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10th IEEE Symposium on Computers and Communications (ISCC'05)
Empirical Model Generations of Microwave Devices Exploiting Linear Regression Models
Cartagena, Murcia, Spain
June 27-June 30
ISBN: 0-7695-2373-0
| ASCII Text | x | ||
| G. Dom?nech, J. Hinojosa, J. Martinez, J. Garrig?, "Empirical Model Generations of Microwave Devices Exploiting Linear Regression Models," 2012 IEEE Symposium on Computers and Communications (ISCC), pp. 257-262, 10th IEEE Symposium on Computers and Communications (ISCC'05), 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/ISCC.2005.61, author = {G. Dom?nech and J. Hinojosa and J. Martinez and J. Garrig?}, title = {Empirical Model Generations of Microwave Devices Exploiting Linear Regression Models}, journal ={2012 IEEE Symposium on Computers and Communications (ISCC)}, volume = {0}, year = {2005}, issn = {1530-1346}, pages = {257-262}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISCC.2005.61}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE Symposium on Computers and Communications (ISCC) TI - Empirical Model Generations of Microwave Devices Exploiting Linear Regression Models SN - 1530-1346 SP257 EP262 A1 - G. Dom?nech, A1 - J. Hinojosa, A1 - J. Martinez, A1 - J. Garrig?, PY - 2005 KW - null VL - 0 JA - 2012 IEEE Symposium on Computers and Communications (ISCC) ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISCC.2005.61
In this paper, we propose two empirical model generation techniques of microwave devices for a large range of geometric and material parameters opportunely chosen. The empirical models are based on an initial inaccurate empirical model and linear-regression models. The linear-regression models compensate the error between the initial inaccurate empirical model and an electromagnetic simulator or measurement data. These techniques provide accurate empirical models computationally very efficient with respect to any electromagnetic technique. Moreover, these simple models could be easily integrated in a toolbox of any commercially available computed-aided design (CAD) tool for RF/microwave circuits. The two techniques have been successfully tested for two microwave tunable phase shifters.
Citation:
G. Dom?nech, J. Hinojosa, J. Martinez, J. Garrig?, "Empirical Model Generations of Microwave Devices Exploiting Linear Regression Models," iscc, pp.257-262, 10th IEEE Symposium on Computers and Communications (ISCC'05), 2005
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