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2011 IEEE 17th International On-Line Testing Symposium
Matrix control-flow algorithm-based fault tolerance
Athens
July 13-July 15
ISBN: 978-1-4577-1053-7
| ASCII Text | x | ||
| R. R. Ferreira, A. F. Moreira, L. Carro, "Matrix control-flow algorithm-based fault tolerance," 11th IEEE International On-Line Testing Symposium, pp. 37-42, 2011 IEEE 17th International On-Line Testing Symposium, 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2011.5993808, author = {R. R. Ferreira and A. F. Moreira and L. Carro}, title = {Matrix control-flow algorithm-based fault tolerance}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2011}, isbn = {978-1-4577-1053-7}, pages = {37-42}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993808}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Matrix control-flow algorithm-based fault tolerance SN - 978-1-4577-1053-7 SP37 EP42 A1 - R. R. Ferreira, A1 - A. F. Moreira, A1 - L. Carro, PY - 2011 KW - matrix control flow algorithm-based fault tolerance KW - software-implemented hardware fault tolerance method KW - encoding KW - data flow program segments KW - MPSoC VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
A novel software-implemented hardware fault tolerance method based on encoding both the control and the data-flow segments of programs with matrices is proposed and evaluated. Results show an average speed-up of 3 times compared to standard duplication and comparison, with coverage higher than 95% for the case studies considered, which outperforms previous works in the field.
Index Terms:
matrix control flow algorithm-based fault tolerance, software-implemented hardware fault tolerance method, encoding, data flow program segments, MPSoC
Citation:
R. R. Ferreira, A. F. Moreira, L. Carro, "Matrix control-flow algorithm-based fault tolerance," iolts, pp.37-42, 2011 IEEE 17th International On-Line Testing Symposium, 2011
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