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Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02)
Coding Scheme for Low Energy Consumption Fault-Tolerant Bus
Isle of Bendor, France
July 08-July 10
ISBN: 0-7695-1641-6
| ASCII Text | x | ||
| D. Rossi, V. E. S. van Dijk, R. P. Kleihorst, A. H. Nieuwland, C. Metra, "Coding Scheme for Low Energy Consumption Fault-Tolerant Bus," On-Line Testing Workshop, IEEE International, pp. 8, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/OLT.2002.1030176, author = {D. Rossi and V. E. S. van Dijk and R. P. Kleihorst and A. H. Nieuwland and C. Metra}, title = {Coding Scheme for Low Energy Consumption Fault-Tolerant Bus}, journal ={On-Line Testing Workshop, IEEE International}, volume = {0}, year = {2002}, isbn = {0-7695-1641-6}, pages = {8}, doi = {http://doi.ieeecomputersociety.org/10.1109/OLT.2002.1030176}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - On-Line Testing Workshop, IEEE International TI - Coding Scheme for Low Energy Consumption Fault-Tolerant Bus SN - 0-7695-1641-6 SP EP A1 - D. Rossi, A1 - V. E. S. van Dijk, A1 - R. P. Kleihorst, A1 - A. H. Nieuwland, A1 - C. Metra, PY - 2002 KW - null VL - 0 JA - On-Line Testing Workshop, IEEE International ER - | |||
We address the problem of devising the error correcting code which, if used to encode the information on a very deep submicron (VDSM) bus, allows us to achieve fault-tolerance with the minimal impact on bus power consumption and power-delay product. In particular, we first report the results of an analysis that we performed on power dissipation in VDSM fault-tolerant busses using Hamming single error correcting codes. We show that no power saving is possible by choosing between different optimal Hamming codes with the same redundancy. We then propose a new coding scheme which provides a reduction of the energy consumption and power-delay product of over the 11.5% and 45%, respectively, with respect to the optimal (7,4) Hamming code, for a 0:13\mu m CMOS technology bus.
Citation:
D. Rossi, V. E. S. van Dijk, R. P. Kleihorst, A. H. Nieuwland, C. Metra, "Coding Scheme for Low Energy Consumption Fault-Tolerant Bus," ioltw, pp.8, Proceedings of The Eighth IEEE International On-Line Testing Workshop (IOLTW'02), 2002
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