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Proceedings 13th International Symposium on Software Reliability Engineering (2002)
Annapolis, MD, USA
Nov. 12, 2002 to Nov. 15, 2002
ISBN: 0-7695-1763-3
TABLE OF CONTENTS
Preface (PDF)
pp. ix
Reviewers (PDF)
pp. xii
Session 1A: Testing with Formal Methods
Tim Menzies , West Virginia University
David Owen , West Virginia University
Bojan Cukic , West Virginia University
pp. 15
Session 2A: Reliability Modeling
Wen-Li Wang , Penn State University, Behrend College Erie
pp. 41
Kirk Sayre , University of Tennessee
Jesse Poore , University of Tennessee
pp. 53
Session 3A: Failure Detection and Recovery
Session 1B: Assessment of Testing
Bernard J. Bossuyt , Naval Postgraduate School
Byron B. Snyder , Naval Postgraduate School
pp. 117
Chin-Yu Huang , National Taiwan University
Jung-Hua Lo , National Taiwan University
Sy-Yen Kuo , National Taiwan University
Michael R. Lyu , The Chinese University of Hong Kong
pp. 129
Session 2B: High Availability Software Maintenance
Gholamali C. Shoja , University of Victoria
Hausi A. Müller , University of Victoria
Anand Srinivasan , University of Victoria
pp. 149
Kishor S. Trivedi , Duke University
Yue Ma , Motorola Inc.
Yun Liu , Duke University
Haim Levendel , Motorola Inc.
pp. 159
Satoshi Miyahara , Hiroshima University
Tadashi Dohi , Hiroshima University
pp. 171
Session 1C: Testing Technologies
Ponrudee Netisopakul , Case Western Reserve University
John Morris , University of Western Australia
Daniel Hoffman , University of Victoria
pp. 183
Jeff Offutt , George Mason University
Rodger T. Alexander , Colorado State University
pp. 207
Session 2C: System Analysis
Dingding Lu , Iowa State University
pp. 231
Session 1D: Practical Experience with Testing
Dalai Jin , Oregon State University
Gregg Rothermel , Oregon State Universtiy
Marc Fisher II , Oregon State University
pp. 257
L.C. Briand , Carleton University
M. Di Penta , Universtiy of Sannio
Y. Labiche , Carleton University
pp. 269
Session 2D: Reliability Prediction and Analysis
Peter G. Bishop , Adelard and Centre for Software Reliability
Robin E. Bloomfield , Adelard and Centre for Software Reliability
pp. 295
Session 1E: Software Mutation
João Durães , Polytechnic Institute of Coimbra,
pp. 329
Roger T. Alexander , Colorado State University
Sudipto Ghosh , Colorado State University
Bixia Ji , Colorado State Universtiy
pp. 341
Yu-Seung Ma , Korea Adv Inst of Sci & Tech
Yong-Rae Kwon , Korea Adv Inst of Sci & Tech
Jeff Offutt , George Mason University
pp. 352
Session 2E: Reliability Assessment
Farokh B. Bastani , Univ. of Texas at Dallas
I-Ling Yen , Univ. of Texas at Dallas
Ing-Ray Chen , Virginia Tech
pp. 367
João W. Cangussu , University of Texas at Dallas
Aditya P. Mathur , Purdue University
Raymond A. DeCarlo , Purdue University
pp. 377
John C. Munson , University of Idaho
pp. 388
Author Index (PDF)
pp. 397
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