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16th IEEE International Symposium on Software Reliability Engineering (ISSRE'05)
Chicago, Illinois
November 08-November 11
ISBN: 0-7695-2482-6
Table of Contents
Papers
Introduction
Panel: How Should Software Reliability Engineering Be Taught?
Dependability and Safety Analysis
Jing Liu, Iowa State University
Josh Dehlinger, Iowa State University
Robyn Lutz, Iowa State University and Jet Propulsion Laboratory
pp. 21-30
Sebastian Elbaum, University of Nebraska-Lincoln
Kalyan-Ram Chilakamarri, University of Nebraska-Lincoln
Bhuvana Gopal, University of Nebraska-Lincoln
Gregg Rothermel, University of Nebraska-Lincoln
pp. 31-40
Software Reliability
Petar Popic, West Virginia University
Dejan Desovski, West Virginia University
Walid Abdelmoez, West Virginia University
Bojan Cukic, West Virginia University
pp. 53-62
Bing Huang, University of Maryland at College Park
Xiaojun Li, University of Maryland at College Park
Ming Li, University of Maryland at College Park
Joseph Bernstein, University of Maryland at College Park
Carol Smidts, University of Maryland at College Park
pp. 63-72
Coverage and Testing Strategy
Nachiappan Nagappan, Microsoft Research
Laurie Williams, North Carolina State University
Jason Osborne, North Carolina State University
Mladen Vouk, North Carolina State University
Pekka Abrahamsson, VTT Technical Research Center of Finland
pp. 85-94
Reliability for Network and Communication Protocols
Sergio Mena, École Polytechnique Fédérale de Lausanne
Claudio Basile, University of Illinois at Urbana-Champaign
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign
André Schiper, École Polytechnique Fédérale de Lausanne
Ravi K. Iyer, University of Illinois at Urbana-Champaign
pp. 107-116
Vulnerability Assessment
O. H. Alhazmi, Colorado State University
Y. K. Malaiya, Colorado State University
pp. 129-138
Matin Tamizi, University of Maryland at College Park
Matt Weinstein, University of Maryland at College Park
Michel Cukier, University of Maryland at College Park
pp. 139-148
Reliability Modeling and Analysis
Xia Cai, Chinese University of Hong Kong
Michael R. Lyu, Chinese University of Hong Kong
Mladen A. Vouk, North Carolina State University
pp. 161-170
Eduardo Oliveira Costa, Federal University of Paraná
Silvia R. Vergilio, Federal University of Paraná
Aurora Pozo, Federal University of Paraná
Gustavo Souza, Federal University of Paraná
pp. 171-180
Software Fault Model and Quality Prediction
Fei Xing, Beijing Normal University
Ping Guo, Beijing Normal University and Chinese University of Hong Kong
Michael R. Lyu, Chinese University of Hong Kong
pp. 213-222
Test Generation
Soumen Maity, Indian Institute of Technology - Guwahati
Amiya Nayak, University of Ottawa
pp. 235-244
Bogdan Korel, Illinois Institute of Technology
Mark Harman, King?s College London
S. Chung, Illinois Institute of Technology
P. Apirukvorapinit, Illinois Institute of Technology
R. Gupta, Illinois Institute of Technology
Q. Zhang, Illinois Institute of Technology
pp. 245-254
Software Testing
Wuzhi Xu, George Mason University
Jeff Offutt, George Mason University
Juan Luo, George Mason University
pp. 257-266
Yong Lei, University of Western Ontario
James H. Andrews, University of Western Ontario
pp. 267-276
Techniques and Tools
David Leon, Corporacion NGS
Andy Podgurski, Case Western Reserve University
William Dickinson, Fused MultiModality Imaging
pp. 311-321
Testing Concurrent and Multimodal Systems
Laya Madani, Laboratoire LSR-IMAG
Catherine Oriat, Laboratoire LSR-IMAG
Ioannis Parissis, Laboratoire LSR-IMAG
Jullien Bouchet, Laboratoire CLIPS-IMAG
Laurence Nigay, Laboratoire CLIPS-IMAG
pp. 325-334
Jiale Huo, McGill University
Alexandre Petrenko, Centre de recherche informatique de Montr?al (CRIM)
pp. 335-345
Author Index
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