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Third IEEE and ACM International Symposium on Mixed and Augmented Reality (ISMAR'04)
Arlington, VA, USA
November 02-November 05
ISBN: 0-7695-2191-6
Table of Contents
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Keynote Talks
Session 1: System and Architecture
Enylton Machado Coelho, Georgia Institute of Technology, Atlanta GA
Blair MacIntyre, Georgia Institute of Technology, Atlanta GA
Simon J. Julier, Naval Research Laboratory, Washington DC
pp. 6-15
Ozan Cakmakci, University of Central Florida
Yonggang Ha, University of Central Florida
Jannick P. Rolland, University of Central Florida
pp. 16-25
Jochen Ehnes, The University of Tokyo, Japan
Koichi Hirota, The University of Tokyo, Japan
Michitaka Hirose, The University of Tokyo, Japan
pp. 26-35
Session 2: Tracking and Registration I
Luca Vacchetti, Swiss Federal Institute of Technology
Vincent Lepetit, Swiss Federal Institute of Technology
Pascal Fua, Swiss Federal Institute of Technology
pp. 48-57
Micha? Aron, LORIA - INRIA Lorraine, France
Gilles Simon, LORIA - UHP Nancy 1, France
Marie-Odile Berger, LORIA - INRIA Lorraine, France
pp. 58-67
Session 3: Calibration
Charles B. Owen, Michigan State University, East Lansing, MI
Ji Zhou, Michigan State University, East Lansing, MI
Arthur Tang, Michigan State University, East Lansing, MI
Fan Xiao, Michigan State University, East Lansing, MI
pp. 70-78
Hesam Najafi, Technische Universit?t M?nchen, Germany
Nassir Navab, Technische Universit?t M?nchen, Germany
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 79-88
Daisuke Kotake, MR Systems Laboratory, Canon Inc.
Shinji Uchiyama, MR Systems Laboratory, Canon Inc.
Hiroyuki Yamamoto, MR Systems Laboratory, Canon Inc.
pp. 89-98
Session 4: Tracking and Registration II
Daniel Cotting, ETH Zurich, Switzerland
Martin Naef, ETH Zurich, Switzerland
Markus Gross, ETH Zurich, Switzerland
Henry Fuchs, University of North Carolina at Chapel Hill
pp. 100-109
Iryna Skrypnyk, University of British Columbia, Canada
David G. Lowe, University of British Columbia, Canada
pp. 110-119
Larry Davis, University of Central Florida
Felix G. Hamza-Lup, University of Central Florida
Jannick P. Rolland, University of Central Florida
pp. 120-129
Session 5: Application
Istv?n Barakonyi, Vienna University of Technology
Thomas Psik, Vienna University of Technology
Dieter Schmalstieg, Vienna University of Technology
pp. 141-150
Yoshinari Kameda, University of Tsukuba, Japan
Taisuke Takemasa, University of Tsukuba, Japan
Yuichi Ohta, University of Tsukuba, Japan
pp. 151-160
Session 6: Authoring
Gun A. Lee, Pohang University of Science and Technology
Claudia Nelles, University of Canterbury
Mark Billinghurst, University of Canterbury
Gerard Jounghyun Kim, Pohang University of Science and Technology
pp. 172-181
Jia Li, University of Ottawa, Canada
Robert Lagani?re, University of Ottawa, Canada
Gerhard Roth, National Research Council, Canada
pp. 182-190
Session 7: Tracking and Registration III
Joseph Newman, Technische Universit?t Wien, Austria
Martin Wagner, Technische Universit?t M?nchen, Germany
Martin Bauer, Technische Universit?t M?nchen, Germany
Asa MacWilliams, Technische Universit?t M?nchen, Germany
Thomas Pintaric, Technische Universit?t Wien, Austria
Dagmar Beyer, Technische Universit?t M?nchen, Germany
Daniel Pustka, Technische Universit?t M?nchen, Germany
Franz Strasser, Technische Universit?t M?nchen, Germany
Dieter Schmalstieg, Technische Universit?t Wien, Austria
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 192-201
Session 8: Presentation
Alex Leykin, Indiana University, Bloomington
Mihran Tuceryan, Indiana University - Purdue University Indianapolis (IUPUI)
pp. 224-230
Ryan Bane, University of California, Santa Barbara
Tobias H?llerer, University of California, Santa Barbara
pp. 231-239
Zhiyun Li, University of Maryland, College Park
Ramani Duraiswami, University of Maryland, College Park
Larry S. Davis, University of Maryland, College Park
pp. 240-249
Posters
Mathias M?hring, Bauhaus University, Germany
Christian Lessig, Bauhaus University, Germany
Oliver Bimber, Bauhaus University, Germany
pp. 252-253
M. C. Juan, Universidad Politecnica de Valencia
C. Botella, Departamento de Psicologia Basica y Psicobiologia (UJI)
M. Alca?, Universidad Politecnica de Valencia
R. Ba?, Universidad de Valencia
C. Carrion, Universidad Politecnica de Valencia
M. Melero, Universidad Politecnica de Valencia
J. A. Lozano, Universidad Politecnica de Valencia
pp. 256-257
Xiang Zhang, Siemens Corporate Research, Princeton, NJ
pp. 258-259
Daniel F. Abawi, J. W. Goethe-University Frankfurt, Germany
Joachim Bienwald, J. W. Goethe-University Frankfurt, Germany
Ralf D?rner, Hochschule Harz, Wernigerode, Germany
pp. 260-261
Jean-Yves Didier, Universit? d'Evry Val d'Essone, France
David Roussel, Universit? d'Evry Val d'Essone, France
Malik Mallem, Universit? d'Evry Val d'Essone, France
pp. 262-263
Toshihiro Asai, Nara Institute of Science and Technology, Japan
Masayuki Kanbara, Nara Institute of Science and Technology, Japan
Naokazu Yokoya, Nara Institute of Science and Technology, Japan
pp. 264-265
Fabrice Caillette, University of Manchester, UK
Toby Howard, University of Manchester, UK
pp. 266-267
Ralf D?rner, Hochschule Harz, Wernigerode, Germany
Leif Oppermann, Hochschule Harz, Wernigerode, Germany
Christian Geiger, Hochschule Harz, Wernigerode, Germany
pp. 268-269
Frederic D. McKenzie, Old Dominion University
Hector M. Garcia, Old Dominion University
Reynel J. Castelino, Old Dominion University
Thomas W. Hubbard, Eastern Virginia Medical School
John A. Ullian, Eastern Virginia Medical School
Gayle A. Gliva, Eastern Virginia Medical School
pp. 270-271
Hanhoon Park, Hanyang University, Seoul, Korea
Jong-Il Park, Hanyang University, Seoul, Korea
pp. 272-273
R. Lapeer, University of East Anglia, Norwich, UK
M. S. Chen, University of East Anglia, Norwich, UK
J. Villagrana, University of East Anglia, Norwich, UK
pp. 274-275
Martin Wagner, Technische Universit?t M?nchen, Germany
Sven Hennauer, Technische Universit?t M?nchen, Germany
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 276-277
L. Soler, IRCAD, Virtual-surg
S. Nicolau, IRCAD, Virtual-surg
J. Schmid, IRCAD, Virtual-surg
C. Koehl, IRCAD, Virtual-surg
J. Marescaux, IRCAD, Virtual-surg
X. Pennec, INRIA Epidaure
N. Ayache, INRIA Epidaure
pp. 278-279
Wayne Piekarski, University of South Australia, Australia
Ross Smith, University of South Australia, Australia
Bruce H. Thomas, University of South Australia, Australia
pp. 280-281
Maribeth Gandy, Georgia Institute of Technology, Atlanta
Blair MacIntyre, Georgia Institute of Technology, Atlanta
Steven Dow, Georgia Institute of Technology, Atlanta
pp. 282-283
Vinko Novak, Technische Universit?t M?nchen, Germany
Christian Sandor, Technische Universit?t M?nchen, Germany
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 284-285
Masanao Koeda, Nara Institute of Science and Technology, Japan
Yoshio Matsumoto, Nara Institute of Science and Technology, Japan
Tsukasa Ogasawara, Nara Institute of Science and Technology, Japan
pp. 288-289
Tobias Sielhorst, Technische Universit?t M?nchen
J?rg Traub, Technische Universit?t M?nchen
Nassir Navab, Technische Universit?t M?nchen
pp. 290-291
Christian Geiger, Universit?tPaderborn, Germany
Tim Schmidt, Universit?tPaderborn, Germany
J?rg St?cklein, Universit?tPaderborn, Germany
pp. 292-293
Sarah Tariq, Georgia Institute of Technology, Atlanta, GA
Frank Dellaert, Georgia Institute of Technology, Atlanta, GA
pp. 296-297
Kenneth Fast, Electric Boat Corporation
Robert Yancey, Edison Welding Institute
pp. 298-299
Stephen DiVerdi, University of California, Santa Barbara
Tobias H?llerer, University of California, Santa Barbara
Richard Schreyer, University of California, Santa Barbara
pp. 300-301
Jose Molineros, Rockwell Scientific Company (RSC)
Reinhold Behringer, Rockwell Scientific Company (RSC)
Clement Tam, Rockwell Scientific Company (RSC)
pp. 302-303
Tutorials
Author Index (PDF)
pp. 307-308
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