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The Ninth International Symposium on Software Reliability Engineering
Industrial Application of Criticality Predictions in Software Development
Paderborn, Germany
November 04-November 07
ISBN: 0-8186-8991-9
| ASCII Text | x | ||
| C. Ebert, E. Baisch, "Industrial Application of Criticality Predictions in Software Development," 2012 IEEE 23rd International Symposium on Software Reliability Engineering, pp. 80, The Ninth International Symposium on Software Reliability Engineering, 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/ISSRE.1998.730845, author = {C. Ebert and E. Baisch}, title = {Industrial Application of Criticality Predictions in Software Development}, journal ={2012 IEEE 23rd International Symposium on Software Reliability Engineering}, volume = {0}, year = {1998}, issn = {1071-9458}, pages = {80}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.1998.730845}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 23rd International Symposium on Software Reliability Engineering TI - Industrial Application of Criticality Predictions in Software Development SN - 1071-9458 SP EP A1 - C. Ebert, A1 - E. Baisch, PY - 1998 VL - 0 JA - 2012 IEEE 23rd International Symposium on Software Reliability Engineering ER - | |||
Citation:
C. Ebert, E. Baisch, "Industrial Application of Criticality Predictions in Software Development," issre, pp.80, The Ninth International Symposium on Software Reliability Engineering, 1998
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