- I
- ISESS
- 1995
- 2nd IEEE Software Engineering Standards Symposium
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2nd IEEE Software Engineering Standards Symposium Montreal, Quebec, Canada August 21-August 25 ISBN: 0-8186-7137-8 Table of Contents
 | Keynote Speaker: Takis Katsoulakos, European Software Engineering Institute and Lloyd' s Register: Panelists: J. Cote, D. Rilling, L.L. Tripp, D. Kiang, J. Braxendale, and B. Young |
 | Session: Industry-Standards for High Integrity Systems: Chair: J. Dennis Lawrence, Lawrence Livermore National Labs, USA |
J. Brazendale, Health & Safety Exec., UK, Technol. & Health Services Div. pp. 8
E. Leret, Res. & Dev. Div., Electr. de France, Chatou, France pp. 18
 | Panel: Panel Chair: J. Dennis Lawrence: Panelists: P.K. Joannou, N. Leveson, and R. Milovanovic |
D.S. Lange, RDT&E Div., Navel Command Control & Ocean Surveillance Center, San Diego, CA, USA pp. 26
M. Norris, British Telecom Res. Labs., Ipswich, UK pp. 35
 | Session:Evaluation, Barriers and Recommendaions for Software Product Quality: Chair: Andrew J. Chruscicki, Rome Laboratory, USA |
R. Gulezian, Dept. of Quantitative Method, Drexel Univ., Philadelphia, PA, USA pp. 52
G.E. Murine, METRIQS International, Rome Lab., Griffin AFB, NY, USA pp. 61
 | Panel: Panel Chair: A. J. Chruscicki: Panelists: R. Troy, J. Marciniak, and M. Azuma |
 | Session: Strategic Directions: Chair: Leonard L. Tripp, Boeing Commercial Airplane, USA |
K.E. Emam, Centre de Recherche Inf. de Montreal, Que., Canada pp. 84
D. Kiang, Bell-Northern Res., Ottawa, Ont., Canada pp. 98
L.L. Tripp, Boeing Commercial Airplanes, Seattle, WA, USA
P. Voldner, Boeing Commercial Airplanes, Seattle, WA, USA pp. 105
N.N.Q. Thuy, Dev. Div., Electr. de France, Chatou, France pp. 117
 | Panel: Panel Chair: L.L. Trip: Panelists: D.L-F. Pau, P. Voldner, J. Brazendale, and D. Kiang |
 | Session: Regulators-Standards for High Integrity Systems: Chair: Dolores Wallace, National Institute for Standards and Technology (NIST), |
F. Mazzanti, Istituto di Elaborazione dell'Inf., CNR, Pisa, Italy pp. 134
J.M. Voas, Reliable Software Technol. Corp., Sterling, VA, USA
K.W. Miller, Reliable Software Technol. Corp., Sterling, VA, USA pp. 139
 | Panel :Panel Chair: D. Wallace: Panelists: R.P. Taylor, J. McDermid, D. Hermann,M. De Walt, and M. Waterman |
J. Boegh, DELTA Danish Electron. Light & Acoust., Horsholm, Denmark pp. 170
A.N. Tsukumo, Centre Tecnologico para Inf., Univ. Estadual de Campinas, Sao Paulo, Brazil
C.R. Capovilla, Centre Tecnologico para Inf., Univ. Estadual de Campinas, Sao Paulo, Brazil
C.M. Rego, Centre Tecnologico para Inf., Univ. Estadual de Campinas, Sao Paulo, Brazil
M. Jino, Centre Tecnologico para Inf., Univ. Estadual de Campinas, Sao Paulo, Brazil
J.C. Maldonado, Centre Tecnologico para Inf., Univ. Estadual de Campinas, Sao Paulo, Brazil pp. 184
T. Tran, Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
J.S. Sherif, Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA pp. 191
 | Session: Reliability and Testing:Chair: Peter T. Poon, Jet Propulsion Laboratory, California Institue of Technology, USA |
C. Trammell, Dept. of Comput. Sci., Tennessee Univ., Knoxville, TN, USA pp. 208
J.F. Leathrum, Software Stand. & Technol. Lab., Clemson Univ., SC, USA
K.A. Liburdy, Software Stand. & Technol. Lab., Clemson Univ., SC, USA pp. 219
S. Minami, NTT Software Corp., Kanagawa, Japan pp. 226
H. Hecht, SoHaR Inc., Beverly Hills, CA, USA pp. 235
 | Panel: Panel Chair: G.J. Knafl: Panelists: N.F. Schneidewind, J.C. Munson, and W. W. Everett |
 | Session: Harmonization: Chair: Peter Voldner, Bell Sygma, Canada |
B.L. Meek, Comput. Centre, King's Coll., London, UK pp. 250
T. Natsume, Tsukuba Coll. of Technol., Ibaraki, Japan pp. 257
R. Singh, Space & Naval Warfare Syst. Command, US Dept. of the Navy, USA pp. 262
A. Abran, Quebec Univ., Montreal, Que., Canada pp. 268
 | Session: Standards- Pot Pourri: Chair: Rajko Milovanovic, British Telecom, UK |
S. Rahhal, Bell Sygma Telecom Solutions, Montreal, Que., Canada
N.H. Madhavji, Bell Sygma Telecom Solutions, Montreal, Que., Canada pp. 278 Usage of this product signifies your acceptance of the Terms of Use.
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