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On-Line Testing Workshop, IEEE International (2002)
Isle of Bendor, France
July 8, 2002 to July 10, 2002
ISBN: 0-7695-1641-6
TABLE OF CONTENTS
Introduction
pp. 271
Session 1: Hardware Fault Tolerance
P. K. Lala , University of Arkansas
pp. 3
V. E. S. van Dijk , Philips Research Laboratories
R. P. Kleihorst , Philips Research Laboratories
A. H. Nieuwland , Philips Research Laboratories
D. Rossi , University of Bologna
pp. 8
A. Matrosova , Tomsk State University
V. Andreeva , Tomsk State University
Yu. Sedov , Tomsk State University
pp. 13
Session 2: Hardware-Software Design and Validation of Fault Tolerant Systems
Petr Grillinger , University of West Bohemia
Astrit Ademaj , Vienna University of Technology
Jan Hlavicka , Czech Technical University
pp. 21
S. Chiusano , Politechnico di Torino
S. DiI Carlo , Politechnico di Torino
P. Prinetto , Politechnico di Torino
pp. 26
L. Pomante , Politecnico di Milano
F. Salice , Politecnico di Milano
D. Sciuto , Politecnico di Milano
pp. 32
Session 3: Self Checking Circuits
E. S. Sogomonyan , University of Potsdam
V. Ocheretnij , University of Potsdam
D. Marienfeld , University of Potsdam
pp. 39
I. Levin , Tel-Aviv University
V. Sinelnikov , Tel-Aviv University
M. Karpovsky , Boston University
S. Ostanin , Tel-Aviv University
pp. 44
Session 4: Concurrent Error Detection I
F. Monteiro , LICM/CLOES, SUPELEC & University of Metz
A. Dandache , LICM/CLOES, SUPELEC & University of Metz
B. Lepley , LICM/CLOES, SUPELEC & University of Metz
pp. 51
A. Arapoyanni , University of Athens
Y. Tsiatouhas , ISD S.A.
Th. Haniotakis , Southern Illinois University
pp. 56
Session 5: Concurrent Error Detection II
M. Pflanz , IBM Deutschland Entwicklung GmbH
K. Walther , Brandenburg Technical University of Cottbus
C. Galke , Brandenburg Technical University of Cottbus
H. T. Vierhaus , Brandenburg Technical University of Cottbus
pp. 69
Feng Gao , University of Michigan
John P. Hayes , University of Michigan
pp. 74
L. Carro , Universidade Federal do Rio Grande do Sul
M. Negreiros , Universidade Federal do Rio Grande do Sul
pp. 79
Session 6: Analog and Mixed Signal Testing and Reliability
Luigi Carro , Universidade Federal do Rio Grande do Sul
Fernando Paixão Cortes , Universidade Federal do Rio Grande do Sul
Altamiro Suzim , Universidade Federal do Rio Grande do Sul
pp. null
J. Ginard , Universitat Illes Balears
E. Isern , Universitat Illes Balears
M. Roca , Universitat Illes Balears
J. Segura , Universitat Illes Balears
E. García , Universitat Illes Balears
pp. 94
D. Muñoz , Universitat Polit?cnica de Catalunya
L. Balado , Universitat Polit?cnica de Catalunya
J. Figueras , Universitat Polit?cnica de Catalunya
pp. 99
Session 7: Fault Injection Techniques and Results
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
M. Violante , Politecnico di Torino
pp. 112
F. Kaddour , TIMA laboratory
A. Leandri , University of Rome "Tor Vergata"
M. Ottavi , University of Rome "Tor Vergata"
G. C. Cardarilli , University of Rome "Tor Vergata"
R. Velazco , TIMA laboratory
pp. 117
Session 8: BIST Techniques I
Miron Abramovici , Agere Systems
Charles Stroud , University of North Carolina at Charlotte
pp. 131
N. Axelos , University of Huddersfield
J. Watson , University of Huddersfield
D. Taylor , University of Huddersfield
A. Platts , University of Huddersfield
pp. 135
Sudhakar M. Reddy , University of Iowa
Nadir Z. Basturkmen , University of Iowa
pp. 140
Session 9: BIST Techniques II
Stop & Go BIST (Abstract)
Ilia Polian , Albert-Ludwigs-University
pp. 147
D. Nikolos , University of Patras and Computer Technology Institute
G. Dimitrakopoulos , University of Patras
pp. 152
Session 10: Testing Issues
Session 11: Posters
M. Pflanz , IBM Deutschland Entwicklung GmbH
C. Galke , Brandenburg University of Technology Cottbus
pp. 178
Kazuharu Yamato , Hyogo University
Teijiro Isokawa , Himeji Institute of Technology
Naotake Kamiura , Himeji Institute of Technology
pp. 180
Adam Kristof , Silesian University of Technology in Gliwice
pp. 183
Gaynor E. Taylor , Leeds Metropolitan University
John Webster , Leeds Metropolitan University
pp. 186
F. Vargas , Catholic University - PUCRS
D. Barros Jr. , Catholic University - PUCRS
pp. 187
Ari Virtanen , University of Jyv?skyl?
pp. 188
Martin Keim , Mentor Graphics Corp.
Ilia Polian , Albert-Ludwigs-University
Bernd Becker , Albert-Ludwigs-University
pp. 189
B. Alorda , Université de les Illes Balears
A. Ivanov , University of British Columbia
J. Segura , Université de les Illes Balears
pp. 192
Isabel González , Alcatel Espacio
Luis Entrena , Universidad Carlos III de Madrid
Celia López , Universidad Carlos III de Madrid
Fulvio Corno , Polit?cnico di Torino
Luis Berrojo , Alcatel Espacio
Giovanni Squillero , Polit?cnico di Torino
pp. 193
F. Lima , Federal University of Rio Grande do Sul
L. Carro , Federal University of Rio Grande do Sul
R. Velazco , TIMA Laboratory
R. Reis , Federal University of Rio Grande do Sul
pp. 194
Session 12: Memory BIST Analysis and Application
A. Fudoli , STMicroelectronics
V. Tancorre , STMicroelectronics
F. Corno , Politecnico di Torino
D. Appello , STMicroelectronics
M. Sonza Reorda , Politecnico di Torino
pp. 206
F. Karimi , LTX Corporation
F. Lombardi , Northeastern University
pp. 211
Session 13: Memory ECC and Soft Errors
D. Rossi , University of Bologna
B. Riccò , University of Bologna
pp. 221
Patrick Delaunay , Atmel Corporation
Olivier Husson , Atmel Corporation
pp. 226
Session 14: High Reliability in Railway and Automotive Systems
D. Guillon , TECHNICATOME
B. Jacques , CSEE Transport
pp. 233
Cecilia Metra , University of Bologna
Luca Schiano , University of Bologna
pp. 243
Session 15: Embedded Memory Yield Enhancement
E. Rondey , Altis Semiconductor
Y. Tellier , Infineon Technologies
S. Borri , Infineon Technologies
pp. 251
Jin-Fu Li , National Tsing Hua University
Jen-Chieh Yeh , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 262
Author Index
Author Index (PDF)
pp. 269
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