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14th International Symposium on Software Reliability Engineering
Denver, Colorado
November 17-November 21
ISBN: 0-7695-2007-3
Table of Contents
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Session 1A: Test Effectiveness I
L. C. Briand, Carleton University, Ottawa, Canada
Y. Labiche, Carleton University, Ottawa, Canada
Y. Wang, Carleton University, Ottawa, Canada
pp. 14
Pankaj Jalote, Indian Institute of Technology Kanpur, India
Bijendra Vishal, Indian Institute of Technology Kanpur, India
pp. 26
Laurie Williams, North Carolina State University
E. Michael Maximilien, IBM Corporation and North Carolina State University
Mladen Vouk, North Carolina State University
pp. 34
Session 1B: Requirements Analysis
Ruilian Zhao, Beijing University of Chemical Technology
Michael R. Lyu, Chinese University of Hong Kong
Yinghua Min, Chinese Academy of Sciences in Beijing
pp. 60
Session 2A: Test Effectiveness II
Paul Ammann, George Mason University, Fairfax, VA
Jeff Offutt, George Mason University, Fairfax, VA
Hong Huang, George Mason University, Fairfax, VA
pp. 99
Sebastian Elbaum, University of Nebraska - Lincoln, Nebraska
Satya Kanduri, University of Nebraska - Lincoln, Nebraska
Anneliese Amschler Andrews, Washington State University, Pullman, WA
pp. 108
Michael R. Lyu, The Chinese University of Hong Kong
Zubin Huang, The Chinese University of Hong Kong
Sam K. S. Sze, The Chinese University of Hong Kong
Xia Cai, The Chinese University of Hong Kong
pp. 119
Session 2B: Secure Systems
Hongxia Jin, IBM Almaden Research Center, San Jose, CA
Jeffery Lotspiech, IBM Almaden Research Center, San Jose, CA
pp. 133
Mike Jochen, University of Delaware
Lisa M. Marvel, U.S. Army Research Laboratory
Lori L. Pollock, University of Delaware
pp. 143
Sung Kim, Univ. of Texas at Dallas
Farokh B. Bastani, Univ. of Texas at Dallas
I-Ling Yen, Univ. of Texas at Dallas
Ing-Ray Chen, Virginia Tech (VPI&SU)
pp. 154
Session 2C: Formal Reliability Analysis
David Coppit, The College of William and Mary
Robert R. Painter, The College of William and Mary
Kevin J. Sullivan, The University of Virginia
pp. 169
Session 3A: Empirical Studies and Tools
Sherif Yacoub, Hewlett-Packard Laboratories, Palo Alto, CA
Xiaofan Lin, Hewlett-Packard Laboratories, Palo Alto, CA
Steve Simske, Hewlett-Packard Laboratories, Palo Alto, CA
John Burns, Hewlett-Packard Laboratories, Palo Alto, CA
pp. 203
Sousuke Amasaki, Osaka University, Japan
Yasunari Takagi, OMRON Corporation, Japan
Osamu Mizuno, Osaka University, Japan
Tohru Kikuno, Osaka University, Japan
pp. 215
R. Torkar, University of Trollh?ttan/Uddevalla
S. Mankefors, University of Trollh?ttan/Uddevalla
K. Hansson, University of Trollh?ttan/Uddevalla
A. Jonsson, University of Trollh?ttan/Uddevalla
pp. 227
Session 3B: Software Reliability Modeling
Session 4A: Empirical Studies
Dorron Levy, Comverse Technology Inc., and Chillarege Inc.
Ram Chillarege, Comverse Technology Inc., and Chillarege Inc.
pp. 271
David Saff, MIT Computer Science & Artificial Intelligence Lab
Michael D. Ernst, MIT Computer Science & Artificial Intelligence Lab
pp. 281
Wen-Li Wang, Penn State University, Behrend College Erie
Mei-Huei Tang, Gannon University
pp. 293
Session 4B: Architectural Approaches I
Sudipto Ghosh, Colorado State University, Fort Collins
Robert France, Colorado State University, Fort Collins
Conrad Braganza, Colorado State University, Fort Collins
Nilesh Kawane, Colorado State University, Fort Collins
Anneliese Andrews, Washington State University, Pullman, WA
Orest Pilskalns, Washington State University, Pullman, WA
pp. 332
Session 4C: Panel Position Statement
Session 5A: Software Testing
Linda J. Moore, University of Colorado at Denver
Angelica R. Moya, University of Colorado at Denver
pp. 375
Session 5B: Architectural Analysis II
Hui Ma, University of Texas at Dallas
I-Ling Yen, University of Texas at Dallas
Farokh Bastani, University of Texas at Dallas
Kendra Cooper, University of Texas at Dallas
pp. 383
Myra B. Cohen, University of Auckland, New Zealand
Charles J. Colbourn, Arizona State University, Tempe
Alan C. H. Ling, University of Vermont, Burlington
pp. 394
Olivier Marin, University of Le Havre; University Paris 6 - CNRS
Marin Bertier, University Paris 6 - CNRS
Pierre Sens, INRIA, France
pp. 406
Session 6A: Metrics
Pierre-Luc Brunelle, ?cole Polytechnique, Montr?al, Canada
Ettore Merlo, ?cole Polytechnique, Montr?al, Canada
Giuliano Antoniol, University of Sannio, Benevento, Italy
pp. 419
James Law, Oregon State University, Corvallis
Gregg Rothermel, Oregon State University, Corvallis
pp. 430
Session 6B: Probabilistic Analysis
Bin Li, University of Maryland, College Park
Ming Li, University of Maryland, College Park
Susmita Ghose, University of Maryland, College Park
Carol Smidts, University of Maryland, College Park
pp. 457
S. Mankefors, University of Trollh?ttan/Uddevalla
R. Torkar, University of Trollh?ttan/Uddevalla
A. Boklund, University of Trollh?ttan/Uddevalla
pp. 468
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