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11th International Symposium on Software Reliability Engineering (ISSRE'00)
Planner Based Error Recovery Testing
San Jose, California
October 08-October 11
ISBN: 0-7695-0807-3
| ASCII Text | x | ||
| Anneliese von Mayrhauser, Michael Scheetz, Eric Dahlman, Adele E. Howe, "Planner Based Error Recovery Testing," 2012 IEEE 23rd International Symposium on Software Reliability Engineering, pp. 186, 11th International Symposium on Software Reliability Engineering (ISSRE'00), 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/ISSRE.2000.885871, author = {Anneliese von Mayrhauser and Michael Scheetz and Eric Dahlman and Adele E. Howe}, title = {Planner Based Error Recovery Testing}, journal ={2012 IEEE 23rd International Symposium on Software Reliability Engineering}, volume = {0}, year = {2000}, issn = {1071-9458}, pages = {186}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2000.885871}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 23rd International Symposium on Software Reliability Engineering TI - Planner Based Error Recovery Testing SN - 1071-9458 SP EP A1 - Anneliese von Mayrhauser, A1 - Michael Scheetz, A1 - Eric Dahlman, A1 - Adele E. Howe, PY - 2000 VL - 0 JA - 2012 IEEE 23rd International Symposium on Software Reliability Engineering ER - | |||
Error recovery testing is an important part of software testing, especially for safety-critical systems. We show how an AI planning system and concepts of mutation testing can be combined to generate error recovery tests for software. We identify a set of mutation operations on the representation that the planner uses when generating test cases. These mutations cause error recovery test cases to be generated. The paper applies these concepts to the testing of a large tape storage system.
Citation:
Anneliese von Mayrhauser, Michael Scheetz, Eric Dahlman, Adele E. Howe, "Planner Based Error Recovery Testing," issre, pp.186, 11th International Symposium on Software Reliability Engineering (ISSRE'00), 2000
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