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Proceedings the Second IEEE and ACM International Symposium on Mixed and Augmented Reality (2003)
Tokyo, Japan
Oct. 10, 2003 to Oct. 10, 2003
ISBN: 0-7695-2006-5
TABLE OF CONTENTS
pp. xiv
Keynote Talks
Katsushi Ikeuchi , The University of Tokyo
Atsushi Nakazawa , The University of Tokyo
Kazuhide Hasegawa , The University of Tokyo
Takeshi Ohishi , The University of Tokyo
pp. 7
Papers
Andrew J. Davison , University of Oxford
Walterio W. Mayol , University of Oxford
David W. Murray , University of Oxford
pp. 18
Larry Davis , University of Central Florida
Eric Clarkson , University of Arizona
Jannick P. Rolland , University of Central Florida
pp. 28
Andrew I. Comport , IRISA - INRIA Rennes
?ric Marchand , IRISA - INRIA Rennes
Fran?ois Chaumette , IRISA - INRIA Rennes
pp. 36
Kiyohide Satoh , MR Systems Laboratory, Canon Inc.
Shinji Uchiyama , MR Systems Laboratory, Canon Inc.
Hiroyuki Yamamoto , MR Systems Laboratory, Canon Inc.
Hideyuki Tamura , MR Systems Laboratory, Canon Inc.
pp. 46
Mark A. Livingston , Naval Research Laboratory, Washington D.C.
J. Edward Swan II , Naval Research Laboratory, Washington D.C.
Joseph L. Gabbard , Naval Research Laboratory, Washington D.C.
Tobias H. H?llerer , Naval Research Laboratory, Washington D.C.
Deborah Hix , Naval Research Laboratory, Washington D.C.
Simon J. Julier , Naval Research Laboratory, Washington D.C.
Yohan Baillot , Naval Research Laboratory, Washington D.C.
Dennis Brown , Naval Research Laboratory, Washington D.C.
pp. 56
Ronald Azuma , HRL Laboratories, LLC
Chris Furmanski , HRL Laboratories, LLC
pp. 66
Natsuki Sugano , Hiroshima City University
Hirokazu Kato , Osaka University
Keihachiro Tachibana , Hiroshima City University
pp. 76
Daniel Belcher , University of Washington, Seattle
Mark Billinghurst , University of Washington, Seattle; University of Canterbury, Christchurch, NZ
SE Hayes , University of Washington, Seattle
Randy Stiles , Lockheed Martin Corporation
pp. 84
Vincent Lepetit , Swiss Federal Institute of Technology
Luca Vacchetti , Swiss Federal Institute of Technology
Daniel Thalmann , Swiss Federal Institute of Technology
Pascal Fua , Swiss Federal Institute of Technology
pp. 93
Masakatsu Kourogi , National Institute of Advanced Industrial Science and Technology (AIST), Japan
Takeshi Kurata , University of Washington
pp. 103
Georg Klein , University of Cambridge
Tom Drummond , University of Cambridge
pp. 113
Asa MacWilliams , Technische Universit?t M?nchen
Christian Sandor , Technische Universit?t M?nchen
Martin Wagner , Technische Universit?t M?nchen
Martin Bauer , Technische Universit?t M?nchen
Gudrun Klinker , Technische Universit?t M?nchen
Bernd Bruegge , Technische Universit?t M?nchen
pp. 123
Kiyoshi Kiyokawa , Osaka University, Japan
Mark Billinghurst , Human Interface Technology Laboratory New Zealand
Bruce Campbell , University of Washington
Eric Woods , Human Interface Technology Laboratory New Zealand
pp. 133
Yohan Baillot , ITT Advanced Engineering & Sciences
Simon J. Julier , ITT Advanced Engineering & Sciences
Dennis Brown , Naval Research Laboratory
Mark A. Livingston , Naval Research Laboratory
pp. 142
Arthur Tang , Michigan State University, East Lansing
Ji Zhou , Michigan State University, East Lansing
Charles Owen , Michigan State University, East Lansing
pp. 161
Takayoshi Koyama , University of Tsukuba
Itaru Kitahara , ATR Institute International
Yuichi Ohta , University of Tsukuba
pp. 178
Naho Inamoto , Keio University, Yokohama, Japan
Hideo Saito , Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)
pp. 188
Oliver Bimber , Bauhaus University
Anselm Grundh?fer , Bauhaus University
Gordon Wetzstein , Bauhaus University
Sebastian Kn?del , Bauhaus University
pp. 198
Kusuma Agusanto , Nanyang Technological University
Li Li , Nanyang Technological University
Zhu Chuangui , Nanyang Technological University
Ng Wan Sing , Nanyang Technological University
pp. 208
Siavash Zokai , Siemens Corporate Research
Julien Esteve , Siemens Corporate Research
Yakup Genc , Siemens Corporate Research
Nassir Navab , Siemens Corporate Research
pp. 217
Nobuyuki Matsushita , Sony Computer Science Laboratories, Inc.; Keio University
Daisuke Hihara , Sony-Kihara Research Center, Inc.
Teruyuki Ushiro , Sony-Kihara Research Center, Inc.
Shinichi Yoshimura , Sony-Kihara Research Center, Inc.
Jun Rekimoto , Sony Computer Science Laboratories, Inc.
Yoshikazu Yamamoto , Keio University
pp. 227
J? Zauner , Upper Austria University of Applied Sciences (MTD)
Michael Haller , Upper Austria University of Applied Sciences (MTD)
Alexander Brandl , Upper Austria University of Applied Sciences (MTD)
Werner Hartmann , Institute for Applied Knowledge Processing (FAW)
pp. 237
Wayne Piekarski , University of South Australia
Bruce H. Thomas , University of South Australia
pp. 247
Posters
D. Beier , Technische Universit?t Ilmenau
R. Billert , Technische Universit?t Ilmenau
B. Br?derlin , Technische Universit?t Ilmenau
D. Stichling , Universit?t Paderborn
B. Kleinjohann , Universit?t Paderborn
pp. 258
Takashi Okuma , Columbia University; National Institute of Advanced Industrial Science and Technology
Takeshi Kurata , University of Washington; National Institute of Advanced Industrial Science and Technology
Katsuhiko Sakaue , National Institute of Advanced Industrial Science and Technology
pp. 260
Takeshi Kawano , Kobe University, Japan
Yoshihiro Ban , Kobe University, Japan
Kuniaki Uehara , Kobe University, Japan
pp. 262
Yong Liu , Aalborg University
Moritz St?rring , Aalborg University
Thomas B. Moeslund , Aalborg University
Claus B. Madsen , Aalborg University
Erik Granum , Aalborg University
pp. 264
Wayne Piekarski , University of South Australia
Ben Avery , University of South Australia
Bruce H. Thomas , University of South Australia
Pierre Malbezin , University of South Australia
pp. 266
Daniel Roetenberg , University of Twente, The Netherlands
Henk Luinge , University of Twente, The Netherlands
Peter Veltink , University of Twente, The Netherlands
pp. 268
Sebastian Vogt , Siemens Corporate Research, NJ, USA
Ali Khamene , Siemens Corporate Research, NJ, USA
Frank Sauer , Siemens Corporate Research, NJ, USA
Andreas Keil , Siemens Corporate Research, NJ, USA
Heinrich Niemann , Universit?t Erlangen-N?rnberg, Erlangen, Germany
pp. 270
R.J. Lapeer , University of East Anglia, UK
A.C. Tan , University College London, UK
A. Linney , University College London, UK
G. Alusi , St. Bartholomews Hospital, London, UK
pp. 272
Thomas Reicher , Technische Universit?t M?nchen, Germany
Asa MacWilliams , Technische Universit?t M?nchen, Germany
Bernd Br? , Technische Universit?t M?nchen, Germany
Gudrun Klinker , Technische Universit?t M?nchen, Germany
pp. 274
Wouter Pasman , Delft University of Technology
Charles Woodward , Technical Research Centre of Finland
pp. 276
Shinichiro Hirooka , Keio University, Yokohama, Japan
Hideo Saito , Keio University, Yokohama, Japan; Japan Science and Technology Corporation(JST)
pp. 278
C?line Loscos , University College London
Hila Ritter Widenfeld , University College London
Maria Roussou , University College London; Foundation of Hellenic World
Alexandre Meyer , University College London
Franco Tecchia , University College London
George Drettakis , REVES/INRIA Sophia-Antipolis
Emmanuel Gallo , REVES/INRIA Sophia-Antipolis
Alex Reche Martinez , REVES/INRIA Sophia-Antipolis
Nicolas Tsingos , REVES/INRIA Sophia-Antipolis
Yiorgos Chrysanthou , University of Cyprus
Luc Robert , RealViz
pp. 282
Toshikazu Ohshima , MR Systems Laboratory, Canon Inc.
Tsuyoshi Kuroki , MR Systems Laboratory, Canon Inc.
Hiroyuki Yamamoto , MR Systems Laboratory, Canon Inc.
Hideyuki Tamura , MR Systems Laboratory, Canon Inc.
pp. 284
Tomoyasu Nakatsuru , Kyoto University, Japan
Yasuyoshi Yokokohji , Kyoto University, Japan
Daisuke Eto , Kyoto University, Japan
Tsuneo Yoshikawa , Kyoto University, Japan
pp. 286
Hiroyuki Maeda , The University of Tokyo
Kazuhiko Hirose , The University of Tokyo
Jun Yamashita , The University of Tokyo
Koichi Hirota , The University of Tokyo
Michitaka Hirose , The University of Tokyo
pp. 288
H. Regenbrecht , DaimlerChrysler AG
C. Ott , igroup.org
M. Wagner , shared-reality.com
T. Lum , DaimlerChrysler AG
P. Kohler , DaimlerChrysler AG
W. Wilke , DaimlerChrysler AG
E. Mueller , DaimlerChrysler AG
pp. 290
Sei Ikeda , Nara Institute of Science and Technology
Tomokazu Sato , Nara Institute of Science and Technology
Masayuki Kanbara , Nara Institute of Science and Technology
Naokazu Yokoya , Nara Institute of Science and Technology
pp. 292
Adrian Woolard , BBC Creative R&D, UK
Vali Lalioti , BBC Research & Development, UK
Nicholas Hedley , ARToolworks Inc, USA
Neil Carrigan , BBC Creative R&D, UK
Matt Hammond , BBC Research & Development, UK
Joey Julien , BBC Creative R&D, UK
pp. 294
V. Sundareswaran , Rockwell Scientific Company, Thousand Oaks, CA
Kenneth Wang , Rockwell Scientific Company, Thousand Oaks, CA
Steven Chen , Rockwell Scientific Company, Thousand Oaks, CA
Reinhold Behringer , Rockwell Scientific Company, Thousand Oaks, CA
Joshua McGee , Rockwell Scientific Company, Thousand Oaks, CA
Clement Tam , Rockwell Scientific Company, Thousand Oaks, CA
Pavel Zahorik , University of Wisconsin, Madison, WI
pp. 296
Stephen DiVerdi , University of California, Santa Barbara, CA
Daniel Nurmi , University of California, Santa Barbara, CA
Tobias H?llerer , University of California, Santa Barbara, CA
pp. 298
Raphael Grasset , INRIA Rhone-Alpes
Jean-Dominique Gascuel , INRIA Rhone-Alpes
Dieter Schmalstieg , Vienna University of Technology
pp. 302
Marc Cavazza , University of Teesside, Middlesbrough, UK
Olivier Martin , Universit? catholique de Louvain, Belgium
Fred Charles , University of Teesside, Middlesbrough, UK
Xavier Marichal , Alterface, Belgium
Steven J. Mead , University of Teesside, Middlesbrough, UK
pp. 304
Hiroshi Kato , The University of Tokyo
Takeshi Naemura , The University of Tokyo
Hiroshi Harashima , The University of Tokyo
pp. 306
Demonstrations
D. Aiteanu , University of Bremen, Germany
B. Hillers , University of Bremen, Germany
A Gr?ser , University of Bremen, Germany
pp. 309
Hans Kr? , Physikalisches Institut der Universit?t Bonn, Germany
Lasse Klingbeil , Physikalisches Institut der Universit?t Bonn, Germany
Edgar Kraft , Physikalisches Institut der Universit?t Bonn, Germany
Rene Hamburger , Physikalisches Institut der Universit?t Bonn, Germany
pp. 311
Hesam Najafi , Technische Universit?t M?nchen, Germany
Gudrun Klinker , Technische Universit?t M?nchen, Germany
pp. 313
Andrew J. Davison , University of Oxford
Walterio W. Mayol , University of Oxford
David W. Murray , University of Oxford
pp. 315
Wayne Piekarski , University of South Australia
Bruce H. Thomas , University of South Australia
pp. 317
T. Pettersen , Corporate Research Center, Norway
J. Pretlove , Corporate Research Center, Norway
C. Skourup , Corporate Research Center, Norway
T. Engedal , Corporate Research Center, Norway
T. L?kstad , Corporate Research Center, Norway
pp. 319
Marissa D?az , ITESM - CEM Department of Computer Science
Eduardo Hern?ndez , ITESM - CEM Department of Computer Science
Leonardo Escalona , ITESM - CEM Department of Computer Science
Isaac Rudomin , ITESM - CEM Department of Computer Science
Daniel Rivera , ITESM - CEM Department of Computer Science
pp. 325
Kazue Kobayashi , NTT Comware Co.
Mitsunori Hirano , NTT Comware Co.
Atsunobu Narita , NTT Comware Co.
Hiroshi Ishii , MIT Media Lab
pp. 327
Blair MacIntyre , Georgia Institute of Technology, Atlanta, GA
Maribeth Gandy , Georgia Institute of Technology, Atlanta, GA
Jay Bolter , Georgia Institute of Technology, Atlanta, GA
Steven Dow , Georgia Institute of Technology, Atlanta, GA
Brendan Hannigan , Georgia Institute of Technology, Atlanta, GA
pp. 329
Gerhard Reitmayr , Vienna University of Technology
Mark Billinghurst , University of Canterbury
Dieter Schmalstieg , Vienna University of Technology
pp. 331
Istv? Barakonyi , Vienna University of Technology
Tamer Fahmy , Vienna University of Technology
Dieter Schmalstieg , Vienna University of Technology
Karin Kosina , Systems in Motion
pp. 333
Daniel Wagner , Vienna University of Technology, Favoritenstr
Istvan Barakonyi , Vienna University of Technology, Favoritenstr
pp. 335
Thomas Pintaric , Vienna University of Technology
pp. 337
Rodney Berry , ATR Media Information Science Laboratories
Mao Makino , ATR Media Information Science Laboratories
Naoto Hikawa , ATR Media Information Science Laboratories
Masumi Suzuki , ATR Media Information Science Laboratories
pp. 338
Hirokazu Kato , Osaka University
Keihachiro Tachibana , Hiroshima City University
Masaaki Tanabe , Knack Images Production Center
Takeaki Nakajima , Hiroshima City University
Yumiko Fukuda , Hiroshima Institute of Technology
pp. 340
Masakatsu Kourogi , National Institute of Advanced Industrial Science and Technology (AIST)
Takeshi Kuratta , National Institute of Advanced Industrial Science and Technology (AIST); University of Washington
pp. 342
Ryuhei Tenmoku , Nara Institute of Science and Technology, Japan
Masayuki Kanbara , Nara Institute of Science and Technology, Japan
Naokazu Yokoya , Nara Institute of Science and Technology, Japan
pp. 344
Vincent Lepetit , Swiss Federal Institute of Technology
Luca Vacchetti , Swiss Federal Institute of Technology
Daniel Thalmann , Swiss Federal Institute of Technology
Pascal Fua , Swiss Federal Institute of Technology
pp. 346
Masahiko Inami , The University of Electro-Communications
Naoki Kawakami , The University of Tokyo
Susumu Tachi , The University of Tokyo
pp. 348
Eiichi Hosoya , NTT Microsystem Integration Laboratories
Miki Kitabata , NTT Microsystem Integration Laboratories
Hidenori Sato , NTT Microsystem Integration Laboratories
Ikuo Harada , NTT Microsystem Integration Laboratories
Hisao Nojima , NTT Microsystem Integration Laboratories
Fumiharu Morisawa , NTT Microsystem Integration Laboratories
Shinichiro Mutoh , NTT Microsystem Integration Laboratories
Akira Onozawa , NTT Microsystem Integration Laboratories
pp. 350
Hiroshi Kato , The University of Tokyo
Takeshi Naemura , The University of Tokyo
Hiroshi Harashima , The University of Tokyo
pp. 352
Christopher B. Stapleton , Univ. of Central Florida
Charles E. Hughes , Univ. of Central Florida
J. Michael Moshell , Univ. of Central Florida
pp. 354
Masayuki Takemura , University of Tsukuba
Shungo Haraguchi , University of Tsukuba
pp. 356
Yasuhiro Okuno , Canon Inc.
Hiroyuki Kakuta , Canon Inc.
Tomohiko Takayama , Canon Inc.
Kazuhiro Asai , Nagoya Designer Gakuin College
pp. 358
Author Index (PDF)
pp. 360
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