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13th International Symposium on Software Reliability Engineering (ISSRE'02)
Annapolis, Maryland
November 12-November 15
ISBN: 0-7695-1763-3
Table of Contents
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Session 1A: Testing with Formal Methods
Tim Menzies, West Virginia University
David Owen, West Virginia University
Bojan Cukic, West Virginia University
pp. 15
Session 2A: Reliability Modeling
Wen-Li Wang, Penn State University, Behrend College Erie
Mei-Hwa Chen, State University of New York at Albany
pp. 41
Session 3A: Failure Detection and Recovery
Session 1B: Assessment of Testing
Chin-Yu Huang, National Taiwan University
Jung-Hua Lo, National Taiwan University
Sy-Yen Kuo, National Taiwan University
Michael R. Lyu, The Chinese University of Hong Kong
pp. 129
Session 2B: High Availability Software Maintenance
Lizhou Yu, University of Victoria
Gholamali C. Shoja, University of Victoria
Hausi A. Müller, University of Victoria
Anand Srinivasan, University of Victoria
pp. 149
Session 1C: Testing Technologies
Ponrudee Netisopakul, Case Western Reserve University
Lee White, Case Western Reserve University
John Morris, University of Western Australia
Daniel Hoffman, University of Victoria
pp. 183
Rodger T. Alexander, Colorado State University
Jeff Offutt, George Mason University
James M. Bieman, Colorado State University
pp. 207
Session 2C: System Analysis
Dingding Lu, Iowa State University
Robyn R. Lutz, Iowa State University and Jet Propulsion Laboratory
pp. 231
Session 1D: Practical Experience with Testing
Marc Fisher II, Oregon State University
Dalai Jin, Oregon State University
Gregg Rothermel, Oregon State Universtiy
Margaret Burnett, Oregon State University
pp. 257
G. Antoniol, University of Sannio
L.C. Briand, Carleton University
M. Di Penta, Universtiy of Sannio
Y. Labiche, Carleton University
pp. 269
Session 2D: Reliability Prediction and Analysis
Peter G. Bishop, Adelard and Centre for Software Reliability
Robin E. Bloomfield, Adelard and Centre for Software Reliability
pp. 295
Session 1E: Software Mutation
Roger T. Alexander, Colorado State University
James M. Bieman, Colorado State University
Sudipto Ghosh, Colorado State University
Bixia Ji, Colorado State Universtiy
pp. 341
Yu-Seung Ma, Korea Adv Inst of Sci & Tech
Yong-Rae Kwon, Korea Adv Inst of Sci & Tech
Jeff Offutt, George Mason University
pp. 352
Session 2E: Reliability Assessment
Farokh B. Bastani, Univ. of Texas at Dallas
Sung Kim, Univ. of Texas at Dallas
I-Ling Yen, Univ. of Texas at Dallas
Ing-Ray Chen, Virginia Tech
pp. 367
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