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Eighth International Symposium on Software Reliability Engineering (ISSRE '97)
Albuquerque, NM
November 02-November 05
ISBN: 0-8186-8120-9
Table of Contents
Opening Remarks
Keynote: Inspections and Testing: Core Competence for Reliability Engineering
Keynote: Launching Automated SRE Company Wide
Session 1: Fault-Prone Module Identification: Session Chair: F. Bastani
Taghi M. Khoshgoftaar, Florida Atlantic University
K. Ganesan, Florida Atlantic University
Edward B. Allen, Florida Atlantic University
Fletcher D. Ross, Florida Atlantic University
Rama Munikoti, Nortel Technology
Nishith Goel, Nortel Technology
Amit Nandi, Nortel Technology
pp. 27
Session 2: Error Detection and Handling: Session Chair: J. Laprie
B.R. Pekilis, Bell Canada Software Reliability Laboratory University of Waterloo
R.E. Seviora, Bell Canada Software Reliability Laboratory University of Waterloo
pp. 38
T. Savor, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
R.E. Seviora, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
pp. 48
K.-P. Vo, AT&T Bell Labs., Florham Park, NJ, USA
Y.-M. Wang, AT&T Bell Labs., Florham Park, NJ, USA
P.E. Chung, AT&T Bell Labs., Florham Park, NJ, USA
Y. Huang, AT&T Bell Labs., Florham Park, NJ, USA
pp. 60
Session 3: Test Strategies: Session Chair: A. Mathur
Session 4: Industry Practice 1: Software Reliability Engineering Applications: Session Chair: G. Stark
Session 5: Modeling Reliability Growth: Session Chair: A. Pasquini
M. Xie, Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore
G.Y. Hong, Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore
C. Wohlin, Dept. of Ind. & Syst. Eng., Nat. Univ. of Singapore, Singapore
pp. 116
Session 6: Panel: Qualifying the Reliability of COTS Software Components: Coordinator: J. Voas: Panelists: C. Howell, W. Everett, J. Laprie
Session 7: System Reliability I: Session Chair: K. Kanoun
S. Krishnamurthy, Software Eng. Res. Center, Purdue Univ., West Lafayette, IN, USA
A.P. Mathur, Software Eng. Res. Center, Purdue Univ., West Lafayette, IN, USA
pp. 146
H.H. Ammar, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
T. Nikzadeh, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
J.B. Dugan, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
pp. 156
Session 8: High Reliability/Operational Profile: Session Chair: M. Lyu
Ken Chruscielski, Lockheed Martin Tactical Aircraft Systems
Jeff Tian, Southern Methodist University
pp. 203
Session 9: Panel: Software Reliability Standards: Coordinator: D. Peercy: Panelists: M. Wild, P. Lakey, H. Hecht, N. Schneidewind, W. Farr, K. Williamson
Keynote: Software Reliability in Theory and Practice: L. Dalton
Session 10: Panel: Large-Scale Software Testing: Coordinator: R. Horgan
Session 11: Process and Quality: Session Chair: R. Sheldon
Lionel C. Briand, Laitenberger Fraunhofer Institute for Experimental Software Engineering
Khaled El Emam, Laitenberger Fraunhofer Institute for Experimental Software Engineering
Bernd Freimut, Laitenberger Fraunhofer Institute for Experimental Software Engineering
Oliver Laitenberger, Laitenberger Fraunhofer Institute for Experimental Software Engineering
pp. 234
Session 12: Industry Practice 2: Software Process Effectiveness: Session Chair: K. Kalaichelvan
Session 13: Test Effectiveness: Session Chair: M. Ohba
M.-H. Chen, State Univ. of New York, Albany, NY, USA
H.M. Kao, State Univ. of New York, Albany, NY, USA
pp. 275
Session 14: High Reliability: Session Chair: M. Vouk
Session 15: Vendor Presentations
Session 16: System Reliability II: Session Chair: A. Nikora
C. Smidts, Maryland Univ., College Park, MD, USA
D. Sova, Maryland Univ., College Park, MD, USA
G.K. Mandela, Maryland Univ., College Park, MD, USA
pp. 324
M.R. Lyu, AT&T Bell Labs., Murray Hill, NJ, USA
S. Rangarajan, AT&T Bell Labs., Murray Hill, NJ, USA
A.P.A. van Moorsel, AT&T Bell Labs., Murray Hill, NJ, USA
pp. 336
S. Risuleo, Univ. "La Sapienza", Rome, Italy
A. Rizzo, Univ. of Sienna
V. Veneziano, Centre for Software Reliability, London, United Kingdom
pp. 348
Session 17: Software Reliability Growth Modeling Applications: Session Chair: M. Blackledge
M.A. Quereshi, Performance Anal. Dept., AT&T Bell Labs., Holmdel, NJ, USA
D.R. Jeske, Performance Anal. Dept., AT&T Bell Labs., Holmdel, NJ, USA
pp. 358
Session 18: Quality and Metrics: Session Chair: A. Endres
A. Avritzer, AT&T Network Comput. Services, Red Hill, NJ, USA
E.J. Weyuker, AT&T Network Comput. Services, Red Hill, NJ, USA
pp. 390
Session 19: Vendor Presentations II
Session 20: Vendor Presentations III
Recap Session
Panel: Everything You Wanted to Know about Software Reliability Engineering but Didn't Know Who to Ask: Coordinator: J. Musa : Panelists: B. Everett, M. Ohba, M. Vouk
Panel: Reliability of Predictions: Coordinators: S. Pfleeger, N. Schneidewind: Panelists: P. Frankl, J. Voas, J. Musa
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