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11th International Symposium on Software Reliability Engineering (ISSRE'00)
San Jose, California
October 08-October 11
ISBN: 0-7695-0807-3
Table of Contents
Keynote
Discard the Bathtub Model for the Shower Model
Panel
Everything You Wanted to Know About Software Reliability Engineering but Didn't Know Who to Ask
OO Methods
Benoit Baudry, Universitaire de Beaulieu
Vu Le Hanh, Universitaire de Beaulieu
Jean-Marc Jézéquel, Universitaire de Beaulieu
Yves Le Traon, Universitaire de Beaulieu
pp. 4
Saida Benlarbi, Alcatel CID
Khaled El Emam, National Research Council, Canada
Nishith Goel, Cistel Technology
Shesh Rai, St. Jude Children's Research Hospital
pp. 24
Modeling
Chin-Yu Huang, National Taiwan University
Sy-Yen Kuo, National Taiwan University
Jung-Hua Lo, National Taiwan University
Michael R. Lyu, Chinese University of Hong Kong
pp. 72
Testing I
Chien-Hung Liu, University of Texas at Arlington
David C. Kung, University of Texas at Arlington
Pei Hsia, University of Texas at Arlington
Chih-Tung Hsu, Sun Microsystems, Inc.
pp. 84
Quantitative Methods
Lionel C. Briand, Carleton University
Bernd Freimut, Fraunhofer Institute for Engineering Experimental Software Engineering
Ferdinand Vollei, Siemens AG
pp. 124
Testability
Daniel Brand, IBM T. J. Watson Research Center
pp. 174
Anneliese von Mayrhauser, Colorado State University
Michael Scheetz, Colorado State University
Eric Dahlman, Colorado State University
Adele E. Howe, Colorado State University
pp. 186
Risk Assessment
Tim Menzies, West Virginia University
Bojan Cukic, West Virginia University
Harhsinder Singh, West Virginia University
John Powell, West Virginia University
pp. 222
Measures
M. Li, University of Maryland at College Park
C. Smidts, University of Maryland at College Park
R.W. Brill, U.S. Nuclear Regulatory Commission
pp. 246
Taghi M. Khoshgoftaar, Florida Atlantic University
Vishal Thaker, Florida Atlantic University
Edward B. Allen, Mississippi State University
pp. 259
Safety
Pathirage Gamini Wijayarathna, University of Electro-Communications
Mamoru Maekawa, University of Electro-Communications
pp. 283
Testing II
Sam K.S. Sze, Hong Kong and Shanghai Banking Corporation
Michael R. Lyu, Chinese University of Hong Kong
pp. 327
Theory
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