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International Symposium on Quality Electronic Design (ISQED '01)
Complex Reliability Evaluation of Voters for Fault Tolerant Designs
San Jose, California
March 26-March 28
ISBN: 0-7695-1025-6
| ASCII Text | x | ||
| Mihaela Radu, Dan Pitica, Radu Munteanu, Cristian Posteuca, "Complex Reliability Evaluation of Voters for Fault Tolerant Designs," Quality Electronic Design, International Symposium on, pp. 331, International Symposium on Quality Electronic Design (ISQED '01), 2001. | |||
| BibTex | x | ||
| @article{ 10.1109/ISQED.2001.915252, author = {Mihaela Radu and Dan Pitica and Radu Munteanu and Cristian Posteuca}, title = {Complex Reliability Evaluation of Voters for Fault Tolerant Designs}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2001}, isbn = {0-7695-1025-6}, pages = {331}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.915252}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Quality Electronic Design, International Symposium on TI - Complex Reliability Evaluation of Voters for Fault Tolerant Designs SN - 0-7695-1025-6 SP EP A1 - Mihaela Radu, A1 - Dan Pitica, A1 - Radu Munteanu, A1 - Cristian Posteuca, PY - 2001 VL - 0 JA - Quality Electronic Design, International Symposium on ER - | |||
Hardware Voters are bit voters computing a majority of n input bits. An m-out-of-n hardware bit voter is a circuit with n bit inputs, and 1 bit - output y, such that y=1 if at least m-out-of-n inputs bits have the value 1. A hardware voter can be constructed as two level AND-OR (equivalently OR-AND and other structures) using CMOS VLSI technology. The goal of the paper is to present Reliability Estimations, Failure Modes and Effects, Criticality Analysis (FMECA) of voting networks at the transistor level, in CMOS VLSI implementation. FMECA is performed using the functional tree of the system, representing the data flow from the lowest level functional block up to the higher level functional blocks. The main idea of this research is to identify the best designs of voting circuits in terms of reliability parameters and to identify their critical failures and effects.
Citation:
Mihaela Radu, Dan Pitica, Radu Munteanu, Cristian Posteuca, "Complex Reliability Evaluation of Voters for Fault Tolerant Designs," isqed, pp.331, International Symposium on Quality Electronic Design (ISQED '01), 2001
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