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2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) (2005)
Chicago, Illinois
Nov. 8, 2005 to Nov. 11, 2005
ISBN: 0-7695-2482-6
TABLE OF CONTENTS
Papers
Introduction
pp. xii
Panel: How Should Software Reliability Engineering Be Taught?
Dependability and Safety Analysis
Josh Dehlinger , Iowa State University
Robyn Lutz , Iowa State University and Jet Propulsion Laboratory
pp. 21-30
Sebastian Elbaum , University of Nebraska-Lincoln
Kalyan-Ram Chilakamarri , University of Nebraska-Lincoln
Bhuvana Gopal , University of Nebraska-Lincoln
Gregg Rothermel , University of Nebraska-Lincoln
pp. 31-40
Software Reliability
Margaret Hamill , West Virginia University
Katerina Goševa-Popstojanova , West Virginia University
pp. 43-52
Dejan Desovski , West Virginia University
Walid Abdelmoez , West Virginia University
Petar Popic , West Virginia University
pp. 53-62
Xiaojun Li , University of Maryland at College Park
Bing Huang , University of Maryland at College Park
Joseph Bernstein , University of Maryland at College Park
Carol Smidts , University of Maryland at College Park
pp. 63-72
Coverage and Testing Strategy
Laurie Williams , North Carolina State University
Jason Osborne , North Carolina State University
Mladen Vouk , North Carolina State University
Nachiappan Nagappan , Microsoft Research
pp. 85-94
Y. Labiche , Carleton University
Q. Lin , Carleton University
pp. 95-104
Reliability for Network and Communication Protocols
Sergio Mena , École Polytechnique Fédérale de Lausanne
Claudio Basile , University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk , University of Illinois at Urbana-Champaign
André Schiper , École Polytechnique Fédérale de Lausanne
Ravi K. Iyer , University of Illinois at Urbana-Champaign
pp. 107-116
Vulnerability Assessment
O. H. Alhazmi , Colorado State University
Y. K. Malaiya , Colorado State University
pp. 129-138
Matin Tamizi , University of Maryland at College Park
Michel Cukier , University of Maryland at College Park
pp. 139-148
Hisashi Kobayashi , Hiroshima University
Hiroyuki Okamura , Hiroshima University
pp. 149-158
Reliability Modeling and Analysis
Xia Cai , Chinese University of Hong Kong
Mladen A. Vouk , North Carolina State University
pp. 161-170
Eduardo Oliveira Costa , Federal University of Paraná
Aurora Pozo , Federal University of Paraná
Gustavo Souza , Federal University of Paraná
pp. 171-180
Software Fault Model and Quality Prediction
Fei Xing , Beijing Normal University
Ping Guo , Beijing Normal University and Chinese University of Hong Kong
Michael R. Lyu , Chinese University of Hong Kong
pp. 213-222
Test Generation
Soumen Maity , Indian Institute of Technology - Guwahati
pp. 235-244
Mark Harman , King?s College London
S. Chung , Illinois Institute of Technology
P. Apirukvorapinit , Illinois Institute of Technology
R. Gupta , Illinois Institute of Technology
Bogdan Korel , Illinois Institute of Technology
pp. 245-254
Software Testing
Wuzhi Xu , George Mason University
Jeff Offutt , George Mason University
Juan Luo , George Mason University
pp. 257-266
Yong Lei , University of Western Ontario
James H. Andrews , University of Western Ontario
pp. 267-276
Tao Xie , North Carolina State University
David Notkin , University of Washington
pp. 277-287
Techniques and Tools
Allen P. Nikora , Jet Propulsion Laboratory/California Institute of Technology
pp. 291-300
David Leon , Corporacion NGS
Andy Podgurski , Case Western Reserve University
William Dickinson , Fused MultiModality Imaging
pp. 311-321
Testing Concurrent and Multimodal Systems
Laya Madani , Laboratoire LSR-IMAG
Catherine Oriat , Laboratoire LSR-IMAG
Ioannis Parissis , Laboratoire LSR-IMAG
Jullien Bouchet , Laboratoire CLIPS-IMAG
Laurence Nigay , Laboratoire CLIPS-IMAG
pp. 325-334
Jiale Huo , McGill University
Alexandre Petrenko , Centre de recherche informatique de Montr?al (CRIM)
pp. 335-345
Yu Lei , University of Texas at Arlington
pp. 346-355
Author Index
Author Index (PDF)
pp. 357
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