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  • 15th International Symposium on Software Reliability Engineering (ISSRE'04)
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15th International Symposium on Software Reliability Engineering (ISSRE'04)
Saint-Malo, Bretagne, France
November 02-November 05
ISBN: 0-7695-2215-7
Table of Contents
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Preface (PDF)
pp. ix-ix
Session 1A: Testing I
Michael Ellims, Pi Technology, Cambridge England
James Bridges, Pi Technology, Cambridge England
Darrel C. Ince, Open University, Milton Keynes, England
pp. 3-13
A. Denise, L.R.I., Universit? Paris-Sud
M.-C. Gaudel, L.R.I., Universit? Paris-Sud
S.-D. Gouraud, L.R.I., Universit? Paris-Sud
pp. 25-34
Session 1B: Reliability I
Pankaj Jalote, Microsoft Corporation, Redmond, USA
Brendan Murphy, Microsoft Research, Cambridge, UK
pp. 47-53
M. Li, University of Maryland at College Park, MD
Y. Wei, University of Maryland at College Park, MD
D. Desovski, West Virginia University, WV
H. Nejad, University of Maryland at College Park, MD
S. Ghose, University of Maryland at College Park, MD
B. Cukic, West Virginia University, WV
C. Smidts, University of Maryland at College Park, MD
pp. 66-76
Paola Bracchi, West Virginia University, Morgantown, WV
Bojan Cukic, West Virginia University, Morgantown, WV
Vittorio Cortellessa, Universit? degli Studi di L'Aquila, Italy
pp. 77-88
Session 1C: Empirical Studies
Hyunsook Do, University of Nebraska - Lincoln
Gregg Rothermel, University of Nebraska - Lincoln
Alex Kinneer, University of Nebraska - Lincoln
pp. 113-124
Xia Cai, The Chinese University of Hong Kong
Michael R. Lyu, The Chinese University of Hong Kong
pp. 125-136
Session 2A: Testing II
Nikolai Kosmatov, Lehrstuhl D f?r Mathematik, Aachen, Germany
Bruno Legeard, Universit? de Franche-Comt? - CNRS - INRIA, France
Fabien Peureux, Universit? de Franche-Comt? - CNRS - INRIA, France
Mark Utting, The University of Waikato, New Zealand
pp. 139-150
Jim Steel, INRIA/Irisa, University of Rennes 1, France
Michael Lawley, University of Queensland, Australia
pp. 151-160
Session 2B: Security
Jeff Offutt, George Mason University, Fairfax, VA
Ye Wu, George Mason University, Fairfax, VA
Xiaochen Du, George Mason University, Fairfax, VA
Hong Huang, George Mason University, Fairfax, VA
pp. 187-197
Wes Masri, Case Western Reserve University, Cleveland, OH
Andy Podgurski, Case Western Reserve University, Cleveland, OH
David Leon, Case Western Reserve University, Cleveland, OH
pp. 198-209
Yao-Wen Huang, National Taiwan University, Taipei; Academia Sinica, Taipei, Taiwan
Chung-Hung Tsai, National Taiwan University, Taipei
D. T. Lee, Academia Sinica, Taipei, Taiwan; National Taiwan University, Taipei
Sy-Yen Kuo, National Taiwan University, Taipei
pp. 219-230
Session 2C: Tools and Automation I
Nick Rutar, University of Maryland, College Park
Christian B. Almazan, University of Maryland, College Park
Jeffrey S. Foster, University of Maryland, College Park
pp. 245-256
Vadim Alyokhin, TU M?nchen, Germany
Benedikte Elbel, Siemens AG, M?nchen, Germany
Martin Rothfelder, Siemens AG, M?nchen, Germany
Alexander Pretschner, ETH Z?rich, Switzerland
pp. 257-268
Martin Davidsson, North Carolina State University, Raleigh, NC
Jiang Zheng, North Carolina State University, Raleigh, NC
Nachiappan Nagappan, North Carolina State University, Raleigh, NC
Laurie Williams, North Carolina State University, Raleigh, NC
Mladen Vouk, North Carolina State University, Raleigh, NC
pp. 269-280
Session 3A: Testing III
S. Mankefors-Christiernin, University of Trollh?ttan/Uddevalla, Sweden
A. Boklund, University of Trollh?ttan/Uddevalla, Sweden
pp. 283-294
Dejan Desovski, West Virginia University
Vijai Gandikota, West Virginia University
Yan Liu, West Virginia University
Yue Jiang, West Virginia University
Bojan Cukic, West Virginia University
pp. 306-313
Mechelle Gittens, University of Waterloo, Canada
Hanan Lutfiyya, University of Western Ontario, Canada
Michael Bauer, University of Western Ontario, Canada
pp. 314-325
Session 3B: Tools and Automation II
Brahmila Kamalakar, Colorado State University, Fort Collins
Sudipto Ghosh, Colorado State University, Fort Collins
Peter Vile, Colorado State University, Fort Collins
pp. 352-363
Session 3C: Reliability II
Yun Liu, Duke University, Durham, NC
Veena B. Mendiratta, Lucent Technologies, Naperville, IL
Kishor S. Trivedi, Duke University, Durham, NC
pp. 367-378
William H. Farr, Naval Surface Warfare Center Dahlgren Division
John R. Crigler, Naval Surface Warfare Center Dahlgren Division
Dolores R. Wallace, NASA Goddard Space Flight Center
pp. 379-390
Katerina Goseva-Popstojanova, West Virginia University, Morgantown, WV
Sunil Mazimdar, West Virginia University, Morgantown, WV
Ajay Deep Singh, West Virginia University, Morgantown, WV
pp. 403-414
Session 4: Quality Assurance
Lan Guo, West Virginia University, Morgantown, WV
Yan Ma, West Virginia University, Morgantown, WV
Bojan Cukic, West Virginia University, Morgantown, WV
Harshinder Singh, West Virginia University, Morgantown, WV
pp. 417-428
Nachiappan Nagappan, North Carolina State University, Raleigh, NC
Laurie Williams, North Carolina State University, Raleigh, NC
John Hudepohl, Nortel Networks, Software Dependability Design (SWDD), Research Triangle Park, NC
Will Snipes, Nortel Networks, Software Dependability Design (SWDD), Research Triangle Park, NC
Mladen Vouk, North Carolina State University, Raleigh, NC
pp. 429-439
Jo?o W. Cangussu, University of Texas at Dallas
Richard M. Karcich, Network Storage, Broomfield, CO
Aditya P. Mathur, Purdue University, West Lafayette-IN
Raymond A. DeCarlo, Purdue University, West Lafayette-IN
pp. 440-450
Patrick Francis, Case Western Reserve University, Cleveland, OH
David Leon, Case Western Reserve University, Cleveland, OH
Melinda Minch, Case Western Reserve University, Cleveland, OH
Andy Podgurski, Case Western Reserve University, Cleveland, OH
pp. 451-462
Author Index (PDF)
pp. 463-463
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