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2012 IEEE 18th International On-Line Testing Symposium (IOLTS)
Sitges, Spain Spain
June 27-June 29
ISBN: 978-1-4673-2082-5
Table of Contents
Papers
Michael Nicolaidis, TIMA Laboratory (INP-Grenoble, UJF, CNRS), France
Vladimir Pasca, TIMA Laboratory (INP-Grenoble, UJF, CNRS), France
Lorena Anghel, TIMA Laboratory (INP-Grenoble, UJF, CNRS), France
pp. 91-96
Adrian Evans, Cisco Systems Inc., USA
Michael Nicolaidis, TIMA Laboratory (Grenoble INP, UJF, CNRS), France
Shi-Jie Wen, Cisco Systems Inc., USA
Dan Alexandrescu, iRoC Technologies, USA
Enrico Costenaro, iRoC Technologies, USA
pp. 103-108
E. Bohl, Automotive Electronics Division, Robert Bosch GmbH, Germany
M. Ihle, Corporate Research Dept., Robert Bosch GmbH, Germany
pp. 114-117
Atieh Lotfi, School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran
Arash Bayat, School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran
Saeed Safari, School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Iran
pp. 118-120
Mikhail Baklashov, Intel Corp., 2200 Mission College Blvd., Santa Clara, CA USA
pp. 123-126
Ariel Burg, School of Engineering, Bar-Ilan University, Israel
Osnat Keren, School of Engineering, Bar-Ilan University, Israel
pp. 134-135
Shusuke Yoshimoto, Kobe University, Japan
Takuro Amashita, Kobe University, Japan
Masayoshi Yoshimura, Kyushu University, Japan
Yusuke Matsunaga, Kyushu University, Japan
Hiroto Yasuura, JST CREST Japan
Shintaro Izumi, Kobe University, Japan
Hiroshi Kawaguchi, Kobe University, Japan
Masahiko Yoshimoto, JST CREST Japan
pp. 138-141
Zhen Wang, Reliable Computing Laboratory, Boston University, USA
Mark Karpovsky, Reliable Computing Laboratory, Boston University, USA
pp. 146-149
E. Amat, Universitat Politècnica de Catalunya, UPC, Barcelona, Spain
A. Asenov, University of Glasgow, Scotland
R. Canal, Universitat Politècnica de Catalunya, UPC, Barcelona, Spain
B. Cheng, University of Glasgow, Scotland
J-Ll. Cruz, Universitat Politècnica de Catalunya, UPC, Barcelona, Spain
Z. Jaksic, Universitat Politècnica de Catalunya, UPC, Barcelona, Spain
M. Miranda, Imec, Leuven, Belgium
A. Rubio, Universitat Politècnica de Catalunya, UPC, Barcelona, Spain
P. Zuber, Imec, Leuven, Belgium
pp. 169
Sujan Pandey, NXP Semiconductors/Research - Eindhoven, The Netherlands
Klaas Brink, NXP Semiconductors/Research - Eindhoven, The Netherlands
pp. 19-24
Arwa Ben Dhia, Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
Lirida Naviner, Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
Philippe Matherat, Institut TELECOM, TELECOM ParisTech, LTCI-CNRS France
pp. 31-36
Mohamed S. Abdelfattah, Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany
Lars Bauer, Embedded Systems, Karlsruhe Institute of Technology, Germany
Claus Braun, Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany
Michael E. Imhof, Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany
Michael A. Kochte, Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany
Hongyan Zhang, Embedded Systems, Karlsruhe Institute of Technology, Germany
Jorg Henkel, Embedded Systems, Karlsruhe Institute of Technology, Germany
Hans-Joachim Wunderlich, Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Germany
pp. 37-42
Eishi Ibe, Yokohama Research Laboratory, Hitachi, Ltd., 292 Yoshida, Totsuka, Kanagawa, 244-0817, Japan
Tadanobu Toba, Yokohama Research Laboratory, Hitachi, Ltd., 292 Yoshida, Totsuka, Kanagawa, 244-0817, Japan
Ken-ichi Shimbo, Yokohama Research Laboratory, Hitachi, Ltd., 292 Yoshida, Totsuka, Kanagawa, 244-0817, Japan
Hitoshi Taniguchi, Yokohama Research Laboratory, Hitachi, Ltd., 292 Yoshida, Totsuka, Kanagawa, 244-0817, Japan
pp. 49-54
P. Rech, UFRGS, Umversidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
C. Aguiar, UFRGS, Umversidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
R. Ferreira, UFRGS, Umversidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
C. Frost, ISIS, Rutherford Appleton Laboratories, Didcot, UK
L. Carro, UFRGS, Umversidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
pp. 55-60
Pedro Reviriego, Universidad Antonio de Nebrija, C/Pirineos, 55, E-28040, Madrid, Spain
Alfonso Sanchez-Macian, Universidad Antonio de Nebrija, C/Pirineos, 55, E-28040, Madrid, Spain
Juan Antonio Maestro, Universidad Antonio de Nebrija, C/Pirineos, 55, E-28040, Madrid, Spain
pp. 79-83
A. D. Touboul, Institutd'Electronique du Sud, Universite Montpellier II / CNRS, Place Eugene Bataillon - 34095 Cedex 5, France
F. Wrobel, Institutd'Electronique du Sud, Universite Montpellier II / CNRS, Place Eugene Bataillon - 34095 Cedex 5, France
F. Saigne, Institutd'Electronique du Sud, Universite Montpellier II / CNRS, Place Eugene Bataillon - 34095 Cedex 5, France
pp. 121-122
Julian Wolf, University of Augsburg, Germany
Bernhard Fechner, University of Augsburg, Germany
Theo Ungerer, University of Augsburg, Germany
pp. 127-129
Francisco R. Fernandes, Department of Electrical and Computer Engineering, FEUP, Porto, Portugal
Ricardo J. S. Machado, Department of Electrical and Computer Engineering, FEUP, Porto, Portugal
Jose M. Ferreira, Department of Electrical and Computer Engineering, FEUP, Porto, Portugal
Manuel G. Gericota, Department of Electrical Engineering, ISEP, Porto, Portugal
pp. 136-137
Sabyasachi Deyati, School of ECE, Georgia Institute of Technology, Atlanta, 30332, USA
Aritra Banerjee, School of ECE, Georgia Institute of Technology, Atlanta, 30332, USA
Abhijit Chatterjee, School of ECE, Georgia Institute of Technology, Atlanta, 30332, USA
pp. 142-145
Liang Chen, Karlsruhe Institute of Technology, Germany
Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
pp. 170-175
A. Sanchez-Clemente, Electronic Technology Department, Universidad Carlos III de Madrid, Spain
L. Entrena, Electronic Technology Department, Universidad Carlos III de Madrid, Spain
M. Garcia-Valderas, Electronic Technology Department, Universidad Carlos III de Madrid, Spain
C. Lopez-Ongil, Electronic Technology Department, Universidad Carlos III de Madrid, Spain
pp. 176-181
C. Lopez-Ongil, Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
M. Portela-Garcia, Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
M. Garcia-Valderas, Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
A. Vaskova, Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
L. Entrena, Electronic Technology Department, University Carlos III of Madrid, Leganes, Spain
J. Rivas-Abalo, INTA (National Institute for Aerospace Technique), Madrid, Spain
A. Martin-Ortega, INTA (National Institute for Aerospace Technique), Madrid, Spain
J. Martinez-Oter, INTA (National Institute for Aerospace Technique), Madrid, Spain
S. Rodriguez-Bustabad, INTA (National Institute for Aerospace Technique), Madrid, Spain
I. Arruego, INTA (National Institute for Aerospace Technique), Madrid, Spain
pp. 188-193
Yang Lin, Electronics and Computer Science, University of Southampton, SO17 1BJ, UK
Mark Zwolinski, Electronics and Computer Science, University of Southampton, SO17 1BJ, UK
pp. 7-12
Md Shayan, Indian Institute of Science, Bangalore, India
Virendra Singh, Indian Institute of Technology, Bombay, India
Adit D Singh, Auburn University, USA
Masahiro Fujita, University of Tokyo, Japan
pp. 13-18
Cinzia Bernardeschi, Department of Information Engineering, University of Pisa, Italy
Luca Cassano, Department of Information Engineering, University of Pisa, Italy
Andrea Domenici, Department of Information Engineering, University of Pisa, Italy
pp. 25-30
Miguel Vilchis, LSI Corporation, Milpitas, CA, USA
Ramnath Venkatraman, LSI Corporation, Milpitas, CA, USA
Enrico Costenaro, iRoC Technologies, Grenoble, France
Dan Alexandrescu, iRoC Technologies, Grenoble, France
pp. 43-48
J. Pachito, Univ. of Algarve / INESC-ID Lisbon, Faro, Portugal
C. V. Martins, Univ. of Algarve / INESC-ID Lisbon, Faro, Portugal
J. Semiao, Univ. of Algarve / INESC-ID Lisbon, Faro, Portugal
M. Santos, INESC-ID Lisbon / IST-UTL, Portugal
I. C. Teixeira, INESC-ID Lisbon / IST-UTL, Portugal
J. P. Teixeira, INESC-ID Lisbon / IST-UTL, Portugal
pp. 61-66
C. Bertolini, CEA, LIST, PC127, F-91191 Gif-sur-Yvette, France
O. Heron, CEA, LIST, PC127, F-91191 Gif-sur-Yvette, France
N. Ventroux, CEA, LIST, PC127, F-91191 Gif-sur-Yvette, France
F. Marc, Université Bordeaux I, 351 cours de la Libération, 33405 TALENCE cedex, France
pp. 67-72
Glenn H. Chapman, School of Engineering Science, Simon Fraser University, Burnaby, B.C., Canada, V5A 1S6
Israel Koren, Dept. of Elec. and Computer Engineering, University of Massachusetts, Amherst, 01003, USA
Zahava Koren, Dept. of Elec. and Computer Engineering, University of Massachusetts, Amherst, 01003, USA
pp. 73-78
Ozgur Sinanoglu, Computer Engineering Department, New York University - Abu Dhabi, United Arab Emirates
pp. 97-102
Josep Altet, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
Diego Mateo, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
Didac Gomez, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
pp. 109-113
Victor Tomashevich, Faculty of Computer Science and Mathematics, University of Passau, Innstr. 43, D-94032, Germany
Sudarshan Srinivasan, Faculty of Computer Science and Mathematics, University of Passau, Innstr. 43, D-94032, Germany
Fabian Foerg, Faculty of Computer Science and Mathematics, University of Passau, Innstr. 43, D-94032, Germany
Ilia Polian, Faculty of Computer Science and Mathematics, University of Passau, Innstr. 43, D-94032, Germany
pp. 150-155
Yaara Neumeier, School of Engineering, Bar-Ilan University, Israel
Osnat Keren, School of Engineering, Bar-Ilan University, Israel
pp. 156-161
Ameya Chaudhari, Computer Engineering Research Center, University of Texas at Austin -78712, USA
Jacob Abraham, Computer Engineering Research Center, University of Texas at Austin -78712, USA
pp. 162-167
M. Riga, Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy
E. Sanchez, Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy
M. Sonza Reorda, Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy
pp. 84-90
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