- I
- ISSRE
- 2006
- 17th International Symposium on Software Reliability Engineering (ISSRE'06)
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17th International Symposium on Software Reliability Engineering (ISSRE'06) Raleigh, North Carolina November 07-November 10 ISBN: 0-7695-2684-5 Table of Contents
 | Introduction |
 | Keynotes |
 | Panel Summaries |
 | Testing I |
Wes Masri, American University of Beirut, Lebanon
Nagi Nahas, American University of Beirut, Lebanon pp. 23-32
Atif Memon, University of Maryland, College Park, Maryland pp. 33-44
 | Metrics |
 | Testing II |
Jun Yan, Chinese Academy of Sciences pp. 75-84
Jim Steel, IRISA- 35042 Rennes Cedex - France pp. 85-94
 | Security |
Nick Bartlow, West Virginia University, Morgantown, WV 26506, USA
Bojan Cukic, West Virginia University, Morgantown, WV 26506, USA pp. 117-126
Lei Li, University of Science & Technology of China
Jun Wei, Chinese Academy of Sciences pp. 127-135
 | Testing III |
Qing Xie, University of Maryland, College Park, MD pp. 159-168
Tao Xie, North Carolina State University, USA pp. 179-190
 | Experience Reports I |
Xuan Wang, West Virginia University, Morgantown, WV pp. 197-203
 | Experience Reports II |
Robyn Lutz, Jet Propulsion Lab/Caltech and Iowa State University pp. 213-220
Jos? Lima, Mobile Devices R&D Motorola Industrial Ltda pp. 231-236
 | Testing IV |
Yu Lei, University of Texas at Arlington pp. 256-265
 | Modeling I |
Lin Zuo, Chinese Academy of Sciences, Beijing, P.R. China
Shaohua Liu, Chinese Academy of Sciences, Beijing, P.R. China
Jun Wei, Chinese Academy of Sciences, Beijing, P.R. China pp. 279-288
 | Static and Dynamic Analysis |
Tao Xie, North Carolina State University
Jun Xu, North Carolina State University pp. 311-320
David Owen, West Virginia University, Morgantown, WV pp. 321-330
 | Modeling II |
 | Tools |
N. Guelfi, LASSY, University of Luxembourg, Luxembourg
A. Zorzo, Pontifical Catholic University of RS - Brazil pp. 385-394
 | Author Index | Usage of this product signifies your acceptance of the Terms of Use.
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