This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
30th IEEE International Symposium on Multiple-Valued Logic (ISMVL 2000)
Controllability/Observability Measures for Multiple-Valued Test Generation Based on D-Algorithm
Portland, Oregon
May 23-May 25
ISBN: 0-7695-0692-5
Naotake Kamiura, Himeji Institute of Technology
Yutaka Hata, Himeji Institute of Technology
Nobuyuki Matsui, Himeji Institute of Technology
In this paper, we propose controllability and observability measures to guide the D-algorithm for multiple-valued logic circuits. The former is determined in one forward traversal of the circuit, and used in determining the line where the consistency operation should proceed. The latter is determined in one backward traversal, and used in executing the D-drive at the fan out point. Our measures are computed by simple recursive formulas, and the time required for computing them is relatively short. The experimental results show that our measures are helpful in reducing the number of times for backtracking.
Index Terms:
multiple-valued logic, test generation, D-algorithm, controllability measure, observability measure
Citation:
Naotake Kamiura, Yutaka Hata, Nobuyuki Matsui, "Controllability/Observability Measures for Multiple-Valued Test Generation Based on D-Algorithm," ismvl, pp.245, 30th IEEE International Symposium on Multiple-Valued Logic (ISMVL 2000), 2000
Usage of this product signifies your acceptance of the Terms of Use.