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  • 6th IEEE International On-Line Testing Workshop (IOLTW)
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6th IEEE International On-Line Testing Workshop (IOLTW)
Palma de Mallorca, Spain
July 03-July 05
ISBN: 0-7695-0646-1
Table of Contents
Keynote
Dependability Issues in the WWW
Session 1: Fault Tolerance: Moderator: T.M. Mak, Intel
K. Whisnant, Univeristy of Illinois at Urbana-Champaign
Z. Kalbarczyk, Univeristy of Illinois at Urbana-Champaign
R.K. Iyer, Univeristy of Illinois at Urbana-Champaign
pp. 3
Session 2: Fault Tolerance and On-Line Testing for Reconfigurable Systems: Moderator: TBD
Miron Abramovici, Bell Labs - Lucent Technologies
Charles Stroud, University of Kentucky
Brandon Skaggs, University of Kentucky
John Emmert, University of Kentucky
pp. 31
Session 3: Reliability Issues in Nanometer Technologies and Radiation Effects
J.A. Sainz, University of the Basque Country
R. Muñoz, University of the Basque Country
J.A. Maiz, University of the Basque Country
L.A. Aguado, University of the Basque Country
M. Roca, University of Balearic Islands
pp. 45
V. Pouget, Universit? Bordeaux 1
P. Fouillat, Universit? Bordeaux 1
D. Lewis, Universit? Bordeaux 1
H. Lapuyade, Universit? Bordeaux 1
L. Sarger, Universit? Bordeaux 1
F.M. Roche, Universit? Montpellier II
S. Duzellier, ONERA-DESP
R. Ecoffet, CNES
pp. 52
Session 4: Fault Injection:Regis Leveugle, TIMA Laboratory
B. Parrotta, Politecnico di Torino
M. Rebaudengo, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
M. Violante, Politecnico di Torino
pp. 61
D. Gil, Universidad Polit?cnica de Valencia
J. Gracia, Universidad Polit?cnica de Valencia
J.C. Baraza, Universidad Polit?cnica de Valencia
P.J. Gil, Universidad Polit?cnica de Valencia
pp. 73
Session 5: On-Line Current Monitoring: Moderator: Andre Ivanov, U. of Brit. Columbia
B. Alorda, University de les Illes Balears
I. de Paul, University de les Illes Balears
J. Segura, University de les Illes Balears
T. Miller, University de les Illes Balears
pp. 87
Martin Margala, University of Alberta
Srdjan Dragic, University of Alberta
Ahmed El-Abasiry, University of Alberta
Samuel Ekpe, University of Alberta
Viera Stopjaková, Slovak University of Technology
pp. 92
Y. Tsiatouhas, University of Patras and Integrated Systems Development S.A.
Th. Haniotakis, University of Patras
D. Nikolos, University of Patras
pp. 95
Y. Maidon, Universit? Bordeaux 1
Y. Deval, Universit? Bordeaux 1
J.B. Begueret, Universit? Bordeaux 1
pp. 100
Session 6: Concurrent Checking: Moderator: Bernd Straube, Fraunhofer IIS/EAS Dresden
Decomposition Approach to Designing FPGA-Based Self-Checking Control Units
Session 7: Built-In Self Testing: Moderator: Christian Dufaza, LIRMM
Ondrej Novak, Technical University Liberec
Jiri Nosek, Technical University Liberec
pp. 127
Session 8: Self Checking Circuits and Analog Approaches: Moderator: Parag K. Lala, U. Arkansas
M. Gössel, University of Potsdam
A. Dmitiriev, University of Potsdam
Vl. Saposhnikov, Railway Transportation State University
V. Saposhnikov, Railway Transportation State University
pp. 147
Session 9: Coding Theory and Applications: Moderator: Stanislaw Piestrak, T.U. of Wroclaw
Debaleena Das, University of Texas at Austin
Nur A. Touba, University of Texas at Austin
Markus Seuring, University of Potsdam
Michael Gössel, University of Potsdam
pp. 171
Session 10: Fault Tolerance and On-Line Testing in Railway and Industrial Control
M.E. Nillesen, Eindhoven University of Technology
A. Del Pizzo, University of Naples ?Federico II?
M. Pasquariello, University of Naples ?Federico II?
R. Rizzo, University of Naples ?Federico II?
pp. 179
Naotake Kamiura, Himeji Institute of Technology
Masashi Tomita, Himeji Institute of Technology
Teijiro Isokawa, Himeji Institute of Technology
Nobuyuki Matsui, Himeji Institute of Technology
pp. 185
Session 11: On-Line Testing and Self Repair
M.A. Naal, Institut National Polytechnique de Grenoble
E. Simeu, Institut National Polytechnique de Grenoble
pp. 201
A. Benso, Politecnico di Torino
S. Chiusano, Politecnico di Torino
G. Di Natale, Politecnico di Torino
P. Prinetto, Politecnico di Torino
Monica Lobetti Bodoni, Siemens Information and Communication Networks S.p.A.
pp. 214
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