CSDL - Proceedings I

Program Committee (PDF)

pp. x

Workshop/Session Summaries

An open architecture for software process asset reuse (Abstract)

B. Boehm, Univ. of Southern California, Los Angeles, CA, USA

S. Wolf, Univ. of Southern California, Los Angeles, CA, USA

pp. 2

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Effect of Product Lines on Current Process Technology (Abstract)

K. Huff

pp. 8

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Connecting reusable software process elements and components (Abstract)

M.I. Kellner, Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA

pp. 12

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Product-line development requires sophisticated software configuration management (PDF)

W. Schafer, Fachbereich Math./Inf., Paderborn Univ., Germany

pp. 15

Position Papers

Support for environment-mediated human cooperation in large-scale reuse-based projects (Abstract)

I. Alloui, CRISS, Univ. Pierre Mendes, Grenoble, France

F. Oquendo, CRISS, Univ. Pierre Mendes, Grenoble, France

pp. 18

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Reuse sensitive process models: are process elements software assets too? (Abstract)

S. Arbaoui, Fac. des Sci. Mirande, CRID, Dijon, France

F. Oquendo, Fac. des Sci. Mirande, CRID, Dijon, France

pp. 21

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Process model reuse support-the OPSIS approach (Abstract)

D. Avrilionis, IMAG-LSR, Univ. Joseph Fourier, Grenoble, France

P.-Y. Cunin, IMAG-LSR, Univ. Joseph Fourier, Grenoble, France

pp. 25

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Supporting product line development (Abstract)

R. Balzer, Inf. Sci. Inst., Marina del Rey, CA, USA

pp. 29

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Software reuse introduction requires a process perspective (Abstract)

S. Bandinelli, Eur. Software Inst., Bizkaia, Spain

S. Rementeria, Eur. Software Inst., Bizkaia, Spain

pp. 32

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Supporting reuse and configuration for large scale software process models (Abstract)

N. Belkhatir, LSR, IMAG, Gieres, France

J. Estublier, LSR, IMAG, Gieres, France

pp. 35

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The software process and application domains (Abstract)

A.T. Berztiss, Dept. of Comput. Sci., Pittsburgh Univ., PA, USA

pp. 40

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Process support for reuse (Abstract)

R. Conradi, Norwegian Univ. of Sci. & Technol., Trondheim, Norway

pp. 43

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Program families: some requirements issues for the process languages (Abstract)

G. Cugola, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy

C. Ghezzi, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy

pp. 48

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Product lines: what are the issues? (Abstract)

E. Di Nitto, CEFRIEL, Politecnico di Milano, Italy

A. Fuggetta, CEFRIEL, Politecnico di Milano, Italy

pp. 51

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Processes for systematic software reuse (Abstract)

S. Doublait, Sodalia SpA, Trento, Italy

C. Lissoni, Sodalia SpA, Trento, Italy

pp. 54

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Considerations for an organizational memory in software development (Abstract)

E. Ellmer, Inst. of Appl. Comput. Sci., Wien Univ., Austria

D. Merkl, Inst. of Appl. Comput. Sci., Wien Univ., Austria

pp. 60

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About reuse in multi-paradigm process modelling approach (Abstract)

J. Estublier, LGI-IMAG, Grenoble, France

S. Dami, LGI-IMAG, Grenoble, France

pp. 63

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An asset view on the software process (PDF)

R.M. Greenwood, Inf. Process Group, Manchester Univ., UK

P. Kawalek, Inf. Process Group, Manchester Univ., UK

L. Robertson, Inf. Process Group, Manchester Univ., UK

B.C. Warboys, Inf. Process Group, Manchester Univ., UK

pp. 66

Reuse of software process fragments is reuse of software too (Abstract)

L. Groenewegen, Dept. of Comput. Sci., Leiden Univ., Netherlands

G. Engels, Dept. of Comput. Sci., Leiden Univ., Netherlands

pp. 68

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Software in the field needs process too (Abstract)

D. Heimbigner, Dept. of Comput. Sci., Colorado Univ., Boulder, CO, USA

A.L. Wolf, Dept. of Comput. Sci., Colorado Univ., Boulder, CO, USA

pp. 71

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Reuse of process elements-one company's experience (Abstract)

R. Hitchings, Div. of Digital Syst., Motorola Inc., Arlington Heights, IL, USA

M. Martinez, Div. of Digital Syst., Motorola Inc., Arlington Heights, IL, USA

pp. 74

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Experiences in process domain engineering at PRC Inc (PDF)

C.R. Hollenbach, PRC Inc., McLean, VA, USA

pp. 78

The role of a software process generaliser in managing a line of products (Abstract)

Wonkook Hong, Sch. of Comput. Sci., McGill Univ., Montreal, Que., Canada

N.H. Madhavji, Sch. of Comput. Sci., McGill Univ., Montreal, Que., Canada

pp. 80

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Process measurement through process modeling and simulation (Abstract)

K.E. Huff, GTE Labs. Inc., Waltham, MA, USA

pp. 83

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Reusing software process models in E/sup 3/ (Abstract)

M.L. Jaccheri, Dipt. di Autom. e Inf., Politecnico di Torino, Italy

pp. 86

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Evolution of on-line process fragments families (Abstract)

A.B. Kaba, CRIN, Vandoeuvre les Nancy, France

J.-C. Derniame, CRIN, Vandoeuvre les Nancy, France

pp. 89

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On the yellow brick road to component-based product lines (Abstract)

G.E. Kaiser, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA

P.D. Skopp, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA

J.J. Yang, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA

G.T. Heineman, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA

pp. 93

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Integrating and applying processes and methods for product line management (Abstract)

C.D. Klingler, Lockheed Martin Tactical Defense Syst., USA

R. Creps, Lockheed Martin Tactical Defense Syst., USA

pp. 97

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Feedback, evolution and software technology (Abstract)

M.M. Lehman, Dept. of Comput., Imperial Coll. of Sci., Technol. & Med., London, UK

pp. 101

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Moving away from a hacker vs. disciplined-based organizational legacy-an organization theory perspective on software processes (Abstract)

N. Staudenmayer, Sloan Sch. of Manage., MIT, Cambridge, MA, USA

pp. 104

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Product families and process families (Abstract)

S.M. Sutton, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA

L.J. Osterweil, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA

pp. 109

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Towards software process modules (Abstract)

M. Verlage, Fachbereich Inf., Kaiserslautern Univ., Germany

pp. 112

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Using process waiver data to improve a design process: a case study of feedback and control using the FEAST model (Abstract)

L.G. Votta, Software Production Res. Dept., AT&T Bell Labs., Naperville, IL, USA

M.L. Zajac, Software Production Res. Dept., AT&T Bell Labs., Naperville, IL, USA

pp. 115

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Author Index (PDF)

pp. 119