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Seventh International On-Line Testing Workshop
Taormina, Italy
July 09-July 11
ISBN: 0-7695-1290-9
Table of Contents
Keynote
The Impact of On-Line Testing in Embedded Safety-Critical Systems
Wafer Level Reliability
Session 1: Dependability Evaluation - Moderator: Jacob Abraham, Univ. Texas at Austin - Coordinator: Diego Marino, Alstom Transport
Alfredo Benso, Politecnico di Torino
Stefano Di Carlo, Politecnico di Torino
Giorgio Di Natale, Politecnico di Torino
Luca Tagliaferri, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
pp. 0003
P. Civera, Politecnico di Torino
L. Macchiarulo, Politecnico di Torino
M. Rebaudengo, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
M. Violante, Politecnico di Torino
pp. 0009
Joakim Aidemark, Chalmers University of Technology
Peter Folkesson, Chalmers University of Technology
Johan Karlsson, Chalmers University of Technology
pp. 0014
P. Gawkowski, Warsaw University of Technology
J. Sosnowski, Warsaw University of Technology
pp. 0021
Session 2: On-Line Testing for Reconfigurable Systems - Moderator: Renato Stefanelli, Politechnico di Milano - Coordinator: TBD
Miron Abramovici, Agere Systems
Charles Stroud, University of North Carolina at Charlotte
Matthew Lashinsky, University of North Carolina at Charlotte
Jeremy Nall, University of North Carolina at Charlotte
John Emmert, University of North Carolina at Charlotte
pp. 0027
Session 3: On-Line Testable and Fault Tolerable Circuits and Systems - Moderator: C.A. Papchristou, Case Western Reserve Univ. - Coordinator: Greg Tollefson, INTEL
Luis Entrena, Universidad Carlos III de Madrid
Celia López, Universidad Carlos III de Madrid
Emilio Olías, Universidad Carlos III de Madrid
Enrique San Millán, Universidad Carlos III de Madrid
José A. Espejo, Universidad Carlos III de Madrid
pp. 0043
Luis Entrena, Universidad Carlos III de Madrid
Celia López, Universidad Carlos III de Madrid
Emilio Olías, Universidad Carlos III de Madrid
pp. 0048
Monica Alderighi, Consiglio Nazionale delle Ricerche
Sergio D'Angelo, Consiglio Nazionale delle Ricerche
Giacomo R. Sechi, Consiglio Nazionale delle Ricerche
Cecilia Metra, Universita' di Bologna
pp. 0054
Panel Session: Yield, Test & Reliability Issues for Very Deep Submicron Chips
null
Session 4: Logic Verification for On-Line Tested Systems - Moderator: Paolo Prinetto, Politecnico di Torino - Coordinator: TBD
Session 5: Built-In Self-Testing - Moderator: Davide Appello, STMicroelectronics - Coordinator: Kaushik Roy, Purdue Univ.
E. Kalligeros, University of Patras
X. Kavousianos, University of Patras
D. Bakalis, University of Patras
D. Nikolos, University of Patras
pp. 0080
Ondrej Novak, Technical University Liberec
Jiri Nosek, Technical University Liberec
pp. 0090
Session 6: Self-Checking, Concurrent Detection and Radiation Effects - Moderator: Antonio Imbruglia, STMicroelectronics - Coordinator: Hans Manhaeve, Q-Star Test
Y. Tsiatouhas, Integrated Systems Development S.A.
Th. Haniotakis, Southern Illinois University
D. Nikolos, University of Patras
C. Efstathiou, TEI of Athens
pp. 0106
D. Lewis, Universit? Bordeaux 1
H. Lapuyade, Universit? Bordeaux 1
Y. Deval, Universit? Bordeaux 1
Y. Maidon, Universit? Bordeaux 1
F. Darracq, Universit? Bordeaux 1
R. Briand, Universit? Bordeaux 1
P. Fouillat, Universit? Bordeaux 1
pp. 0111
Session 7: Automotive Applications & On-Line Monitoring of Temperature - Moderator: Ray Mercer, Texas A&M University - Coordinator: George Stamoulis, Technical University of Crete
Alberto Manzone, Centro Ricerche FIAT, Sistemi Elettronici
Alessandro Pincetti, Centro Ricerche FIAT, Sistemi Elettronici
Diego de COSTANTINI, Centro Ricerche FIAT, Sistemi Elettronici
pp. 0117
J.L. Merino, Universitat de Barcelona
S.A. Bota, Universitat de Barcelona
A. Herms, Universitat de Barcelona
J. Samitier, Universitat de Barcelona
E. Cabruja, Centre Nacional de Microelectr?nica
X. Jordà, Centre Nacional de Microelectr?nica
M. Vellvehí, Centre Nacional de Microelectr?nica
J. Bausells, Centre Nacional de Microelectr?nica
A. Ferré, Lear Automotive EEDS Spain
J. Bigorra, Lear Automotive EEDS Spain
pp. 0122
Ashish Syal, University of British Columbia
Victor Lee, University of British Columbia
André Ivanov, University of British Columbia
Josep Altet, University of British Columbia
pp. 0127
Session 8: Posters - Moderator: TBD - Coordinator: TBD
Session 9: Self Checking Circuits & Error Control Coding Implementation - Moderator: Ilya Levin, Tel Aviv University - Coordinator: Donatella Sciuto, Politecnico di Milano
Stanislaw J. Piestrak, Wroclaw University of Technology
Dimitris Bakalis, University of Patras and Computer Technology Institute
Xrysovalantis Kavousianos, University of Patras and Computer Technology Institute
pp. 0153
Session 10: Hardware & Software Techniques for Fault Tolerance - Adelio Salsano, Univ Roma II - Coordinator: Massimo Mastrocola, STMicroelectronics
C. Bolchini, Politecnico di Milano
L. Pomante, Politecnico di Milano
F. Salice, Politecnico di Milano
D. Sciuto, Politecnico di Milano
pp. 0165
Session 11: Applications - Moderator: Flavio Lorenzelli, STMicroelectronics - Coordinator: Franco Fummi, Univ. Verona
F. Vargas, Catholic University - PUCRS
R.D. Fagundes, Catholic University - PUCRS
D. Barros Jr., Catholic University - PUCRS
pp. 0187
Gaetano Palumbo, DEES-University of Catania
Giuseppe Introvaia, DEES-University of Catania
Vincenzo Mastrocola, STMicroelectronics
Promod Kumar, STMicroelectronics
Francesco Pipitone, STMicroelectronics
pp. 0192
Naotake Kamiura, Himeji Institute of Technology
Teijiro Isokawa, Himeji Institute of Technology
Nobuyuki Matsui, Himeji Institute of Technology
Kazuharu Yamato, Hyogo University
pp. 0202
Session 12: On-Line Testing of Digital, Analog and Mixed Signal Circuits - Moderator: Abhijit Chaterjee, Georgia Tech Univ. - Coordinator: Giuseppe Di Gregorio, STMicroelectronics
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