao Onoye, Kyoto University, Kyoto, Japan

Yukihiro Nakamura, Kyoto University, Kyoto, Japan

Atsuhito Shigiya, Kyoto University, Kyoto, Japan

Keishi Chikamura, Kyoto University, Kyoto, Japan

Kosuke Tsujino, Kyoto University, Kyoto, Japan

Tomonori Izumi, Kyoto University, Kyoto, Japan

Hirofumi Yamamoto, Kyoto University, Kyoto, Japan

Catherine H. Gebotys, University of Waterloo, Waterloo, Canada

Ingo Sander, Royal Institute of Technology, Stockholm, Sweden

Axel Jantsch, Royal Institute of Technology, Stockholm, Sweden

Zhonghai Lu, Royal Institute of Technology, Stockholm, Sweden

Paolo Ienne, EPFL, Lausanne, Switzerland

Patrick Thiran, EPFL, Lausanne, Switzerland

Giovanni De Micheli, Stanford University, Calif., USA

Fr?d?ric Worm, EPFL, Lausanne, Switzerland

Shuichi Sakai, The University of Tokyo, Tokyo, Japan

Satoshi Matsushita, NEC Corporation, Sagamihara, Kanagawa, JAPAN

Mitsuhisa Sato, University of Tsukuba, Tsukuba, Japan

Rudy Lauwereins, K.U.Leuven-ESAT

Chun Wong, K.U.Leuven-ESAT

Paul Marchal, K.U.Leuven-ESAT

Johan Vounckx, K.U.Leuven-ESAT

Patrick David, K.U.Leuven-ESAT

Stefaan Himpe, K.U.Leuven-ESAT

Francky Catthoor, K.U.Leuven-ESAT

Peng Yang, K.U.Leuven-ESAT

Alex Nicolau, University of California, Irvine, California

Nikil Dutt, University of California, Irvine, California

Aviral Shrivastava, University of California, Irvine, California

Partha Biswas, University of California, Irvine, California

Ashok Halambi, University of California, Irvine, California

Abhik Roychoudhury, National University of Singapore, Republic of Singapore

Xianfeng Li, National University of Singapore, Republic of Singapore

Tulika Mitra, National University of Singapore, Republic of Singapore

W. Fornaciari, Politecnico di Milano, Piazza L. da Vinci, Milano, Italy

V. Trianni, Politecnico di Milano, Piazza L. da Vinci, Milano, Italy

C. Brandolese, Politecnico di Milano, Piazza L. da Vinci, Milano, Italy

D. Sciuto, Politecnico di Milano, Piazza L. da Vinci, Milano, Italy

F. Salice, Politecnico di Milano, Piazza L. da Vinci, Milano, Italy

G. Beltrame, CEFRIEL Research Centre, Via R. Fucini, Milano, Italy

Haris Lekatsas, NEC USA, Princeton, NJ, USA

Wayne Wolf, Princeton University, Princeton, NJ, USA

Yuan Xie, Princeton University, Princeton, NJ, USA

Bin Xiao, University of Texas at Dallas, Richardson, Texas

Zili Shao, University of Texas at Dallas, Richardson, Texas

Chantana Chantrapornchai, Silpakorn University, Nakorn Pathom, Thailand

Edwin H.-M. Sha, University of Texas at Dallas, Richardson, Texas

Qingfeng Zhuge, University of Texas at Dallas, Richardson, Texas

Rainer D?mer, University of California, Irvine, USA

Andreas Gerstlauer, University of California, Irvine, USA

Wolfgang Mueller, Paderborn University, Paderborn, Germany

Petru Eles, IDA, Linkopings universitet, 581 83 Linkoping, Sweden

Zebo Peng, IDA, Linkopings universitet, 581 83 Linkoping, Sweden

Daniel Karlsson, IDA, Linkopings universitet, 581 83 Linkoping, Sweden

Ahmed Amine Jerraya, SLS Group, TIMA Laboratory, Grenoble, France

Sungjoo Yoo, SLS Group, TIMA Laboratory, Grenoble, France

Aimen Bouchhima, SLS Group, TIMA Laboratory, Grenoble, France

Gabriela Nicolescu, SLS Group, TIMA Laboratory, Grenoble, France

Rajesh K. Gupta, University of California, Irvine, California

Sandeep K. Shukla, University of California, Irvine, California

Nick Savoiu, University of California, Irvine, California

Soonhoi Ha, Seoul National Univ., Seoul, Korea

Sungchan Kim, Seoul National Univ., Seoul, Korea

Chan-Eun Rhee, Seoul National Univ., Seoul, Korea

Hyunguk Jung, Seoul National Univ., Seoul, Korea

Youngmin Yi, Seoul National Univ., Seoul, Korea

Dohyung Kim, Seoul National Univ., Seoul, Korea

M. Balakrishnan, Indian Institute of Technology Delhi, India

Anshul Kumar, Indian Institute of Technology Delhi, India

C. P. Joshi, Indian Institute of Technology Delhi, India

J? Ruf, University of T?bingen

Thomas Kropf, University of T?bingen

Jochen Klose, University of Oldenburg

Hiroto Yasuura, Kyushu University, Japan

Naofumi Takagi, Nagoya University, Japan

Srivaths Ravi, NEC

Michael Torla, Motorola

Cathy Gebotys, University of Waterloo, Canada

Anand Raghunathan, NEC USA, Princeton, NJ

Nachiketh Potlapally, NEC USA, Princeton, NJ

Srivaths Ravi, NEC USA, Princeton, NJ

Hiroto Yasuura, Kyushu University, Fukuoka 816-8580, Japan

Hiroyuki Tomiyama, Institute of Systems&Information Technologies, Momochihama, Fukuoka 814-0001, Japan

Takanori Okuma, Kyushu University, Fukuoka 816-8580, Japan

Yun Cao, Kyushu University, Fukuoka 816-8580, Japan

Nikil Dutt, Univ. of California, Irvine, CA

Dan Hirschberg, Univ. of California, Irvine, CA

Mahesh Mamidipaka, Univ. of California, Irvine, CA

M. Balakrishnan, Indian Institute of Technology, Delhi, India

Peter Marwedel, University of Dortmund, 44221 Dortmund, Germany

Lars Wehmeyer, University of Dortmund, 44221 Dortmund, Germany

Nils Grunwald, University of Dortmund, 44221 Dortmund, Germany

Rajeshwari Banakar, Indian Institute of Technology, Delhi, India

Stefan Steinke, University of Dortmund, 44221 Dortmund, Germany

Alex Orailoglu, University of California, San Diego

Peter Petrov, University of California, San Diego

Abhijit Chatterjee, Georgia Institute of Technology

Peeter Ellervee, Tallinn Technical University

Vincent J. Mooney, Georgia Institute of Technology

Jun Cheol Park, Georgia Institute of Technology

Kyu-Won Choi, Georgia Institute of Technology

Kiran Puttaswamy, Georgia Institute of Technology

Daniel D. Gajski, University of California, Irvine, Irvine, CA

Andreas Gerstlauer, University of California, Irvine, Irvine, CA

Luciano Lavagno, Politecnico di Torino, Turin, ITALY

Mihai Lazarescu, Cadence Design Systems, Inc., Turin, ITALY

Stefano Quer, Politecnico di Torino, Turin, ITALY

Sergio Nocco, Politecnico di Torino, Turin, ITALY

Claudio Passerone, Politecnico di Torino, Turin, ITALY

Gianpiero Cabodi, Politecnico di Torino, Turin, ITALY

Vincent J. Mooney, Georgia Institute of Technology, Atlanta, GA

George F. Riley, Georgia Institute of Technology, Atlanta, GA

Eung S. Shin, Georgia Institute of Technology, Atlanta, GA

Tsuneo Nakata, Fujitsu Laboratories Limited, Kawasaki 211-8588, Japan

Akio Matsuda, Fujitsu Laboratories Limited, Kawasaki 211-8588, Japan

Minoru Shoji, Fujitsu Limited, Kawasaki 211-8588, Japan

Shinya Kuwamura, Fujitsu Laboratories Limited, Kawasaki 211-8588, Japan

Qiang Zhu, Fujitsu Laboratories Limited, Kawasaki 211-8588, Japan

Juan Carlos L?pez, U. of Castilla-La Mancha, Ciudad Real, Spain

Fernando Rinc?, U. of Castilla-La Mancha, Ciudad Real, Spain

Francisco Moya, U. of Castilla-La Mancha, Ciudad Real, Spain

Jos? M. Moya, Technical University of Madrid, Madrid, Spain

Alex Nicolau, University of California at Irvine

Nikil Dutt, University of California at Irvine

Rajesh Gupta, University of California at Irvine

Nick Savoiu, University of California at Irvine

Mehrdad Reshadi, University of California at Irvine

Sumit Gupta, University of California at Irvine