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The Second IEEE and ACM International Symposium on Mixed and Augmented Reality
Tokyo, Japan
October 07-October 10
ISBN: 0-7695-2006-5
Table of Contents
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Keynote Talks
Papers
Larry Davis, University of Central Florida
Eric Clarkson, University of Arizona
Jannick P. Rolland, University of Central Florida
pp. 28
Kiyohide Satoh, MR Systems Laboratory, Canon Inc.
Shinji Uchiyama, MR Systems Laboratory, Canon Inc.
Hiroyuki Yamamoto, MR Systems Laboratory, Canon Inc.
Hideyuki Tamura, MR Systems Laboratory, Canon Inc.
pp. 46
Mark A. Livingston, Naval Research Laboratory, Washington D.C.
J. Edward Swan II, Naval Research Laboratory, Washington D.C.
Joseph L. Gabbard, Naval Research Laboratory, Washington D.C.
Tobias H. H?llerer, Naval Research Laboratory, Washington D.C.
Deborah Hix, Naval Research Laboratory, Washington D.C.
Simon J. Julier, Naval Research Laboratory, Washington D.C.
Yohan Baillot, Naval Research Laboratory, Washington D.C.
Dennis Brown, Naval Research Laboratory, Washington D.C.
pp. 56
Daniel Belcher, University of Washington, Seattle
Mark Billinghurst, University of Washington, Seattle; University of Canterbury, Christchurch, NZ
SE Hayes, University of Washington, Seattle
Randy Stiles, Lockheed Martin Corporation
pp. 84
Vincent Lepetit, Swiss Federal Institute of Technology
Luca Vacchetti, Swiss Federal Institute of Technology
Daniel Thalmann, Swiss Federal Institute of Technology
Pascal Fua, Swiss Federal Institute of Technology
pp. 93
Masakatsu Kourogi, National Institute of Advanced Industrial Science and Technology (AIST), Japan
Takeshi Kurata, University of Washington
pp. 103
Asa MacWilliams, Technische Universit?t M?nchen
Christian Sandor, Technische Universit?t M?nchen
Martin Wagner, Technische Universit?t M?nchen
Martin Bauer, Technische Universit?t M?nchen
Gudrun Klinker, Technische Universit?t M?nchen
Bernd Bruegge, Technische Universit?t M?nchen
pp. 123
Kiyoshi Kiyokawa, Osaka University, Japan
Mark Billinghurst, Human Interface Technology Laboratory New Zealand
Bruce Campbell, University of Washington
Eric Woods, Human Interface Technology Laboratory New Zealand
pp. 133
Yohan Baillot, ITT Advanced Engineering & Sciences
Simon J. Julier, ITT Advanced Engineering & Sciences
Dennis Brown, Naval Research Laboratory
Mark A. Livingston, Naval Research Laboratory
pp. 142
Arthur Tang, Michigan State University, East Lansing
Ji Zhou, Michigan State University, East Lansing
Charles Owen, Michigan State University, East Lansing
pp. 161
Takayoshi Koyama, University of Tsukuba
Itaru Kitahara, ATR Institute International
Yuichi Ohta, University of Tsukuba
pp. 178
Naho Inamoto, Keio University, Yokohama, Japan
Hideo Saito, Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)
pp. 188
Kusuma Agusanto, Nanyang Technological University
Li Li, Nanyang Technological University
Zhu Chuangui, Nanyang Technological University
Ng Wan Sing, Nanyang Technological University
pp. 208
Siavash Zokai, Siemens Corporate Research
Julien Esteve, Siemens Corporate Research
Yakup Genc, Siemens Corporate Research
Nassir Navab, Siemens Corporate Research
pp. 217
Nobuyuki Matsushita, Sony Computer Science Laboratories, Inc.; Keio University
Daisuke Hihara, Sony-Kihara Research Center, Inc.
Teruyuki Ushiro, Sony-Kihara Research Center, Inc.
Shinichi Yoshimura, Sony-Kihara Research Center, Inc.
Jun Rekimoto, Sony Computer Science Laboratories, Inc.
Yoshikazu Yamamoto, Keio University
pp. 227
J? Zauner, Upper Austria University of Applied Sciences (MTD)
Michael Haller, Upper Austria University of Applied Sciences (MTD)
Alexander Brandl, Upper Austria University of Applied Sciences (MTD)
Werner Hartmann, Institute for Applied Knowledge Processing (FAW)
pp. 237
Posters
D. Beier, Technische Universit?t Ilmenau
R. Billert, Technische Universit?t Ilmenau
B. Br?derlin, Technische Universit?t Ilmenau
D. Stichling, Universit?t Paderborn
B. Kleinjohann, Universit?t Paderborn
pp. 258
Takashi Okuma, Columbia University; National Institute of Advanced Industrial Science and Technology
Takeshi Kurata, University of Washington; National Institute of Advanced Industrial Science and Technology
Katsuhiko Sakaue, National Institute of Advanced Industrial Science and Technology
pp. 260
Yong Liu, Aalborg University
Moritz St?rring, Aalborg University
Thomas B. Moeslund, Aalborg University
Claus B. Madsen, Aalborg University
Erik Granum, Aalborg University
pp. 264
Wayne Piekarski, University of South Australia
Ben Avery, University of South Australia
Bruce H. Thomas, University of South Australia
Pierre Malbezin, University of South Australia
pp. 266
Daniel Roetenberg, University of Twente, The Netherlands
Henk Luinge, University of Twente, The Netherlands
Peter Veltink, University of Twente, The Netherlands
pp. 268
Sebastian Vogt, Siemens Corporate Research, NJ, USA
Ali Khamene, Siemens Corporate Research, NJ, USA
Frank Sauer, Siemens Corporate Research, NJ, USA
Andreas Keil, Siemens Corporate Research, NJ, USA
Heinrich Niemann, Universit?t Erlangen-N?rnberg, Erlangen, Germany
pp. 270
R.J. Lapeer, University of East Anglia, UK
A.C. Tan, University College London, UK
A. Linney, University College London, UK
G. Alusi, St. Bartholomews Hospital, London, UK
pp. 272
Thomas Reicher, Technische Universit?t M?nchen, Germany
Asa MacWilliams, Technische Universit?t M?nchen, Germany
Bernd Br?, Technische Universit?t M?nchen, Germany
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 274
Wouter Pasman, Delft University of Technology
Charles Woodward, Technical Research Centre of Finland
pp. 276
Shinichiro Hirooka, Keio University, Yokohama, Japan
Hideo Saito, Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)
pp. 278
C?line Loscos, University College London
Hila Ritter Widenfeld, University College London
Maria Roussou, University College London; Foundation of Hellenic World
Alexandre Meyer, University College London
Franco Tecchia, University College London
George Drettakis, REVES/INRIA Sophia-Antipolis
Emmanuel Gallo, REVES/INRIA Sophia-Antipolis
Alex Reche Martinez, REVES/INRIA Sophia-Antipolis
Nicolas Tsingos, REVES/INRIA Sophia-Antipolis
Yiorgos Chrysanthou, University of Cyprus
Luc Robert, RealViz
pp. 282
Toshikazu Ohshima, MR Systems Laboratory, Canon Inc.
Tsuyoshi Kuroki, MR Systems Laboratory, Canon Inc.
Hiroyuki Yamamoto, MR Systems Laboratory, Canon Inc.
Hideyuki Tamura, MR Systems Laboratory, Canon Inc.
pp. 284
Tomoyasu Nakatsuru, Kyoto University, Japan
Yasuyoshi Yokokohji, Kyoto University, Japan
Daisuke Eto, Kyoto University, Japan
Tsuneo Yoshikawa, Kyoto University, Japan
pp. 286
Hiroyuki Maeda, The University of Tokyo
Kazuhiko Hirose, The University of Tokyo
Jun Yamashita, The University of Tokyo
Koichi Hirota, The University of Tokyo
Michitaka Hirose, The University of Tokyo
pp. 288
H. Regenbrecht, DaimlerChrysler AG
C. Ott, igroup.org
M. Wagner, shared-reality.com
T. Lum, DaimlerChrysler AG
P. Kohler, DaimlerChrysler AG
W. Wilke, DaimlerChrysler AG
E. Mueller, DaimlerChrysler AG
pp. 290
Sei Ikeda, Nara Institute of Science and Technology
Tomokazu Sato, Nara Institute of Science and Technology
Masayuki Kanbara, Nara Institute of Science and Technology
Naokazu Yokoya, Nara Institute of Science and Technology
pp. 292
Adrian Woolard, BBC Creative R&D, UK
Vali Lalioti, BBC Research & Development, UK
Nicholas Hedley, ARToolworks Inc, USA
Neil Carrigan, BBC Creative R&D, UK
Matt Hammond, BBC Research & Development, UK
Joey Julien, BBC Creative R&D, UK
pp. 294
V. Sundareswaran, Rockwell Scientific Company, Thousand Oaks, CA
Kenneth Wang, Rockwell Scientific Company, Thousand Oaks, CA
Steven Chen, Rockwell Scientific Company, Thousand Oaks, CA
Reinhold Behringer, Rockwell Scientific Company, Thousand Oaks, CA
Joshua McGee, Rockwell Scientific Company, Thousand Oaks, CA
Clement Tam, Rockwell Scientific Company, Thousand Oaks, CA
Pavel Zahorik, University of Wisconsin, Madison, WI
pp. 296
Stephen DiVerdi, University of California, Santa Barbara, CA
Daniel Nurmi, University of California, Santa Barbara, CA
Tobias H?llerer, University of California, Santa Barbara, CA
pp. 298
Raphael Grasset, INRIA Rhone-Alpes
Jean-Dominique Gascuel, INRIA Rhone-Alpes
Dieter Schmalstieg, Vienna University of Technology
pp. 302
Marc Cavazza, University of Teesside, Middlesbrough, UK
Olivier Martin, Universit? catholique de Louvain, Belgium
Fred Charles, University of Teesside, Middlesbrough, UK
Xavier Marichal, Alterface, Belgium
Steven J. Mead, University of Teesside, Middlesbrough, UK
pp. 304
Hiroshi Kato, The University of Tokyo
Takeshi Naemura, The University of Tokyo
Hiroshi Harashima, The University of Tokyo
pp. 306
Demonstrations
D. Aiteanu, University of Bremen, Germany
B. Hillers, University of Bremen, Germany
A Gr?ser, University of Bremen, Germany
pp. 309
Hans Kr?, Physikalisches Institut der Universit?t Bonn, Germany
Lasse Klingbeil, Physikalisches Institut der Universit?t Bonn, Germany
Edgar Kraft, Physikalisches Institut der Universit?t Bonn, Germany
Rene Hamburger, Physikalisches Institut der Universit?t Bonn, Germany
pp. 311
Hesam Najafi, Technische Universit?t M?nchen, Germany
Gudrun Klinker, Technische Universit?t M?nchen, Germany
pp. 313
Wayne Piekarski, University of South Australia
Bruce H. Thomas, University of South Australia
pp. 317
T. Pettersen, Corporate Research Center, Norway
J. Pretlove, Corporate Research Center, Norway
C. Skourup, Corporate Research Center, Norway
T. Engedal, Corporate Research Center, Norway
T. L?kstad, Corporate Research Center, Norway
pp. 319
Marissa D?az, ITESM - CEM Department of Computer Science
Eduardo Hern?ndez, ITESM - CEM Department of Computer Science
Leonardo Escalona, ITESM - CEM Department of Computer Science
Isaac Rudomin, ITESM - CEM Department of Computer Science
Daniel Rivera, ITESM - CEM Department of Computer Science
pp. 325
Blair MacIntyre, Georgia Institute of Technology, Atlanta, GA
Maribeth Gandy, Georgia Institute of Technology, Atlanta, GA
Jay Bolter, Georgia Institute of Technology, Atlanta, GA
Steven Dow, Georgia Institute of Technology, Atlanta, GA
Brendan Hannigan, Georgia Institute of Technology, Atlanta, GA
pp. 329
Gerhard Reitmayr, Vienna University of Technology
Mark Billinghurst, University of Canterbury
Dieter Schmalstieg, Vienna University of Technology
pp. 331
Istv? Barakonyi, Vienna University of Technology
Tamer Fahmy, Vienna University of Technology
Dieter Schmalstieg, Vienna University of Technology
Karin Kosina, Systems in Motion
pp. 333
Daniel Wagner, Vienna University of Technology, Favoritenstr
Istvan Barakonyi, Vienna University of Technology, Favoritenstr
pp. 335
Thomas Pintaric, Vienna University of Technology
pp. 337
Rodney Berry, ATR Media Information Science Laboratories
Mao Makino, ATR Media Information Science Laboratories
Naoto Hikawa, ATR Media Information Science Laboratories
Masumi Suzuki, ATR Media Information Science Laboratories
pp. 338
Hirokazu Kato, Osaka University
Keihachiro Tachibana, Hiroshima City University
Masaaki Tanabe, Knack Images Production Center
Takeaki Nakajima, Hiroshima City University
Yumiko Fukuda, Hiroshima Institute of Technology
pp. 340
Masakatsu Kourogi, National Institute of Advanced Industrial Science and Technology (AIST)
Takeshi Kuratta, National Institute of Advanced Industrial Science and Technology (AIST); University of Washington
pp. 342
Ryuhei Tenmoku, Nara Institute of Science and Technology, Japan
Masayuki Kanbara, Nara Institute of Science and Technology, Japan
Naokazu Yokoya, Nara Institute of Science and Technology, Japan
pp. 344
Vincent Lepetit, Swiss Federal Institute of Technology
Luca Vacchetti, Swiss Federal Institute of Technology
Daniel Thalmann, Swiss Federal Institute of Technology
Pascal Fua, Swiss Federal Institute of Technology
pp. 346
Masahiko Inami, The University of Electro-Communications
Naoki Kawakami, The University of Tokyo
Susumu Tachi, The University of Tokyo
pp. 348
Eiichi Hosoya, NTT Microsystem Integration Laboratories
Miki Kitabata, NTT Microsystem Integration Laboratories
Hidenori Sato, NTT Microsystem Integration Laboratories
Ikuo Harada, NTT Microsystem Integration Laboratories
Hisao Nojima, NTT Microsystem Integration Laboratories
Fumiharu Morisawa, NTT Microsystem Integration Laboratories
Shinichiro Mutoh, NTT Microsystem Integration Laboratories
Akira Onozawa, NTT Microsystem Integration Laboratories
pp. 350
Hiroshi Kato, The University of Tokyo
Takeshi Naemura, The University of Tokyo
Hiroshi Harashima, The University of Tokyo
pp. 352
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