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17th International Symposium on Software Reliability Engineering (ISSRE'06)
Raleigh, North Carolina
November 07-November 10
ISBN: 0-7695-2684-5
Table of Contents
Introduction
Keynotes
C.V. Ramamoorth, University of California, Berkeley
pp. 3-4
Panel Summaries
Testing I
Marc II Fisher, University of Nebraska-Lincoln
Gregg Rothermel, University of Nebraska-Lincoln
Tyler Creelan, Oregon State University
Margaret Burnett, Oregon State University
pp. 13-22
Wes Masri, American University of Beirut, Lebanon
Nagi Nahas, American University of Beirut, Lebanon
Andy Podgurski, Case Western Reserve University, Cleveland, OH
pp. 23-32
Scott McMaster, University of Maryland, College Park, Maryland
Atif Memon, University of Maryland, College Park, Maryland
pp. 33-44
Metrics
Vibhu Saujanya Sharma, Indian Institute of Technology Kanpur, India
Pankaj Jalote, Indian Institute of Technology Kanpur, India
pp. 45-51
Testing II
Jun Yan, Chinese Academy of Sciences
Zhongjie Li, IBM China Research Lab
Yuan Yuan, IBM China Research Lab
Wei Sun, IBM China Research Lab
Jian Zhang, Chinese Academy of Sciences
pp. 75-84
Erwan Brottier, France Télécom R&D
Franck Fleurey, IRISA- 35042 Rennes Cedex - France
Jim Steel, IRISA- 35042 Rennes Cedex - France
Benoit Baudry, IRISA- 35042 Rennes Cedex - France
Yves Le Traon, France Télécom R&D
pp. 85-94
Besnik Seljimi, Universit? Joseph Fourier - Laboratoire LSR-IMAG
Ioannis Parissis, Universit? Joseph Fourier - Laboratoire LSR-IMAG
pp. 105-116
Security
Nick Bartlow, West Virginia University, Morgantown, WV 26506, USA
Bojan Cukic, West Virginia University, Morgantown, WV 26506, USA
pp. 117-126
Xiaoling Cui, Chinese Academy of Sciences
Lei Li, University of Science & Technology of China
Jun Wei, Chinese Academy of Sciences
pp. 127-135
Ashish Aggarwal, Indian Institute of Technology(IIT), India
Pankaj Jalote, Indian Institute of Technology(IIT), India
pp. 146-158
Testing III
Qing Xie, University of Maryland, College Park, MD
Atif M Memon, University of Maryland, College Park, MD
pp. 159-168
Jon S. B?kken, Washington State University
Roger T. Alexander, Washington State University
pp. 169-178
Tao Xie, North Carolina State University, USA
Jianjun Zhao, Shanghai Jiao Tong University, China
Darko Marinov, University of Illinois at Urbana-Champaign, USA
David Notkin, University of Washington, USA
pp. 179-190
Experience Reports I
Gunnar Kudrjavets, Microsoft Corporation, Redmond, WA
Nachiappan Nagappan, Microsoft Research, Redmond, WA
Thomas Ball, Microsoft Research, Redmond, WA
pp. 204-212
Experience Reports II
Robyn Lutz, Jet Propulsion Lab/Caltech and Iowa State University
Ann Patterson-Hine, NASA Ames Research Center
Anupa Bajwa, UARC, NASA Ames
pp. 213-220
Eduardo Aranha, Federal University of Pernambuco, Brazil
Paulo Borba, Federal University of Pernambuco, Brazil
Jos? Lima, Mobile Devices R&D Motorola Industrial Ltda
pp. 231-236
Paola Bracchi, West Virginia University, USA
Bojan Cukic, West Virginia University, USA
Vittorio Cortellessa, Universita degli Studi di L?Aquila, Italy
pp. 237-246
Testing IV
Yu Lei, University of Texas at Arlington
Richard Carver, George Mason University
David Kung, University of Texas at Arlington
Vidur Gupta, University of Texas at Arlington
Monica Hernandez, University of Texas at Arlington
pp. 256-265
Modeling I
Lin Zuo, Chinese Academy of Sciences, Beijing, P.R. China
Shaohua Liu, Chinese Academy of Sciences, Beijing, P.R. China
Jun Wei, Chinese Academy of Sciences, Beijing, P.R. China
pp. 279-288
Hiroyuki Okamura, Hiroshima University, Japan
Tadashi Dohi, Hiroshima University, Japan
pp. 289-298
Static and Dynamic Analysis
Mithun Acharya, North Carolina State University
Tao Xie, North Carolina State University
Jun Xu, North Carolina State University
pp. 311-320
David Owen, West Virginia University, Morgantown, WV
Dejan Desovski, West Virginia University, Morgantown, WV
Bojan Cukic, West Virginia University, Morgantown, WV
pp. 321-330
Madeline Diep, University of Nebraska - Lincoln
Myra Cohen, University of Nebraska - Lincoln
Sebastian Elbaum, University of Nebraska - Lincoln
pp. 331-342
Modeling II
Tools
Mark Sherriff, North Carolina State University
Laurie Williams, North Carolina State University
pp. 375-384
A. Capozucca, LASSY, University of Luxembourg, Luxembourg
N. Guelfi, LASSY, University of Luxembourg, Luxembourg
P. Pelliccione, LASSY, University of Luxembourg, Luxembourg
A. Romanovsky, University of Newcastle upon Tyne - UK
A. Zorzo, Pontifical Catholic University of RS - Brazil
pp. 385-394
Author Index
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