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2013 IEEE 24th International Symposium on Software Reliability Engineering (ISSRE) (2000)
San Jose, California
Oct. 8, 2000 to Oct. 11, 2000
ISBN: 0-7695-0807-3
TABLE OF CONTENTS
Foreword (PDF)
pp. viii
Keynote
Panel
OO Methods
Benoit Baudry , Universitaire de Beaulieu
Vu Le Hanh , Universitaire de Beaulieu
Jean-Marc Jézéquel , Universitaire de Beaulieu
Yves Le Traon , Universitaire de Beaulieu
pp. 4
Roger T. Alexander , George Mason University
A. Jefferson Offutt , George Mason University
pp. 15
Saida Benlarbi , Alcatel CID
Khaled El Emam , National Research Council, Canada
Nishith Goel , Cistel Technology
Shesh Rai , St. Jude Children's Research Hospital
pp. 24
Modeling
Yashwant K. Malaiya , Colorado State University
Jason Denton , Colorado State University
pp. 62
Chin-Yu Huang , National Taiwan University
Sy-Yen Kuo , National Taiwan University
Jung-Hua Lo , National Taiwan University
Michael R. Lyu , Chinese University of Hong Kong
pp. 72
Testing I
Chien-Hung Liu , University of Texas at Arlington
David C. Kung , University of Texas at Arlington
Pei Hsia , University of Texas at Arlington
Chih-Tung Hsu , Sun Microsystems, Inc.
pp. 84
Brian J. Taylor , Institute for Software Research
Bojan Cukic , West Virginia University
pp. 97
Lee White , Case Western Reserve University
Husain Almezen , Case Western Reserve University
pp. 110
Quantitative Methods
Lionel C. Briand , Carleton University
Bernd Freimut , Fraunhofer Institute for Engineering Experimental Software Engineering
Ferdinand Vollei , Siemens AG
pp. 124
Testability
Yves Le Traon , Universitaire de Beaulieu
Chantal Robach , LCIS-ESISAR
pp. 162
Daniel Brand , IBM T. J. Watson Research Center
pp. 174
Anneliese von Mayrhauser , Colorado State University
Michael Scheetz , Colorado State University
Eric Dahlman , Colorado State University
Adele E. Howe , Colorado State University
pp. 186
Risk Assessment
Taghi M. Khoshgoftaar , Florida Atlantic University
Ruqun Shan , Florida Atlantic University
Edward B. Allen , Mississippi State University
pp. 198
Sherif M. Yacoub , West Virginia University
Hany H. Ammar , West Virginia University
Tom Robinson , West Virginia University
pp. 210
Tim Menzies , West Virginia University
Bojan Cukic , West Virginia University
Harhsinder Singh , West Virginia University
John Powell , West Virginia University
pp. 222
Measures
M. Li , University of Maryland at College Park
C. Smidts , University of Maryland at College Park
R.W. Brill , U.S. Nuclear Regulatory Commission
pp. 246
Taghi M. Khoshgoftaar , Florida Atlantic University
Vishal Thaker , Florida Atlantic University
Edward B. Allen , Mississippi State University
pp. 259
Safety
David Coppit , University of Virginia
Kevin J. Sullivan , University of Virginia
Joanne Bechta Dugan , University of Virginia
pp. 270
Pathirage Gamini Wijayarathna , University of Electro-Communications
Mamoru Maekawa , University of Electro-Communications
pp. 283
Nimal Nissanke , South Bank University
Hamdan Z. Dammag , University of Reading
pp. 293
Testing II
Anders Wesslén , Lund University
Per Runeson , Lund University
Björn Regnell , Lund University
pp. 317
Sam K.S. Sze , Hong Kong and Shanghai Banking Corporation
Michael R. Lyu , Chinese University of Hong Kong
pp. 327
M. Popovic , University of Novi Sad
V. Kovacevic , University of Novi Sad
M. Skrbic , IBC-TEL Ltd.
pp. 336
Theory
Martin Kappes , Avaya Labs
Reinhard P. Klemm , Lucent Technologies, Bell Laboratories
pp. 356
Sebastian Elbaum , University of Nebraska at Lincoln
John C. Munson , Cylant Technology, LLC
pp. 365
Author Index (PDF)
pp. 377
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