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Quality Electronic Design, International Symposium on (2000)
San Jose, California
Mar. 20, 2000 to Mar. 22, 2000
ISBN: 0-7695-0525-2
TABLE OF CONTENTS
Tutorial Track 1: Design for Reliability and Manufacturability: Organizer and Moderator: Ibrahim Hajj
ISQED Tutorials (Abstract)
Ibrahim Hajj , University of Illinois at Urbana-Champaign
pp. 5
Tutorial Track II: Design for Reliability and Manufacturability: Organizer and Moderator: Ali Iramanesh
Tutorial Track III: Closing the Manufacturing Loop: Organizer and Moderator: Andrzej Strojwas
Evening Panel Discussion
Robert N. Blair , RNB International
Jacques Benkoski , Monterey Design Systems
pp. 17
Plenary Session I: Session Chair: Ali Iramanesh
Aart J. de Geus , Synopsys Inc.
pp. 23
John East , Actel Corporation
pp. 25
Session 1A: Panel Discussion
Session 1B: DSM Modeling: Organizers: Ann Spratt and Antonio Nunez: Co-Chairs: Resve Saleh and Antonio Nunez
Michael S. Shur , Rensselaer Polytechnic Institute
Tor A. Fjeldly , Norwegian University of Science and Technology
Trond Ytterdal , Nordic VLSI
pp. 37
Gilbert Yoh , Agilent Technologies
pp. 45
Murat R Becer , University of Illinois at Urbana-Champaign
Ibrahim N. Hajj , University of Illinois at Urbana-Champaign
pp. 51
M. Rossello , STMicroelectronics
R. Zafalon , STMicroelectronics
M. Poncino , STMicroelectronics
pp. 59
Session 1C: Emerging Process and Device Technology: Organizers: David Overhauser and Chune-Sin Yeh: Co-Chairs: David Overhauser and Chune-Sin Yeh
Jiann S. Yuan , University of Central Florida
pp. 67
Jingkun Fang , BTA Technology Inc.
Heting Yan , BTA Technology Inc.
Ping Chen , BTA Technology Inc.
Alvin I-Hsien Chen , BTA Technology Inc.
Yoshifumi Okamoto , BTA Technology Inc.
Chune-Sin Yeh , BTA Technology Inc.
Zhihong Liu , BTA Technology Inc.
Nobufusa Iwanishi , Matsushita Electronics Co.
Norio Koike Hirokazu Yonezawa , Matsushita Electronics Co.
Yoshiyuki Kawakami , Matsushita Electronics Co.
pp. 73
Ji-Soong Park , Samsung Electronics Co., Ltd.
Sang-Uhk Rhie , Samsung Electronics Co., Ltd.
Yoo-Hyon Kim , Samsung Electronics Co., Ltd.
Moon-Hyun Yoo , Samsung Electronics Co., Ltd.
Jeong-Taek Kong , Samsung Electronics Co., Ltd.
Hyung-Woo Kim , ASIC TD(Technology Development)
Sun-Il Yoo , ASIC TD(Technology Development)
pp. 81
Young-Kwan Park , CAE, Semiconductor
Jun-Ha Lee , CAE, Semiconductor
Jeong-Taek Kong , CAE, Semiconductor
Hee-Sung Kang , Samsung Electronics Co., Ltd.
Young-Wug Kim , Samsung Electronics Co., Ltd.
Seok-Jin Kim , Samsung Electronics Co., Ltd.
pp. 87
Session 2A: Quality of Design and EDA Tools: Organizer: George Alexiou and Ali Iramanesh: Co-Chairs: George Alexiou and Kevin Lashkari
Lech Józwiak , Eindhoven University of Technology
pp. 93
Giora Ben-Yaacov , Synopsys, Inc.
Larry Bjork , Synopsys, Inc.
Edward P. Stone , Synopsys, Inc.
pp. 411
Betty Prince , Memory Strategies International
pp. 109
Israel Koren , University of Massachusetts at Amherst
pp. 115
Anna Fontanelli , STMicroelectronics
Luigi Arnone , STMicroelectronics
Roberto Branca , STMicroelectronics
Giorgio Mastrorocco , STMicroelectronics
pp. 121
Session 2B: Emerging Integrity Issues: Organizer: Tak Young and Marco Casale-Rossi: Co-Chairs: Marco Casale-Rossi and Norman Chang
Kenji Shimazaki , Matsushita Electric Industrial Co., Ltd.
Hiroyuki Tsujikawa , Matsushita Electric Industrial Co., Ltd.
Seijiro Kojima , Matsushita Electric Industrial Co., Ltd.
Shouzou Hirano , Matsushita Electric Industrial Co., Ltd.
pp. 129
Yi-Min Jiang , Synopsys, Inc.
Angela Krstic , University of California at Santa Barbara
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
pp. 137
Dan Yergeau , Stanford University
Robert W. Dutton , Stanford University
Sam Nakagawa , Hewlett Packard Co.
Norman Chang , Hewlett Packard Co.
Shen Lin , Hewlett Packard Co.
Weize Xie , Hewlett Packard Co.
pp. 145
Brad Potts , Advanced Micro Devices
Ray Hokinson , Compaq
John Riley , Lucent Technologies
David Doman , Motorola
Frank Cano , Texas Instruments
N.S. Nagaraj , Texas Instruments
Noel Durrant , SEMATECH
pp. 151
M. Delaurenti , Politecnico di Torino
G. Masera , Politecnico di Torino
G. Piccinini , Politecnico di Torino
M. Graziano , Politecnico di Torino
pp. 157
Session 2C: Low Power Test: Organizers: Fadi Maamari, Marcel Jacomet, Kaushik Roy, Anne-Marie Trullemans, Ibramham Hajj and Raimund Ubar: Co-Chairs: Marcel Jacomet and Ibrahim Hajj
Patrick Girard , Universit? Montpellier II / CNRS
pp. 173
Raimund Ubar , Tallinn Technical University
Jaan Raik , Tallinn Technical University
pp. 189
J. Semião , Escola Superior de Tecnologia/UA
M.B. Santos , Instituto Superior T?cnico/UTL
I.M. Teixeira , Instituto Superior T?cnico/UTL
J.P. Teixeira , Instituto Superior T?cnico/UTL
pp. 197
Evening Panel Discussion
Richard Goering , E E Times
pp. 203
Plenary Session II: Co-Chairs: Resve Saleh and Carlo Guardiani
Alberto Sangiovanni-Vincentelli , University of California at Berkeley
pp. 209
Yervant Zorian , LogicVision
pp. 211
Session 3A: Quality of IP Blocks: Organizers: Ann Spratt and Antonio N??ez: Co-Chairs: Fadi Maamari and Robert Aitken
Dave Protheroe , South Bank University
Francesco Pessolano , South Bank University
pp. 227
Tom Chen , Colorado State University
Anneliese von Mayrhauser , Colorado State University
Amjad Hajjar , Colorado State University
Charles Anderson , Colorado State University
Mehmet Sahinoglu , Troy State University Montgomry
pp. 234
Session 3B: Impact of Emerging Processes on Design Quality: Organizer: Kris Verma: Co-Chairs: Kris Verma and NS Nagaraj
Ck Lau , Chartered Semiconductor Manufacturing Ltd
Ana Hunter , Chartered Semiconductor Manufacturing Ltd
pp. 245
Charvaka Duvvury , Texas Instruments
pp. 251
Session 3C: Poster Session: Co-Chairs: Norman Chang and C.K. Cheng
G. Bai , University of Illinois at Urbana-Champaign
S. Bobba , University of Illinois at Urbana-Champaign
I.N. Hajj , University of Illinois at Urbana-Champaign
pp. 263
Mely Chen Chi , Chung Yuan Christian University
Shih-Hsu Huang , Industrial Technology Research Institutes
pp. 269
Sunil Malkani , TeraLogic Incorporated
Chun-Mou Peng , International Technical University
Peter H. Chen , TeraLogic Incorporated
pp. 275
Th. Haniotakis , LSD S. A.
D. Nikolos , University of Patras
C. Efstathiou , TEI of Athens
pp. 299
Hideyuki Aoki , University of Tokyo
Makoto Ikeda , University of Tokyo
pp. 305
Rong Lin , State University of New York at Geneseo
pp. 321
Mehdi M. Mechaik , CAE Software Engineer & PCB Design
pp. 329
Steffen Rochel , Simplex Solutions, Inc.
N.S. Nagaraj , Texas Instruments
pp. 337
Erik A. McShane , University of Illinois at Chicago
Krishna Shenai , University of Illinois at Chicago
pp. 341
Alvernon Walker , University of Tennessee
Parag K. Lala , University of Arkansas
pp. 347
Jin Ding , Silicon Systems Limited
Xiaojun Wang , Dublin City University
pp. 355
Mike W.T. Wong , Hong Kong Polytechnic University
Y.S. Lee , Hong Kong Polytechnic University
pp. 361
Tyler Thorp , University of Washington and Sun Microsystems Incorporated
Ron Christopherson , Sun Microsystems Incorporated
Ban P. Wang , Sun Microsystems Incorporated
Carl Sechen , University of Washington
pp. 369
Li-Fu Chang , Frequency Technology, Inc.
Keh-Jeng Chang , Frequency Technology, Inc.
Christophe Bianchi , Frequency Technology, Inc.
pp. 375
Session 4A: Panel Discussion
Session 4B: Quality Definitions and Metrics: Organizers: George Alexiou and Ali Iramanesh: Co-Chairs: Justin Harlow and Lei He
Einar J. Aas , Norwegian University of Science and Technology
pp. 389
A.H. Farrahi , IBM T.J. Watson Research Center
M. Wang , Northwestern University
M. Sarrafzadeh , Northwestern University
pp. 395
Richard Goldman , Synopsys Incorporated
Karen Bartleson , Synopsys Incorporated
pp. 407
Session 4C: Low Power Design and Test: Organizers: Fadi Maamari, Marcel Jacomet, Kaushik Roy, Anne-Marie Trullemans and Ibramham Hajj: Co-Chairs: Kaushik Roy and Vamsi K. Srikantam
Xiaodong Zhang , Purdue University
pp. 425
D. Nikolos , University of Patras and Computer Technology Institute
D. Bakalis , University of Patras and Computer Technology Institute
E. Kalligeros , University of Patras
H.T. Vergos , University of Patras
pp. 433
A-M. Trullemans , Universite Catholique de Louvain
Jose Costa , Instituto Superior Tecnico
Ricardo Ferreira , Universite Catholique de Louvain
pp. 439
Session 5A: Panel Discussion
Session 5B: Design for Manufacturability: Organizers: Andrzej J. Strojwas and Carlo Guardiani: Co-Chairs: Glendy Sun and Vinod Malhotra
Sani R. Nassif , IBM Austin Research Laboratory
pp. 451
Alessandra Nardi , Universit? di Padova
Carlo Guardiani , PDF Solutions Incorporated
pp. 455
N. Cobb , Mentor Graphics
M. O'Brien , Mentor Graphics
T. Do , Mentor Graphics
T. Donnelly , Mentor Graphics
Y. Granik , Mentor Graphics
E. Sahouria , Mentor Graphics
V. Boksha , Massachusetts Institute of Technology
A. Balasinski , Cypress Semiconductor
pp. 461
Gary W. Maier , IBM Corporation
pp. 467
Mehdi M. Mechaik , CAE Software Engineer & PCB Design
pp. 475
Session 5C: VDSM Capacitive and Inductive Issues: Organizers: Tak Young and Marco Casale-Rossi: Co-Chairs: Tak Young and Eileen Hong You
Fabian Klass , Sun Microsystems Inc.
Chin-Man Kim , Sun Microsystems Inc.
Chaim Amir , Sun Microsystems Inc.
Joydeep Mitra , Sun Microsystems Inc.
Eileen You , Sun Microsystems Inc.
Jamil Mohd , Sun Microsystems Inc.
Sai-Keung Dong , Sun Microsystems Inc.
pp. 485
Tong Xiao , University of California at Santa Barbara
pp. 491
C. Forzan , STMicroelectronics
D. Pandini , STMicroelectronics
P. Scandolara , STMicroelectronics
A. Dal Fabbro , STMicroelectronics
pp. 499
Norman Chang , Hewlett-Packard Laboratories
Shen Lin , Hewlett-Packard Laboratories
pp. 513
Organizations Index (Abstract)
pp. 521
Author Index (PDF)
pp. 523
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