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International Symposium on Mixed and Augmented Reality (ISMAR'02)
Darmstadt, Germany
September 30-October 01
ISBN: 0-7695-1781-1
Table of Contents
Introduction
Invited Speaker
Session 1: Environmental Sensing
Simon Prince, National University of Singapore
Adrian David Cheok, National University of Singapore
Farzam Farbiz, National University of Singapore
Todd Williamson, Zaxel Systems
Nik Johnson, Zaxel Systems
Mark Billinghurst, University of Washington
Hirokazu Kato, Hiroshima City University
pp. 7
Gaile Gordon, Tyzx, Inc.
Mark Billinghurst, University of Washington
Melanie Bell, ChevronTexaco
John Woodfill, Tyzx, Inc.
Bill Kowalik, ChevronTexaco
Alex Erendi, ChevronTexaco
Janet Tilander, ChevronTexaco
pp. 14
Session 2: Large Environment Tracking
Simon Gibson, University of Manchester
Jon Cook, University of Manchester
Toby Howard, University of Manchester
Roger Hubbold, University of Manchester
Dan Oram, Canon Research Centre Europe Ltd.
pp. 37
Jong Weon Lee, University of Southern California
Suya You, University of Southern California
Ulrich Neumann, University of Southern California
pp. 47
Session 3a: Applications
Adrian David Cheok, National University of Singapore
Wang Weihua, National University of Singapore
Xubo Yang, National University of Singapore
Simon Prince, National University of Singapore
Fong Siew Wan, National University of Singapore
Mark Billinghurst, University of Washington
Hirokazu Kato, Hiroshima City University
pp. 59
Michael Figl, University of Vienna
Wolfgang Birkfellner, University of Vienna
Christopher Ede, University of Vienna
Johann Hummel, University of Vienna
Rudolf Hanel, University of Vienna
Franz Watzinger, University of Vienna
Felix Wanschitz, University of Vienna
Rolf Ewers, University of Vienna
Helmar Bergmann, University of Vienna
pp. 69
Gudrun Klinker, Technische Universität München
Allen H. Dutoit, Technische Universität München
Martin Bauer, Technische Universität München
pp. 76
Session 3b: Marker-Based Tracking
Xiang Zhang, Siemens Corporate Research
Stephan Fronz, Siemens Corporate Research
Nassir Navab, Siemens Corporate Research
pp. 97
Gregory Baratoff, DaimlerChrysler Research & Technology
Alexander Neubeck, DaimlerChrysler Research & Technology
Holger Regenbrecht, DaimlerChrysler Research & Technology
pp. 107
Shahzad Malik, University of Toronto
Chris McDonald, Carleton University
Gerhard Roth, National Research Council - Canada
pp. 117
Sebastian Vogt, Siemens Corporate Research
Ali Khamene, Siemens Corporate Research
Frank Sauer, Siemens Corporate Research
Heinrich Niemann, Universität Erlangen-Nürnberg
pp. 127
Session 4a: Collaboration and Tangible Interfaces
K. Kiyokawa, Communications Research Laboratory
M. Billinghurst, University of Washington
S. E. Hayes, University of Washington
A. Gupta, University of Washington
Y. Sannohe, University of Washington
H. Kato, Hiroshima City University
pp. 139
Morten Fjeld, Swiss Federal Institute of Technology
Sissel Guttormsen Schär, Swiss Federal Institute of Technology
Domenico Signorello, Swiss Federal Institute of Technology
Helmut Krueger, Swiss Federal Institute of Technology
pp. 157
Session 4b: Calibration and Projection
Yakup Genc, Siemens Corporate Research
Mihran Tuceryan, Indiana University Purdue University
Nassir Navab, Siemens Corporate Research
pp. 169
Hong Hua, University of Illinois at Urbana-Champaign
Chunyu Gao, University of Illinois at Urbana-Champaign
Narendra Ahuja, University of Illinois at Urbana-Champaign
pp. 176
Invited Paper
Hiroshi Ishii, Massachusetts Institute of Technology
Eran Ben-Joseph, Massachusetts Institute of Technology
John Underkoffler, Massachusetts Institute of Technology
Luke Yeung, Massachusetts Institute of Technology
Dan Chak, Massachusetts Institute of Technology
Zahra Kanji, Massachusetts Institute of Technology
Ben Piper, Massachusetts Institute of Technology
pp. 203
Session 5: Visualization
Session 6: Authoring and Platforms
Posters and Demo Session
Bernd Schwald, Zentrum für Graphische Datenverarbeitung e.V.
Helmut Seibert, Zentrum für Graphische Datenverarbeitung e.V.
Tanja Weller, Zentrum für Graphische Datenverarbeitung e.V.
pp. 261
Arthur Tang, Michigan State University
Charles Owen, Michigan State University
Frank Biocca, Michigan State University
Weimin Mou, Michigan State University
pp. 265
Felix Tang, University of Toronto
Chris Aimone, University of Toronto
James Fung, University of Toronto
Andrej Marjan, University of Toronto
Steve Mann, University of Toronto
pp. 267
Wayne Piekarski, University of South Australia
Bruce H. Thomas, University of South Australia
pp. 269
Adrian David Cheok, National University of Singapore
Neo Weng Chuen Edmund, National University of Singapore
Ang Wee Eng, National University of Singapore
pp. 273
Reinhold Behringer, Rockwell Scientific Company
Jun Park, Rockwell Scientific Company
Venkataraman Sundareswaran, Rockwell Scientific Company
pp. 277
Masayuki Kanbara, Nara Institute of Science and Technology
Naokazu Yokoya, Nara Institute of Science and Technology
pp. 279
C. Geiger, Hochschule Harz
V. Paelke, University of Paderborn C-LAB
C. Reimann, University of Paderborn C-LAB
W. Rosenbach, Siemens SBS C-LAB
J. Stoecklein, Siemens SBS C-LAB
pp. 281
Session 7: Markerless Tracking
Y. Genc, Siemens Corporate Research
S. Riedel, Siemens Corporate Research
F. Souvannavong, Siemens Corporate Research
C. Akinlar, Siemens Corporate Research
N. Navab, Siemens Corporate Research
pp. 295
Kar Wee Chia, National University of Singapore
Adrian David Cheok, National University of Singapore
Simon J.D. Prince, National University of Singapore
pp. 305
Color Appendix
Simon Prince, National University of Singapore
Adrian David Cheok, National University of Singapore
Farzam Farbiz, National University of Singapore
Todd Williamson, Zaxel Systems
Nik Johnson, Zaxel Systems
Mark Billinghurst, University of Washington
Hirokazu Kato, Hiroshima City University
pp. 317
Adrian David Cheok, National University of Singapore
Wang Weihua, National University of Singapore
Xubo Yang, National University of Singapore
Simon Prince, National University of Singapore
Fong Siew Wan, National University of Singapore
Mark Billinghurst, University of Washington
Hirokazu Kato, Hiroshima City University
pp. 317
Morten Fjeld, Swiss Federal Institute of Technology
Sissel Guttormsen Schär, Swiss Federal Institute of Technology
Domenico Signorello, Swiss Federal Institute of Technology
Helmut Krueger, Swiss Federal Institute of Technology
pp. 318
Wayne Piekarski, University of South Australia
Bruce H. Thomas, University of South Australia
pp. 321
Reinhold Behringer, Rockwell Scientific Company
Jun Park, Rockwell Scientific Company
Venkataraman Sundareswaran, Rockwell Scientific Company
pp. 322
Author Index
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