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Proceedings. 6th International Symposium on Quality Electronic Design (2005)
San Jose, CA, USA
March 21, 2005 to March 23, 2005
ISBN: 0-7695-2301-3
TABLE OF CONTENTS
Session 7C: Robust Design under Parameter Variations
pp. xxiii
pp. xviii-xx
Tutorial I
Tutorial II
Session EP1
Plenary Session 1P
Joe Sawicki , Mentor Graphics
pp. 19
Session 1A: Tools and Flows for Quality Design
Aaron Ng , The University of Michigan
Igor L. Markov , The University of Michigan
pp. 22-27
Alex Gyure , Synopsys, Inc., Mountain View, CA
Alireza Kasnavi , Synopsys, Inc., Mountain View, CA
Sam Lo , Synopsys, Inc., Mountain View, CA
Peivand F. Tehrani , Synopsys, Inc., Mountain View, CA
William Shu , Synopsys, Inc., Mountain View, CA
Mahmoud Shahram , Synopsys, Inc., Mountain View, CA
Joddy W. Wang , Synopsys, Inc., Mountain View, CA
Jindrich Zedja , Synopsys, Inc., Mountain View, CA
pp. 28-34
Qianying Tang , University of Toronto, Canada
Jianwen Zhu , University of Toronto, Canada
pp. 35-39
Luo Chun , Southeast University, P.R. China
Yang Jun , Southeast University, P.R. China
Shi Longxing , Southeast University, P.R. China
Wu XuFan , Southeast University, P.R. China
Zhang Yu , Southeast University, P.R. China
pp. 40-45
Session 1B: High Level Power/Noise Reduction Techniques
Dongku Kang , Purdue University, West Lafayette, IN
Yiran Chen , Purdue University, West Lafayette, IN
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 48-53
Shivakumar Swaminathan , IBM Microelectronics, Research Triangle Park, NC
Sanjay B. Patel , Qualcomm, Research Triangle Park, NC
James Dieffenderfer , Qualcomm, Research Triangle Park, NC
Joel Silberman , IBM Research, Yorktown Heights, NY
pp. 54-58
Kee-Jong Kim , Purdue University, West Lafayette, IN; LG-Philips LCD, Korea
Chris H. Kim , University of Minnesota, Minneapolis, MN
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 59-64
David Roberts , University of Michigan, USA
Todd Austin , University of Michigan, USA
David Blauww , University of Michigan, USA
Trevor Mudge , University of Michigan, USA
Kriszti?n Flautner , ARM Ltd., UK
pp. 65-70
Session 1C: Leakage and Dynamic Power Issues
Bhavana Jharia , Indian Institute of Technology, India
S. Sarkar , Indian Institute of Technology, India
R. P. Agarwal , Indian Institute of Technology, India
pp. 72-76
Afshin Abdollahi , University of Southern California
Farzan Fallah , Fujitsu Labs of America
Massoud Pedram , University of Southern California
pp. 77-82
Jayakumaran Sivagnaname , The University of Michigan, Ann Arbor, MI
Hung C. Ngo , IBM Austin Research Laboratory, Austin, TX
Kevin J. Nowka , IBM Austin Research Laboratory, Austin, TX
Robert K. Montoye , IBM Austin Research Laboratory, Austin, TX
Richard B. Brown , The University of Michigan, Ann Arbor, MI
pp. 83-87
Harmander Singh Deogun , University of Michigan, Ann Arbor, MI
Rahul Rao , University of Michigan, Ann Arbor, MI
Dennis Sylvester , University of Michigan, Ann Arbor, MI
Richard Brown , University of Utah, Salt Lake City, UT
Kevin Nowka , Austin Research Laboratories, IBM, Austin, TX
pp. 88-93
Session 1D: Poster Session
Jin He , University of California, Berkeley, CA
Jane Xi , University of California, Berkeley, CA
Mansun Chan , University of California, Berkeley, CA
Hui Wan , University of California, Berkeley, CA
Mohan Dunga , University of California, Berkeley, CA
Babak Heydari , University of California, Berkeley, CA
Ali M. Niknejad , University of California, Berkeley, CA
Chenming Hu , University of California, Berkeley, CA
pp. 96-101
Lionel Riviere-Cazaux , Freescale Semiconductor
Kevin Lucas , Freescale Semiconductor
Jon Fitch , Freescale Semiconductor
pp. 102-106
Carlo Roma , STMicroelectronics, Agrate Brianza, Milan, Italy
Pierluigi Daglio , STMicroelectronics, Agrate Brianza, Milan, Italy
Guido De Sandre , STMicroelectronics, Agrate Brianza, Milan, Italy
Marco Pasotti , STMicroelectronics, Agrate Brianza, Milan, Italy
Marco Poles , STMicroelectronics, Agrate Brianza, Milan, Italy
pp. 107-112
Mini Nanua , Sun MicroSystems
David Blaauw , University of Michigan
Chanhee Oh , Nascentric Inc.
pp. 113-117
Arun Shrimali , Texas Instruments India
Anand Venkitachalam , Texas Instruments India
Ravi Arora , Texas Instruments India
pp. 123-127
C. K. Tang , University of Arkansas, Fayetteville, AR
P. K. Lala , University of Arkansas, Fayetteville, AR
J. P. Parkerson , University of Arkansas, Fayetteville, AR
pp. 128-132
C. Talarico , University of Arizona, Tucson, AZ
B. Pillilli , University of Arizona, Tucson, AZ
K. L. Vakati , University of Arizona, Tucson, AZ
J. M. Wang , University of Arizona, Tucson, AZ
pp. 133-136
Zhaojun Wo , University of Massachusetts, Amherst, MA
Israel Koren , University of Massachusetts, Amherst, MA
pp. 137-142
DiaaEldin Khalil , Ain Shams University, Cairo, Egypt
Mohamed Dessouky , Ain Shams University, Cairo, Egypt
Vincent Bourguet , University of Paris 6, Paris, France
Marie-Minerve Louerat , University of Paris 6, Paris, France
Andreia Cathelin , STMicroelectronics - Central R&D/DAIS, Crolles, France
Hani Ragai , Ain Shams University, Cairo, Egypt
pp. 143-147
Atsushi Kurokawa , Semiconductor Technology Academic Research Center (STARC); Waseda University
Masaharu Yamamoto , Semiconductor Technology Academic Research Center (STARC)
Nobuto Ono , Jedat Innovation Inc.
Tetsuro Kage , Tokyo National College of Technology
Yasuaki Inoue , Waseda University
Hiroo Masuda , Semiconductor Technology Academic Research Center (STARC)
pp. 153-158
Haixia Gao , Microelectronics Institute, Xidian University, China
Yintang Yang , Microelectronics Institute, Xidian University, China
Xiaohua Ma , Microelectronics Institute, Xidian University, China
Gang Dong , Microelectronics Institute, Xidian University, China
pp. 159-163
E. Sokolowska , Pultronics Inc.
M. Barszcz , Pultronics Inc.
B. Kaminska , Pultronics Inc.
pp. 164-168
Yong-Chan Ban , Samsung Electronics Co., Ltd, Korea
Soo-Han Choi , Samsung Electronics Co., Ltd, Korea
Ki-Hung Lee , Samsung Electronics Co., Ltd, Korea
Dong-Hyun Kim , Samsung Electronics Co., Ltd, Korea
Ji-Suk Hong , Samsung Electronics Co., Ltd, Korea
Yoo-Hyon Kim , Samsung Electronics Co., Ltd, Korea
Moon-Hyun Yoo , Samsung Electronics Co., Ltd, Korea
Jeong-Taek Kong , Samsung Electronics Co., Ltd, Korea
pp. 169-174
Harmander Singh Deogun , University of Michigan, Ann Arbor, MI
Dennis Sylvester , University of Michigan, Ann Arbor, MI
David Blaauw , University of Michigan, Ann Arbor, MI
pp. 175-180
Hua Xiang , IBM T.J. Watson Research Center, Yorktown Heights, NY
Kai-Yuan Chao , Intel Corporation, Hillsboro, Oregon
Martin D. F. Wong , UIUC, Urbana, IL
pp. 181-186
J. Huynh , San Jose State University, CA
B. Ngo , San Jose State University, CA
M. Pham , San Jose State University, CA
L. He , San Jose State University, CA
pp. 187-192
R. Castagnetti , LSI Logic Corporation, Milpitas, CA
R. Venkatraman , LSI Logic Corporation, Milpitas, CA
B. Bartz , LSI Logic Corporation, Milpitas, CA
C. Monzel , LSI Logic Corporation, Milpitas, CA
T. Briscoe , LSI Logic Corporation, Milpitas, CA
A. Teene , LSI Logic Corporation, Milpitas, CA
S. Ramesh , LSI Logic Corporation, Milpitas, CA
pp. 193-196
Khadija Stewart , Southern Illinois University Carbondale
Themistoklis Haniotakis , Southern Illinois University Carbondale
Spyros Tragoudas , Southern Illinois University Carbondale
pp. 197-201
M. Welling , Southern Illinois University at Carbondale
S. Tragoudas , Southern Illinois University at Carbondale
H. Wang , Southern Illinois University at Carbondale
pp. 202-207
Young-Seok Hong , Samsung Electronics Co., Ltd., Korea
Heeseok Lee , Samsung Electronics Co., Ltd., Korea
Joon-Ho Choi , Samsung Electronics Co., Ltd., Korea
Moon-Hyun Yoo , Samsung Electronics Co., Ltd., Korea
Jeong-Taek Kong , Samsung Electronics Co., Ltd., Korea
pp. 208-212
Yuchun Ma , Tsinghua University, Beijing, China
Xianlong Hong , Tsinghua University, Beijing, China
Sheqin Dong , Tsinghua University, Beijing, China
Song Chen , Tsinghua University, Beijing, China
Chung-Kuan Cheng , University of California, San Diego
pp. 213-219
ISQED Luncheon Speech
Michael Keating , Synopsys, Inc.
pp. 220-224
Session 2A: Test Application and Cost Reduction
E. Kalligeros , University of Patras, Greece; Research Academic Computer Technology Institute, Greece
D. Kaseridis , University of Patras, Greece; Research Academic Computer Technology Institute, Greece
X. Kavousianos , University of Ioannina, Greece
D. Nikolos , University of Patras, Greece; Research Academic Computer Technology Institute, Greece
pp. 226-231
Th. Haniotakis , Southern Illinois University Carbondale
S. Tragoudas , Southern Illinois University Carbondale
G. Pani , Southern Illinois University Carbondale
pp. 232-237
Yinhe Han , Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing
Yu Hu , Chinese Academy of Sciences, Beijing
Huawei Li , Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing
Xiaowei Li , Chinese Academy of Sciences, Beijing; Graduate School of Chinese Academy of Sciences, Beijing
pp. 238-243
BIST-Guided ATPG (Abstract)
Ahmad A. Al-Yamani , Stanford University, Stanford, CA; LSI Logic Corporation, Milpitas, CA
Edward J. McCluskey , Stanford University, Stanford, CA
pp. 244-249
Irith Pomeranz , Purdue University, W. Lafayette, IN
Sudhakar M. Reddy , University of Iowa, Iowa City, IA
pp. 250-255
Session 2B: DFM and Physical Layout
Xin Wang , Synopsys Inc., Mountain View, CA
Charles C. Chiang , Synopsys Inc., Mountain View, CA
Jamil Kawa , Synopsys Inc., Mountain View, CA
Qing Su , Synopsys Inc., Mountain View, CA
pp. 258-263
Michel Cote , Synopsys Inc.
Philippe Hurat , Synopsys Inc.
pp. 264-269
Puneet Gupta , University of California at San Diego
Andrew B. Kahng , University of California at San Diego
Dennis Sylvester , University of Michigan at Ann Arbor
Jie Yang , University of Michigan at Ann Arbor
pp. 270-275
Jay Jahangiri , Mentor Graphics Corporation
David Abercrombie , Mentor Graphics Corporation
pp. 276-282
Session 2C: Performance and Reliability Analysis for Yield Optimization
Rahul Rao , University of Michigan, Ann Arbor, MI
Kanak Agarwal , University of Michigan, Ann Arbor, MI
Anirudh Devgan , Austin Research Laboratories, IBM, Austin, TX
Kevin Nowka , Austin Research Laboratories, IBM, Austin, TX
Dennis Sylvester , University of Michigan, Ann Arbor, MI
Richard Brown , University of Utah, Salt Lake City, UT
pp. 284-290
Dipanjan Sengupta , University of British Columbia, Canada
Resve Saleh , University of British Columbia, Canada
pp. 291-296
Justin Gregg , Colorado State University, Fort Collins
Tom W. Chen , Colorado State University, Fort Collins
pp. 297-302
Syed M. Alam , Freescale Semiconductor
Frank L. Wei , Massachusetts Institute of Technology
Chee Lip Gan , Nanyang Technological University
Carl V. Thompson , Massachusetts Institute of Technology
Donald E. Troxel , Massachusetts Institute of Technology
pp. 303-308
Session 3A: Functional Verification and Test Generation
Anat Dahan , IBM Haifa Research Lab, Haifa Israel
Daniel Geist , IBM Haifa Research Lab, Haifa Israel
Leonid Gluhovsky , IBM Haifa Research Lab, Haifa Israel
Dmitry Pidan , IBM Haifa Research Lab, Haifa Israel
Gil Shapir , IBM Haifa Research Lab, Haifa Israel
Yaron Wolfsthal , IBM Haifa Research Lab, Haifa Israel
Lyes Benalycherif , ST Microelectronics, Grenoble, France
Romain Kamdem , ST Microelectronics, Grenoble, France
Younes Lahbib , ST Microelectronics, Grenoble, France
pp. 310-315
Haihua Yan , Auburn University
Gefu Xu , Auburn University
Adit D. Singh , Auburn University
pp. 316-320
Nicola Bombieri , Universit? di Verona, Italy
Franco Fummi , Universit? di Verona, Italy
Graziano Pravadelli , Universit? di Verona, Italy
pp. 321-326
Maria K. Michael , University of Cyprus
Stelios Neophytou , University of Cyprus
Spyros Tragoudas , Southern Illinois University
pp. 327-332
Session 3B: Power Delivery and Distribution
Mikhail Popovich , University of Rochester, New York
Eby G. Friedman , University of Rochester, New York
pp. 334-339
Navin Srivastava , University of California, Santa Barbara, CA
Xiaoning Qi , Sun Microsystems Inc., Sunnyvale, CA
Kaustav Banerjee , University of California, Santa Barbara, CA
pp. 346-351
Qing K. Zhu , Matrix Semiconductor Inc.
David Ayers , Intel Corporation
pp. 352-356
Session 3C: Quality System Level Design and Synthesis
Animesh Datta , Purdue University
Swarup Bhunia , Purdue University
Nilanjan Banerjee , Purdue University
Kaushik Roy , Purdue University
pp. 358-363
S. Tosun , Syracuse University
O. Ozturk , Pennsylvania State University
N. Mansouri , Syracuse University
E. Arvas , Syracuse University
M. Kandemir , Pennsylvania State University
Y. Xie , Pennsylvania State University
W-L. Hung , Pennsylvania State University
pp. 364-369
Haixia Gao , Xidian University, China
Yintang Yang , Xidian University, China
Xiaohua Ma , Xidian University, China
Gang Dong , Xidian University, China
pp. 370-374
S. Tosun , Syracuse University
N. Mansouri , Syracuse University
E. Arvas , Syracuse University
M. Kandemir , Pennsylvania State University
Y. Xie , Pennsylvania State University
W-L. Hung , Pennsylvania State University
pp. 375-380
Session 4A: DFM for Circuit Design
Xiaojun Li , University of Maryland, College Park
B. Huang , University of Maryland, College Park
J. Qin , University of Maryland, College Park
X. Zhang , University of Maryland, College Park
M. Talmor , University of Maryland, College Park
Z. Gur , University of Maryland, College Park
Joseph B. Bernstein , University of Maryland, College Park
pp. 382-389
Henry H. Y. Chan , Microelectronics and Computer Systems Laboratory, Canada
Zeljko Zilic , Microelectronics and Computer Systems Laboratory, Canada
pp. 390-395
Kambiz Rahimi , University of Washington, Seattle
Chris Diorio , University of Washington, Seattle
pp. 396-401
Masanori Hashimoto , Kyoto University, Japan
Tomonori Yamamoto , Kyoto University, Japan
Hidetoshi Onodera , Kyoto University, Japan
pp. 402-407
Session 4B: Leakage and Reliability Management
Saibal Mukhopadhyay , Purdue University, West Lafayette, IN
Keunwoo Kim , IBM T. J. Watson Research Center, Yorktown Heights, NY
Jae-Joon Kim , IBM T. J. Watson Research Center, Yorktown Heights, NY
Shih-Hsien Lo , IBM T. J. Watson Research Center, Yorktown Heights, NY
Rajiv V. Joshi , IBM T. J. Watson Research Center, Yorktown Heights, NY
Ching-Te Chuang , IBM T. J. Watson Research Center, Yorktown Heights, NY
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 410-415
Ananth Somayaji Goda , Texas Instruments India Pvt Ltd, Bangalore, India
Gautam Kapila , Texas Instruments India Pvt Ltd, Bangalore, India
pp. 416-420
Puneet Gupta , Blaze DFM, Inc., Sunnyvale, CA
Andrew B. Kahng , Blaze DFM, Inc., Sunnyvale, CA; UCSD, La Jolla, CA
Puneet Sharma , UCSD, La Jolla, CA
pp. 421-426
O. Semenov , University of Waterloo, Canada
H. Sarbishaei , University of Waterloo, Canada
M. Sachdev , University of Waterloo, Canada
pp. 427-432
Session 4C: Analog Test and BIST
Amit Laknaur , Southern Illinois University Carbondale, Carbondale, IL
Haibo Wang , Southern Illinois University Carbondale, Carbondale, IL
pp. 434-439
Daniela De Venuto , Politecnico di Bari, Italy
Grazia Marchione , Politecnico di Bari, Italy
Leonardo Reyneri , Politecnico di Torino, Italy
pp. 440-447
L. Dermentzoglou , University of Athens, Greece
Y. Tsiatouhas , University of Ioannina, Greece
A. Arapoyanni , University of Athens, Greece
pp. 448-452
Swarup Bhunia , Purdue University, West Lafayette, IN
Hamid Mahmoodi , Purdue University, West Lafayette, IN
Debjyoti Ghosh , Purdue University, West Lafayette, IN
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 453-458
Session EP2
Plenary Session 2P
Aki Fujimura , Cadence Design Systems, Inc.
pp. 463
Session 5A: Design Methods and Tools in DSM
Jihyun Lee , Northeastern University, Boston, MA
Yong-Bin Kim , Northeastern University, Boston, MA
pp. 470-475
Yuanzhong (Paul) Zhou , Fairchild Semiconductor, South Portland, ME
Duane Connerney , Fairchild Semiconductor, South Portland, ME
Ronald Carroll , Fairchild Semiconductor, South Portland, ME
Timwah Luk , Fairchild Semiconductor, South Portland, ME
pp. 476-481
Subhrajit Bhattacharya , IBM T.J. Watson Research Center, Yorktown Heights, NY
John Darringer , IBM T.J. Watson Research Center, Yorktown Heights, NY
Daniel Ostapko , IBM T.J. Watson Research Center, Yorktown Heights, NY
Youngsoo Shin , Korea Advanced Institute of Science and Technology, Republic of Korea
pp. 482-487
Session 5B: Design Techniques for Leakage Reduction
Saibal Mukhopadhyay , Purdue University, West Lafayette, IN
Hamid Mahmoodi , Purdue University, West Lafayette, IN
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 490-495
Xiaojun Li , University of Maryland, College Park, MD
Joerg D. Walter , University of Maryland, College Park, MD
Joseph B. Bernstein , University of Maryland, College Park, MD
pp. 496-502
Vishal Gupta , Georgia Institute of Technology, Atlanta, GA
Gabriel A. Rinc?n-Mora , Georgia Institute of Technology, Atlanta, GA
pp. 503-508
Session 5C: Variability Issues in Nanoscale Circuits
Norman Gunther , Santa Clara University, CA
Emad Hamadeh , Santa Clara University, CA; Applied Micro C. Co. (AMCC), Sunnyvale, CA
Darrell Niemann , Santa Clara University, CA
Iliya Pesic , Santa Clara University, CA; Silvaco International, Santa Clara, CA
Mahmud Rahman , Santa Clara University, CA
pp. 510-515
Paul Friedberg , University of California, Berkeley, CA
Yu Cao , University of California, Berkeley, CA
Jason Cain , University of California, Berkeley, CA
Ruth Wang , University of California, Berkeley, CA
Jan Rabaey , University of California, Berkeley, CA
Costas Spanos , University of California, Berkeley, CA
pp. 516-521
Vishak Venkatraman , University of Massachusetts Amherst
Wayne Burleson , University of Massachusetts Amherst
pp. 522-527
Session 6A: Issues in Noise and Timing
Sreeram Chandrasekar , Texas Instruments India
Gaurav Kumar Varshney , Texas Instruments India
V. Visvanathan , Texas Instruments India
pp. 530-535
Shahin Nazarian , University of Southern California, Los Angeles, CA
Massoud Pedram , University of Southern California, Los Angeles, CA
Emre Tuncer , Magma Design Automation, Santa Clara, CA
Tao Lin , Magma Design Automation, Santa Clara, CA
pp. 536-541
Zhenyu Qi , University of California, Riverside
Hang Li , University of California, Riverside
Sheldon X.-D. Tan , University of California, Riverside
Lifeng Wu , Cadence Design Systems Inc. San Jose, CA
Yici Cai , Tsinghua University, Beijing, China
Xianlong Hong , Tsinghua University, Beijing, China
pp. 542-547
Deepak C. Sekar , Georgia Institute of Technology, Atlanta
pp. 548-553
Session 6B: Design Approaches for System in Package (SiP)
Anru Wang , University of California, Santa Cruz
Wayne Dai , University of California, Santa Cruz
pp. 562-566
Chung-Seok(Andy) Seo , Georgia Institute of Technology, Atlanta, GA
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta, GA
Nan M. Jokerst , Duke University, Durham, NC
pp. 567-572
Meigen Shen , Royal Institute of Technology (KTH), Sweden
Li-Rong Zheng , Royal Institute of Technology (KTH), Sweden
Esa Tjukanoff , University of Turku, Finland
Jouni Isoaho , University of Turku, Finland
Hannu Tenhunen , Royal Institute of Technology (KTH), Sweden
pp. 573-578
Session 6C: DSM Interconnect Issues
Muzhou Shao , Synopsys Inc., Mountain View, CA
Youxin Gao , Synopsys Inc., Mountain View, CA
Li-Pen Yuan , Synopsys Inc., Mountain View, CA
Hung-Ming Chen , National Chiao Tung University, Hsinchu, Taiwan
Martin DF Wong , University of Illinois at Urbana-Champaign, Urbana, IL
pp. 580-585
Atsushi Kurokawa , STARC; Waseda University
Toshiki Kanamoto , Renesas Technology Corp.
Tetsuya Ibe , Sanyo Electric Corp.
Akira Kasebe , Meitec Corp.
Chang Wei Fong , Cristal Cosmotech Corp.
Tetsuro Kage , Tokyo National College of Technology
Yasuaki Inoue , Waseda University
Hiroo Masuda , STARC
pp. 586-591
Vinita V. Deodhar , Georgia Institute of Technology, Atlanta
Jeffrey A. Davis , Georgia Institute of Technology, Atlanta
pp. 592-597
Jiaxing Sun , Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Yun Zheng , CEC Huada Electronic Design Co., Ltd., Beijing, China
Qing Ye , Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Tianchun Ye , Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
pp. 598-602
Pu Liu , University of California, Riverside, CA
Zhenyu Qi , University of California, Riverside, CA
Sheldon X.-D. Tan , University of California, Riverside, CA
pp. 603-608
Session 7A: Advances in Floor Planning
Meng-Chiou Wu , Yuan Ze University, Taiwan
Rung-Bin Lin , Yuan Ze University, Taiwan
pp. 610-615
Jingyu Xu , Tsinghua Univ., Beijing, China
Xianlong Hong , Tsinghua Univ., Beijing, China
Tong Jing , Tsinghua Univ., Beijing, China
Yang Yang , Tsinghua Univ., Beijing, China
pp. 616-621
Hua Xiang , IBM T.J. Watson Research Center, Yorktown Heights, NY
I-Min Liu , Cadence Design System, San Jose, CA
Martin D. F. Wong , UIUC, Urbana, IL
pp. 622-627
Song Chen , Tsinghua Univ. China
Xianlong Hong , Tsinghua Univ. China
Sheqin Dong , Tsinghua Univ. China
Yuchun Ma , Tsinghua Univ. China
Chung-kuan Cheng , Univ. of California, San Diego
pp. 628-633
W-L. Hung , The Pennsylvania State University, University Park, PA
Y. Xie , The Pennsylvania State University, University Park, PA
N. Vijaykrishnan , The Pennsylvania State University, University Park, PA
C. Addo-Quaye , The Pennsylvania State University, University Park, PA
T. Theocharides , The Pennsylvania State University, University Park, PA
M. J. Irwin , The Pennsylvania State University, University Park, PA
pp. 634-639
Session 7B: Issues in On-Chip Communication and Analog/RF Designs
Srinivasa R. Sridhara , University of Illinois at Urbana Champaign
Naresh R. Shanbhag , University of Illinois at Urbana Champaign
Ganesh Balamurugan , Intel Corporation, Hillsboro OR
pp. 642-647
Sani R. Nassif , IBM Austin Research Laboratory, Austin, Texas
Zhuo Li , Texas A&M University, College Station, Texas
pp. 648-653
A. Zahabi , University of Tehran, Tehran, Iran
O. Shoaei , University of Tehran, Tehran, Iran
Y. Koolivand , University of Tehran, Tehran, Iran
pp. 662-667
Payam Heydari , University of California, Irvine
pp. 668-673
Session 7C: Robust Design under Parameter Variations
Dinesh Patil , Stanford University, Stanford, CA
Sunghee Yun , Stanford University, Stanford, CA
Seung-Jean Kim , Stanford University, Stanford, CA
Alvin Cheung , Stanford University, Stanford, CA
Mark Horowitz , Stanford University, Stanford, CA
Stephen Boyd , Stanford University, Stanford, CA
pp. 676-681
Hao Yu , University of California, Los Angeles
Lei He , University of California, Los Angeles
pp. 682-687
Wei Ling , Ecole Polytechnique de Montreal, Canada
Yvon Savaria , Ecole Polytechnique de Montreal, Canada
pp. 688-693
A. Teene , LSI Logic Corporation, Fort Collins, CO
B. Davis , LSI Logic Corporation, Fort Collins, CO
R. Castagnetti , LSI Logic Corporation, Fort Collins, CO
J. Brown , LSI Logic Corporation, Fort Collins, CO
S. Ramesh , LSI Logic Corporation, Fort Collins, CO
pp. 694-699
Author Index (PDF)
pp. 701-704
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