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  • The Seventh International Symposium on Software Reliability Engineering (ISSRE '96)
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The Seventh International Symposium on Software Reliability Engineering (ISSRE '96)
White Plains, New York
October 30-November 02
ISBN: 0-8186-7707-4
Table of Contents
B1: Fault/Failure Detection: Session Chair: C. Wohlin
J.J. Li, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
R.E. Seviora, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
pp. 4
A. Thakur, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
B.K. Iyer, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 14
F. Belli, Dept. of Electr. & Electron. Eng., Paderborn Univ., Germany
R. Crisan, Dept. of Electr. & Electron. Eng., Paderborn Univ., Germany
pp. 24
A2: Operational Profile/Failure: Session Chair: J.-C. Laprie
A.N. Crespo, Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
P. Matrella, Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
A. Pasquini, Dept. of Comput. Sci., UNICAMP, Campinas, Brazil
pp. 35
B. Cukic, Dept. of Comput. Sci., Houston Univ., TX, USA
F.B. Bastani, Dept. of Comput. Sci., Houston Univ., TX, USA
pp. 45
M.L. Shooman, Dept. of Comput. Sci., Polytechnic Univ., Brooklyn, NY, USA
pp. 55
B2: Test Generation: Session Chair: J. Slonim
A. Paradkar, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
K.C. Tai, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
M.A. Vouk, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 66
D. Kung, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Y. Lu, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
N. Venugopalan, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
P. Hsia, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Y. Toyoshima, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
C. Chen, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
J. Gao, Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
pp. 76
C2: Reliable Systems I: Session Chair: H. Levendel
J.A. Morgan, Sch. of Comput. Sci., DePaul Univ., Chicago, IL, USA
G.J. Knafl, Sch. of Comput. Sci., DePaul Univ., Chicago, IL, USA
pp. 87
J.P. Hudepohl, Nortel, Research Triangle Park, NC, USA
S.J. Aud, Nortel, Research Triangle Park, NC, USA
T.M. Khoshgoftaar, Nortel, Research Triangle Park, NC, USA
E.B. Allen, Nortel, Research Triangle Park, NC, USA
J. Mayrand, Nortel, Research Triangle Park, NC, USA
pp. 93
A3:Management Executive Panel: Business Priority: Is it Cost, Time to Market, or Reliability?
B3: Testing: Session Chair: W. Howden
Marcio E. Delamaro, University of Sao Paulo, Sao Carlos 13560, Brazil
Jose C. Maldonado, University of Sao Paulo, Sao Carlos 13560, Brazil
Aditya P. Mathur, Purdue University
pp. 112
Chi-Ming Chung, Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
T.K. Shih, Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Ying-Hong Wang, Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Wei-Chuan Lin, Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
Ying-Feng Kou, Graduate Inst. of Inf. Eng., TamKang Univ., Taipei, Taiwan
pp. 122
C3: Reliable Systems II: Session Chair: J. Dugan
C. Smidts, Maryland Univ., College Park, MD, USA
R.W. Stoddard, Maryland Univ., College Park, MD, USA
M. Stutzke, Maryland Univ., College Park, MD, USA
pp. 132
R. Hochman, Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
T.M. Khoshgoftaar, Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
E.B. Allen, Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
J.P. Hudepohl, Dept. of Comput. Sci., Florida Atlantic Univ., Boca Raton, FL, USA
pp. 152
B4: Fault Injection: Session Chair: K. Kanoun
J.M. Bieman, Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
D. Dreilinger, Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
Lijun Lin, Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
pp. 166
J. Christmansson, Dept. of Comput. Sci., Chalmers Univ. of Technol., Goteborg, Sweden
P. Santhanam, Dept. of Comput. Sci., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 175
Wee Teck Ng, Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
C.M. Aycock, Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
G. Rajamani, Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
P.M. Chen, Dept. of Electr. & Comput. Eng., Michigan Univ., MI, USA
pp. 182
A5: SRE Experience; Session Chair: W. Farr
W.K. Ehrlich, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
R. Chan, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
W.J. Donnelly, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
H.H. Park, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
M.B. Saltzman, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
P. Verma, .NSD Oper. Technol. Center, AT&T Bell Labs., Middletown, NJ, USA
pp. 196
M. Kaaniche, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
K. Kanoun, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
pp. 207
P. Dixit, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
M.A. Vouk, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
D.L. Bitzer, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
C. Alix, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 213
W.W. Everett, Software Process & Reliability Eng., Albuquerque, NM, USA
J.M. Gobat, Software Process & Reliability Eng., Albuquerque, NM, USA
pp. 219
B5: Distributed Computing: Session Chair: H. Leung
M.J. Katchabaw, Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
H.L. Lutfiyya, Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
A.D. Marshall, Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
M.A. Bauer, Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
pp. 236
A.W. Williams, Dept. of Comput. Sci., Ottawa Univ., Ont., Canada
R.L. Probert, Dept. of Comput. Sci., Ottawa Univ., Ont., Canada
pp. 246
C5: Fault Tolerance I: Session Chair: C. Kintala
S.J. Geoghegan, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.R. Avresky, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 256
Adel Cherif, Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
Masato Suzuki, Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
Takuya Katayama, Japan Adv. Inst. of Sci. & Technol., Nomi, Japan
pp. 266
A. Ziv, MATAM-Adv. Technol. Center, IBM Israel Sci. & Technol. Center, Haifa, Israel
J. Bruck, MATAM-Adv. Technol. Center, IBM Israel Sci. & Technol. Center, Haifa, Israel
pp. 274
A6: Panel: How Can Software Reliability Engineering (SRE) Help System Engineers and Software Architects?
B6: Reliability Growth Models: Session Chair: Y. Tohma
Rong-Huei Hou, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Sy-Yen Kuo, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Yi-Ping Chang, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 289
S.S. Gokhale, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
T. Philip, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
P.N. Marinos, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
K.S. Trivedi, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
pp. 299
C6: Fault Tolerance II: Session Chair: K. Trivedi
K.H. Kim, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
L. Bacellar, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
C. Subbaraman, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
pp. 319
K. Kim, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
M.A. Vouk, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
D.F. McAllister, Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC, USA
pp. 330
D.A. Simser, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
R.E. Seviora, Bell Canada Software Reliability Lab., Waterloo Univ., Ont., Canada
pp. 340
Management Executive Panel: Business Priority: Is It Cost, Time to Market, or Reliability?
Plenary Session III Java/Web Reliability and Security Issues
A.A. Dolinsky, BellCore Piscataway, NJ 08854
D. Rentschler, BellCore Piscataway, NJ 08854
S. Steele, BellCore Piscataway, NJ 08854
J.A. Teresinski, BellCore Piscataway, NJ 08854
J. Widmaier, BellCore Piscataway, NJ 08854
pp. 352
B7: Modeling/Measurement: Session Chair: G. Knafl
J. Tian, Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
J. Palma, Dept. of Comput. Sci. & Eng., Southern Methodist Univ., Dallas, TX, USA
pp. 354
T.M. Khoshgoftaar, Florida Atlantic Univ., Boca Raton, FL, USA
E.B. Allen, Florida Atlantic Univ., Boca Raton, FL, USA
N. Goel, Florida Atlantic Univ., Boca Raton, FL, USA
A. Nandi, Florida Atlantic Univ., Boca Raton, FL, USA
J. McMullan, Florida Atlantic Univ., Boca Raton, FL, USA
pp. 364
Li Naixin, Microsoft Corp., Redmond, WA, USA
Y.K. Malaiya, Microsoft Corp., Redmond, WA, USA
pp. 372
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