ISBN: 0-7695-2006-5

Nassir Navab, Siemens Corporate Research

Katsushi Ikeuchi, The University of Tokyo

Atsushi Nakazawa, The University of Tokyo

Kazuhide Hasegawa, The University of Tokyo

Takeshi Ohishi, The University of Tokyo

Andrew J. Davison, University of Oxford

Walterio W. Mayol, University of Oxford

David W. Murray, University of Oxford

Larry Davis, University of Central Florida

Eric Clarkson, University of Arizona

Jannick P. Rolland, University of Central Florida

Andrew I. Comport, IRISA - INRIA Rennes

?ric Marchand, IRISA - INRIA Rennes

Fran?ois Chaumette, IRISA - INRIA Rennes

Kiyohide Satoh, MR Systems Laboratory, Canon Inc.

Shinji Uchiyama, MR Systems Laboratory, Canon Inc.

Hiroyuki Yamamoto, MR Systems Laboratory, Canon Inc.

Hideyuki Tamura, MR Systems Laboratory, Canon Inc.

Mark A. Livingston, Naval Research Laboratory, Washington D.C.

J. Edward Swan II, Naval Research Laboratory, Washington D.C.

Joseph L. Gabbard, Naval Research Laboratory, Washington D.C.

Tobias H. H?llerer, Naval Research Laboratory, Washington D.C.

Deborah Hix, Naval Research Laboratory, Washington D.C.

Simon J. Julier, Naval Research Laboratory, Washington D.C.

Yohan Baillot, Naval Research Laboratory, Washington D.C.

Dennis Brown, Naval Research Laboratory, Washington D.C.

Ronald Azuma, HRL Laboratories, LLC

Chris Furmanski, HRL Laboratories, LLC

Natsuki Sugano, Hiroshima City University

Hirokazu Kato, Osaka University

Keihachiro Tachibana, Hiroshima City University

Daniel Belcher, University of Washington, Seattle

Mark Billinghurst, University of Washington, Seattle; University of Canterbury, Christchurch, NZ

SE Hayes, University of Washington, Seattle

Randy Stiles, Lockheed Martin Corporation

Vincent Lepetit, Swiss Federal Institute of Technology

Luca Vacchetti, Swiss Federal Institute of Technology

Daniel Thalmann, Swiss Federal Institute of Technology

Pascal Fua, Swiss Federal Institute of Technology

Masakatsu Kourogi, National Institute of Advanced Industrial Science and Technology (AIST), Japan

Takeshi Kurata, University of Washington

Georg Klein, University of Cambridge

Tom Drummond, University of Cambridge

Asa MacWilliams, Technische Universit?t M?nchen

Christian Sandor, Technische Universit?t M?nchen

Martin Wagner, Technische Universit?t M?nchen

Martin Bauer, Technische Universit?t M?nchen

Gudrun Klinker, Technische Universit?t M?nchen

Bernd Bruegge, Technische Universit?t M?nchen

Kiyoshi Kiyokawa, Osaka University, Japan

Mark Billinghurst, Human Interface Technology Laboratory New Zealand

Bruce Campbell, University of Washington

Eric Woods, Human Interface Technology Laboratory New Zealand

Yohan Baillot, ITT Advanced Engineering & Sciences

Simon J. Julier, ITT Advanced Engineering & Sciences

Dennis Brown, Naval Research Laboratory

Mark A. Livingston, Naval Research Laboratory

Eric Foxlin, InterSense Inc.

Leonid Naimark, InterSense Inc.

Arthur Tang, Michigan State University, East Lansing

Ji Zhou, Michigan State University, East Lansing

Charles Owen, Michigan State University, East Lansing

Hansung Kim, Yonsei University

Seung-jun Yang, Omnitel, Inc.

Kwanghoon Sohn, Yonsei University

Takayoshi Koyama, University of Tsukuba

Itaru Kitahara, ATR Institute International

Yuichi Ohta, University of Tsukuba

Naho Inamoto, Keio University, Yokohama, Japan

Hideo Saito, Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)

Oliver Bimber, Bauhaus University

Anselm Grundh?fer, Bauhaus University

Gordon Wetzstein, Bauhaus University

Sebastian Kn?del, Bauhaus University

Kusuma Agusanto, Nanyang Technological University

Li Li, Nanyang Technological University

Zhu Chuangui, Nanyang Technological University

Ng Wan Sing, Nanyang Technological University

Siavash Zokai, Siemens Corporate Research

Julien Esteve, Siemens Corporate Research

Yakup Genc, Siemens Corporate Research

Nassir Navab, Siemens Corporate Research

Nobuyuki Matsushita, Sony Computer Science Laboratories, Inc.; Keio University

Daisuke Hihara, Sony-Kihara Research Center, Inc.

Teruyuki Ushiro, Sony-Kihara Research Center, Inc.

Shinichi Yoshimura, Sony-Kihara Research Center, Inc.

Jun Rekimoto, Sony Computer Science Laboratories, Inc.

Yoshikazu Yamamoto, Keio University

J? Zauner, Upper Austria University of Applied Sciences (MTD)

Michael Haller, Upper Austria University of Applied Sciences (MTD)

Alexander Brandl, Upper Austria University of Applied Sciences (MTD)

Werner Hartmann, Institute for Applied Knowledge Processing (FAW)

Wayne Piekarski, University of South Australia

Bruce H. Thomas, University of South Australia

D. Beier, Technische Universit?t Ilmenau

R. Billert, Technische Universit?t Ilmenau

B. Br?derlin, Technische Universit?t Ilmenau

D. Stichling, Universit?t Paderborn

B. Kleinjohann, Universit?t Paderborn

Takashi Okuma, Columbia University; National Institute of Advanced Industrial Science and Technology

Takeshi Kurata, University of Washington; National Institute of Advanced Industrial Science and Technology

Katsuhiko Sakaue, National Institute of Advanced Industrial Science and Technology

Takeshi Kawano, Kobe University, Japan

Yoshihiro Ban, Kobe University, Japan

Kuniaki Uehara, Kobe University, Japan

Yong Liu, Aalborg University

Moritz St?rring, Aalborg University

Thomas B. Moeslund, Aalborg University

Claus B. Madsen, Aalborg University

Erik Granum, Aalborg University

Wayne Piekarski, University of South Australia

Ben Avery, University of South Australia

Bruce H. Thomas, University of South Australia

Pierre Malbezin, University of South Australia

Daniel Roetenberg, University of Twente, The Netherlands

Henk Luinge, University of Twente, The Netherlands

Peter Veltink, University of Twente, The Netherlands

Sebastian Vogt, Siemens Corporate Research, NJ, USA

Ali Khamene, Siemens Corporate Research, NJ, USA

Frank Sauer, Siemens Corporate Research, NJ, USA

Andreas Keil, Siemens Corporate Research, NJ, USA

Heinrich Niemann, Universit?t Erlangen-N?rnberg, Erlangen, Germany

R.J. Lapeer, University of East Anglia, UK

A.C. Tan, University College London, UK

A. Linney, University College London, UK

G. Alusi, St. Bartholomews Hospital, London, UK

Thomas Reicher, Technische Universit?t M?nchen, Germany

Asa MacWilliams, Technische Universit?t M?nchen, Germany

Bernd Br?, Technische Universit?t M?nchen, Germany

Gudrun Klinker, Technische Universit?t M?nchen, Germany

Wouter Pasman, Delft University of Technology

Charles Woodward, Technical Research Centre of Finland

Shinichiro Hirooka, Keio University, Yokohama, Japan

Hideo Saito, Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)

Jamie Sands, Napier University

Shaun W. Lawson, Napier University

C?line Loscos, University College London

Hila Ritter Widenfeld, University College London

Maria Roussou, University College London; Foundation of Hellenic World

Alexandre Meyer, University College London

Franco Tecchia, University College London

George Drettakis, REVES/INRIA Sophia-Antipolis

Emmanuel Gallo, REVES/INRIA Sophia-Antipolis

Alex Reche Martinez, REVES/INRIA Sophia-Antipolis

Nicolas Tsingos, REVES/INRIA Sophia-Antipolis

Yiorgos Chrysanthou, University of Cyprus

Luc Robert, RealViz

Massimo Bergamasco, PERCRO

Andrea Dettori, PERCRO

Souheil Soubra, CSTB

Toshikazu Ohshima, MR Systems Laboratory, Canon Inc.

Tsuyoshi Kuroki, MR Systems Laboratory, Canon Inc.

Hiroyuki Yamamoto, MR Systems Laboratory, Canon Inc.

Hideyuki Tamura, MR Systems Laboratory, Canon Inc.

Tomoyasu Nakatsuru, Kyoto University, Japan

Yasuyoshi Yokokohji, Kyoto University, Japan

Daisuke Eto, Kyoto University, Japan

Tsuneo Yoshikawa, Kyoto University, Japan

Hiroyuki Maeda, The University of Tokyo

Kazuhiko Hirose, The University of Tokyo

Jun Yamashita, The University of Tokyo

Koichi Hirota, The University of Tokyo

Michitaka Hirose, The University of Tokyo

H. Regenbrecht, DaimlerChrysler AG

C. Ott, igroup.org

M. Wagner, shared-reality.com

T. Lum, DaimlerChrysler AG

P. Kohler, DaimlerChrysler AG

W. Wilke, DaimlerChrysler AG

E. Mueller, DaimlerChrysler AG

Sei Ikeda, Nara Institute of Science and Technology

Tomokazu Sato, Nara Institute of Science and Technology

Masayuki Kanbara, Nara Institute of Science and Technology

Naokazu Yokoya, Nara Institute of Science and Technology

Adrian Woolard, BBC Creative R&D, UK

Vali Lalioti, BBC Research & Development, UK

Nicholas Hedley, ARToolworks Inc, USA

Neil Carrigan, BBC Creative R&D, UK

Matt Hammond, BBC Research & Development, UK

Joey Julien, BBC Creative R&D, UK

V. Sundareswaran, Rockwell Scientific Company, Thousand Oaks, CA

Kenneth Wang, Rockwell Scientific Company, Thousand Oaks, CA

Steven Chen, Rockwell Scientific Company, Thousand Oaks, CA

Reinhold Behringer, Rockwell Scientific Company, Thousand Oaks, CA

Joshua McGee, Rockwell Scientific Company, Thousand Oaks, CA

Clement Tam, Rockwell Scientific Company, Thousand Oaks, CA

Pavel Zahorik, University of Wisconsin, Madison, WI

Stephen DiVerdi, University of California, Santa Barbara, CA

Daniel Nurmi, University of California, Santa Barbara, CA

Tobias H?llerer, University of California, Santa Barbara, CA

Alex Olwal, Columbia University

Hrvoje Benko, Columbia University

Steven Feiner, Columbia University

Raphael Grasset, INRIA Rhone-Alpes

Jean-Dominique Gascuel, INRIA Rhone-Alpes

Dieter Schmalstieg, Vienna University of Technology

Marc Cavazza, University of Teesside, Middlesbrough, UK

Olivier Martin, Universit? catholique de Louvain, Belgium

Fred Charles, University of Teesside, Middlesbrough, UK

Xavier Marichal, Alterface, Belgium

Steven J. Mead, University of Teesside, Middlesbrough, UK

Hiroshi Kato, The University of Tokyo

Takeshi Naemura, The University of Tokyo

Hiroshi Harashima, The University of Tokyo

D. Aiteanu, University of Bremen, Germany

B. Hillers, University of Bremen, Germany

A Gr?ser, University of Bremen, Germany

Hans Kr?, Physikalisches Institut der Universit?t Bonn, Germany

Lasse Klingbeil, Physikalisches Institut der Universit?t Bonn, Germany

Edgar Kraft, Physikalisches Institut der Universit?t Bonn, Germany

Rene Hamburger, Physikalisches Institut der Universit?t Bonn, Germany

Hesam Najafi, Technische Universit?t M?nchen, Germany

Gudrun Klinker, Technische Universit?t M?nchen, Germany

Andrew J. Davison, University of Oxford

Walterio W. Mayol, University of Oxford

David W. Murray, University of Oxford

Wayne Piekarski, University of South Australia

Bruce H. Thomas, University of South Australia

T. Pettersen, Corporate Research Center, Norway

J. Pretlove, Corporate Research Center, Norway

C. Skourup, Corporate Research Center, Norway

T. Engedal, Corporate Research Center, Norway

T. L?kstad, Corporate Research Center, Norway

Toshikazu Karitsuka, Osaka University

Kosuke Sato, Osaka University

Kosuke Nakayama, Osaka University

Kosuke Sato, Osaka University

Marissa D?az, ITESM - CEM Department of Computer Science

Eduardo Hern?ndez, ITESM - CEM Department of Computer Science

Leonardo Escalona, ITESM - CEM Department of Computer Science

Isaac Rudomin, ITESM - CEM Department of Computer Science

Daniel Rivera, ITESM - CEM Department of Computer Science

Kazue Kobayashi, NTT Comware Co.

Mitsunori Hirano, NTT Comware Co.

Atsunobu Narita, NTT Comware Co.

Hiroshi Ishii, MIT Media Lab

Blair MacIntyre, Georgia Institute of Technology, Atlanta, GA

Maribeth Gandy, Georgia Institute of Technology, Atlanta, GA

Jay Bolter, Georgia Institute of Technology, Atlanta, GA

Steven Dow, Georgia Institute of Technology, Atlanta, GA

Brendan Hannigan, Georgia Institute of Technology, Atlanta, GA

Gerhard Reitmayr, Vienna University of Technology

Mark Billinghurst, University of Canterbury

Dieter Schmalstieg, Vienna University of Technology

Istv? Barakonyi, Vienna University of Technology

Tamer Fahmy, Vienna University of Technology

Dieter Schmalstieg, Vienna University of Technology

Karin Kosina, Systems in Motion

Daniel Wagner, Vienna University of Technology, Favoritenstr

Istvan Barakonyi, Vienna University of Technology, Favoritenstr

Thomas Pintaric, Vienna University of Technology

Rodney Berry, ATR Media Information Science Laboratories

Mao Makino, ATR Media Information Science Laboratories

Naoto Hikawa, ATR Media Information Science Laboratories

Masumi Suzuki, ATR Media Information Science Laboratories

Hirokazu Kato, Osaka University

Keihachiro Tachibana, Hiroshima City University

Masaaki Tanabe, Knack Images Production Center

Takeaki Nakajima, Hiroshima City University

Yumiko Fukuda, Hiroshima Institute of Technology

Masakatsu Kourogi, National Institute of Advanced Industrial Science and Technology (AIST)

Takeshi Kuratta, National Institute of Advanced Industrial Science and Technology (AIST); University of Washington

Ryuhei Tenmoku, Nara Institute of Science and Technology, Japan

Masayuki Kanbara, Nara Institute of Science and Technology, Japan

Naokazu Yokoya, Nara Institute of Science and Technology, Japan

Vincent Lepetit, Swiss Federal Institute of Technology

Luca Vacchetti, Swiss Federal Institute of Technology

Daniel Thalmann, Swiss Federal Institute of Technology

Pascal Fua, Swiss Federal Institute of Technology

Masahiko Inami, The University of Electro-Communications

Naoki Kawakami, The University of Tokyo

Susumu Tachi, The University of Tokyo

Eiichi Hosoya, NTT Microsystem Integration Laboratories

Miki Kitabata, NTT Microsystem Integration Laboratories

Hidenori Sato, NTT Microsystem Integration Laboratories

Ikuo Harada, NTT Microsystem Integration Laboratories

Hisao Nojima, NTT Microsystem Integration Laboratories

Fumiharu Morisawa, NTT Microsystem Integration Laboratories

Shinichiro Mutoh, NTT Microsystem Integration Laboratories

Akira Onozawa, NTT Microsystem Integration Laboratories

Hiroshi Kato, The University of Tokyo

Takeshi Naemura, The University of Tokyo

Hiroshi Harashima, The University of Tokyo

Christopher B. Stapleton, Univ. of Central Florida

Charles E. Hughes, Univ. of Central Florida

J. Michael Moshell, Univ. of Central Florida

Masayuki Takemura, University of Tsukuba

Shungo Haraguchi, University of Tsukuba

Yasuhiro Okuno, Canon Inc.

Hiroyuki Kakuta, Canon Inc.

Tomohiko Takayama, Canon Inc.

Kazuhiro Asai, Nagoya Designer Gakuin College