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2010 IEEE 16th International On-Line Testing Symposium
Corfu, Greece
July 05-July 07
ISBN: 978-1-4244-7724-1
Table of Contents
Papers
Georgios Karakonstantis, ECE School, Purdue University, West Lafayette, IN - 47907
Charles Augustine, ECE School, Purdue University, West Lafayette, IN - 47907
Kaushik Roy, ECE School, Purdue University, West Lafayette, IN - 47907
pp. 3-8
J. C. Vazquez, INESC-ID, Lisboa, Portugal
V. Champac, Instituto Nacional de Astrofísica, Óptica y Electrónica (INAOE), México
A. M. Ziesemer, INESC-ID, Lisboa, Portugal
R. Reis, Univ. Fed. Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
J. Semiao, INESC-ID, Lisboa
I. C. Teixeira, INESC-ID, Lisboa
M. B. Santos, INESC-ID, Lisboa
J. P. Teixeira, INESC-ID, Lisboa
pp. 9-14
Seyab Khan, Delft University of Technology Computer Engineering Laboratory, Mekelweg 4, 2628 CD Delft, The Netherlands
Said Hamdioui, Delft University of Technology Computer Engineering Laboratory, Mekelweg 4, 2628 CD Delft, The Netherlands
pp. 15-20
Hyunbean Yi, Nara Institute of Science and Technology (NAIST), Kansai Science City, Japan
Tomokazu Yoneda, Nara Institute of Science and Technology (NAIST), Kansai Science City, Japan
Michiko Inoue, Nara Institute of Science and Technology (NAIST), Kansai Science City, Japan
Yasuo Sato, Kyusyu Institute of Technology (KIT), Iizuka, Japan
Seiji Kajihara, Kyusyu Institute of Technology (KIT), Iizuka, Japan
Hideo Fujiwara, Nara Institute of Science and Technology (NAIST), Kansai Science City, Japan
pp. 21-26
P. Rech, LIRMM, Université Montpellier 2, Montpellier, France
M. Grosso, Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy
F. Melchiori, STMicroelectronics, Agrate Brianza (MI), Italy
D. Loparco, STMicroelectronics, Agrate Brianza (MI), Italy
D. Appello, STMicroelectronics, Agrate Brianza (MI), Italy
L. Dilillo, LIRMM, Université Montpellier 2, Montpellier, France
A. Paccagnella, DEI, Università di Padova, Padova, Italy
M. Sonza Reorda, Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy
pp. 29-34
Rodrigo Possamai Bastos, TIMA Laboratory, Grenoble INP, Grenoble, France
Gilles Sicard, TIMA Laboratory, Grenoble INP, Grenoble, France
Fernanda Kastensmidt, UFRGS, Instituto de Informática, PGMicro/PPGC, Porto Alegre, Brazil
Marc Renaudin, TIEMPO, Montbonnot St Martin, France
Ricardo Reis, UFRGS, Instituto de Informática, PGMicro/PPGC, Porto Alegre, Brazil
pp. 35-40
Sreenivas Gangadhar, Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL 62901
Spyros Tragoudas, Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL 62901
pp. 41-46
O. Heron, CEA, LIST, 91191 Gif-sur-Yvette CEDEX, France
J. Guilhemsang, CEA, LIST, 91191 Gif-sur-Yvette CEDEX, France
N. Ventroux, CEA, LIST, 91191 Gif-sur-Yvette CEDEX, France
A. Giulieri, LEAT, Université de Nice-Sophia Antipolis, Valbonne, F-06560, France
pp. 49-55
Etienne Faure, University Pierre & Marie Curie, LIP6-SoC Laboratory, 4 place Jussieu, 75252 Paris, France
Mounir Benabdenbi, TIMA Laboratory, Grenoble INP, CNRS, UJF, 46 avenue Felix Viallet, 38000 Grenoble, France
Francois Pecheux, University Pierre & Marie Curie LIP6-SoC Laboratory, 4 place Jussieu, 75252 Paris, France
pp. 56-61
A. Merentitis, Department of Informatics & Telecommunications, University of Athens, Greece
D. Margaris, Department of Informatics & Telecommunications, University of Athens, Greece
N. Kranitis, Department of Informatics & Telecommunications, University of Athens, Greece
A. Paschalis, Department of Informatics & Telecommunications, University of Athens, Greece
D. Gizopoulos, Department of Informatics, University of Piraeus, Greece
pp. 62-67
Dzmitry Maliuk, Electrical Engineering Department, Yale University, 10 Hillhouse Ave, New Haven, CT 06520-8267, USA
Haralampos-G. Stratigopoulos, TIMA Laboratory (CNRS-INP Grenoble-UJF), 46 Av. Fe´lix Viallet, 38031 Grenoble, France
Yiorgos Makris, Electrical Engineering Department, Yale University, 10 Hillhouse Ave, New Haven, CT 06520-8267, USA
pp. 71-76
Shyam Kumar Devarakond, School of ECE, Georgia Institute of Technology, Atlanta, GA, 30332
Shreyas Sen, School of ECE, Georgia Institute of Technology, Atlanta, GA, 30332
Aritra Banerjee, School of ECE, Georgia Institute of Technology, Atlanta, GA, 30332
Vishwanath Natarajan, School of ECE, Georgia Institute of Technology, Atlanta, GA, 30332
Abhijit Chatterjee, School of ECE, Georgia Institute of Technology, Atlanta, GA, 30332
pp. 77-82
Michael G. Dimopoulos, Department of Electronics Alexander Technological Educat. Inst. of Thessaloniki Thessaloniki, Greece
Alexios D. Spyronasios, Department of Electrical & Computer Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
Alkis A. Hatzopoulos, Department of Electrical & Computer Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
pp. 83-87
S. Campagna, Politecnico di Torino, Torino, Italy
M. Violante, Politecnico di Torino, Torino, Italy
pp. 91-96
Long Wang, Center for Reliable and High-Performance Computing, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801
Zbigniew Kalbarczyk, Center for Reliable and High-Performance Computing, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801
Ravishankar K. Iyer, Center for Reliable and High-Performance Computing, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801
Arun Iyengar, IBM T. J. Watson Research Center 19 Skyline Drive, Hawthorne, NY 10532
pp. 97-102
Michel Pignol, CNES 18 avenue Edouard Belin, 31401 Toulouse Cedex 9 - France
Florence Malou, CNES 18 avenue Edouard Belin, 31401 Toulouse Cedex 9 - France
Corinne Aicardi, CNES 18 avenue Edouard Belin, 31401 Toulouse Cedex 9 - France
pp. 103-108
Vladimir Pasca, TIMA Laboratory, Grenoble
Lorena Anghel, TIMA Laboratory, Grenoble
Claudia Rusu, TIMA Laboratory, Grenoble
Mounir Benabdenbi, TIMA Laboratory, Grenoble
pp. 115-120
Claudia Rusu, TIMA Laboratory (CNRS-UJF-INP) Grenoble, France
Lorena Anghel, TIMA Laboratory (CNRS-UJF-INP) Grenoble, France
Dimiter Avresky, IRIANC Boston, USA/Munich, Germany
pp. 121-126
Ryoji Noji, Graduate School of Information Sciences, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-3194, Japan
Satoshi Fujie, Graduate School of Information Sciences, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-3194, Japan
Yuki Yoshikawa, Graduate School of Information Sciences, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-3194, Japan
Hideyuki Ichihara, Graduate School of Information Sciences, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-3194, Japan
Tomoo Inoue, Graduate School of Information Sciences, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-3194, Japan
pp. 127-132
Josep Altet, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
Diego Mateo, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
Eduardo Aldrete-Vidrio, Electronic Engineering Department, Universitat Politècnica de Catalunya, Barcelona, Spain
pp. 135
Tiago R. Balen, Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
Marcelo Lubaszewski, Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
pp. 136
A. Richardson, Department of Engineering, Lancaster University, Lancaster LAI 4YR UK
pp. 137
S. A. Bota, Grup de Sistemes Electrònics, Universitat de les Illes Balears, Palma de Mallorca, Spain
G. Torrens, Grup de Sistemes Electrònics, Universitat de les Illes Balears, Palma de Mallorca, Spain
B. Alorda, Grup de Sistemes Electrònics, Universitat de les Illes Balears, Palma de Mallorca, Spain
J. Verd, Grup de Sistemes Electrònics, Universitat de les Illes Balears, Palma de Mallorca, Spain
J. Segura, Grup de Sistemes Electrònics, Universitat de les Illes Balears, Palma de Mallorca, Spain
pp. 141-146
Samuel Evain, CEA LIST, Embedded Systems Reliability Laboratory, Point Courrier 94, Gif-sur-Yvette, F-91191 France
Yannick Bonhomme, CEA LIST, Embedded Systems Reliability Laboratory, Point Courrier 94, Gif-sur-Yvette, F-91191 France
Valentin Gherman, CEA LIST, Embedded Systems Reliability Laboratory, Point Courrier 94, Gif-sur-Yvette, F-91191 France
pp. 147-153
Nicholas Axelos, School of Electrical and Computer Engineering, National Technical University of Athens
Kiamal Pekmestzi, School of Electrical and Computer Engineering, National Technical University of Athens
pp. 154-158
G. Theodorou, Department of Informatics & Telecommunications, University of Athens, Greece
N. Kranitis, Department of Informatics & Telecommunications, University of Athens, Greece
A. Paschalis, Department of Informatics & Telecommunications, University of Athens, Greece
D. Gizopoulos, Department of Informatics, University of Piraeus, Greece
pp. 159-164
M. Grosso, Dipartimento di Automatica e Informatica Politecnico di Torino - Torino, Italy
M. Sonza Reorda, Dipartimento di Automatica e Informatica Politecnico di Torino - Torino, Italy
M. Portela-Garcia, Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain
M. Garcia-Valderas, Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain
C. Lopez-Ongil, Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain
L. Entrena, Electronic Technology Department, Universidad Carlos III de Madrid - Madrid, Spain
pp. 167-172
Ali Shahabi, Electrical and Computer Engineering, School of Engineering Colleges, Campus 2, University of Tehran, 1450 North Amirabad, 14395-515 Tehran, Iran
S. Behdad Hosseini, Electrical and Computer Engineering, School of Engineering Colleges, Campus 2, University of Tehran, 1450 North Amirabad, 14395-515 Tehran, Iran
Hassan Sohofi, Electrical and Computer Engineering, School of Engineering Colleges, Campus 2, University of Tehran, 1450 North Amirabad, 14395-515 Tehran, Iran
Zainalabedin Navabi, Electrical and Computer Engineering, School of Engineering Colleges, Campus 2, University of Tehran, 1450 North Amirabad, 14395-515 Tehran, Iran
pp. 173-178
Irith Pomeranz, School of Electrical & Computer Eng., Purdue University
Sudhakar M. Reddy, Electrical & Computer Eng. Dept., University of Iowa, Iowa City, IA 52242, U.S.A.
pp. 179-184
Josep Rius, Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya, Diagonal 647, 9th floor, 08028 Barcelona, Spain
pp. 187-189
Martin Rozkovec, Institute of Information Technologies and Electronics, Technical University in Liberec, Liberec, Czech Republic
Jiri Jenicek, Institute of Information Technologies and Electronics, Technical University in Liberec, Liberec, Czech Republic
Ondrej Novak, Institute of Information Technologies and Electronics, Technical University in Liberec, Liberec, Czech Republic
pp. 192-193
Zhen Zhang, University Pierre et Marie Curie, LIP6-SoC laboratory, 4 place Jussieu, 75252 Paris, France
Alain Greiner, University Pierre et Marie Curie, LIP6-SoC laboratory, 4 place Jussieu, 75252 Paris, France
Mounir Benabdenbi, TIMA laboratory (Grenoble INP, CNRS, UJF), 46 avenue Felix Viallet, 38000 Grenoble, France
pp. 194-196
Piotr Gawkowski, Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland
Tomasz Rutkowski, Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland
Janusz Sosnowski, Institute of Computer Science, Warsaw University of Technology, Warsaw, Poland
pp. 197-199
R. Chipana, Catholic University - PUCRS, Porto Alegre, Brazil
L. Bolzani, Catholic University - PUCRS, Porto Alegre, Brazil
F. Vargas, Catholic University - PUCRS, Porto Alegre, Brazil
J. Semiao, Univ. Algarve, INESC-ID, Faro, Portugal
J. Rodriguez-Andina, University of Vigo, Vigo, Spain
I. Teixeira, IST/INESC-ID Lisboa, Portugal
P. Teixeira, IST/INESC-ID Lisboa, Portugal
pp. 200-201
Vitaly Ocheretny, Fraunhofer Institute for Secure Information Technology (SIT)
pp. 202-203
Navid Farazmand, Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA
Masoud Zamani, Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA
Mehdi B. Tahoori, Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA
pp. 204-205
Sobeeh Almukhaizim, Computer Engineering Department, Kuwait University
Sara Bunian, Computer Engineering Department, Kuwait University
Ozgur Sinanoglu, Computer Engineering Department New York University - Abu Dhabi
pp. 206-207
Anna Vaskova, Microelectronic Design and Applications Group, Electronic Technology Dept. Carlos III University of Madrid
Celia Lopez-Ongil, Microelectronic Design and Applications Group, Electronic Technology Dept. Carlos III University of Madrid
Alejandro Jimenez-Horas, Microelectronic Design and Applications Group, Electronic Technology Dept. Carlos III University of Madrid
Enrique San Millan, Microelectronic Design and Applications Group, Electronic Technology Dept. Carlos III University of Madrid
Luis Entrena, Microelectronic Design and Applications Group, Electronic Technology Dept. Carlos III University of Madrid
pp. 208-210
D. McIntyre, Cleveland State University, Computer & Information Science, Cleveland, Ohio 44106, USA
F. Wolff, Case Western Reserve University, Electrical Engineering and Computer Science, Cleveland, Ohio 44106, USA
C. Papachristou, Case Western Reserve University, Electrical Engineering and Computer Science, Cleveland, Ohio 44106, USA
S. Bhunia, Case Western Reserve University, Electrical Engineering and Computer Science, Cleveland, Ohio 44106, USA
pp. 211-213
Nikolaos Minas, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Ingrid De Wolf, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Erik Jan Marinissen, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Michele Stucchi, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Herman Oprins, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Abdelkarim Mercha, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Geert Van der Plaas, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Dimitrios Velenis, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
Pol Marchai, IM EC, Kapeldreef 75, B-3001 Leuven, Belgium
pp. 217
M. Nicolaidis, TIMA Laboratory (CNRS, Grenoble INP, UJF)
Vladimir Pasca, TIMA Laboratory (CNRS, Grenoble INP, UJF)
Lorena Anghel, TIMA Laboratory (CNRS, Grenoble INP, UJF)
pp. 218
K. Bousselam, LIRMM (Université Montpellier II/CNRS UMR 5506), Montpellier, France
G. Di Natale, LIRMM (Université Montpellier II/CNRS UMR 5506), Montpellier, France
M-L. Flottes, LIRMM (Université Montpellier II/CNRS UMR 5506), Montpellier, France
B. Rouzeyre, LIRMM (Université Montpellier II/CNRS UMR 5506), Montpellier, France
pp. 223-228
How to flip a bit? (Abstract)
Michel Agoyan, Département Systèmes et Architectures Sécurisées (SAS), CEA-LETI, Gardanne, France
Jean-Max Dutertre, École Nationale Supérieure des Mines de Saint-Étienne (ensmse), Gardanne, France
Amir-Pasha Mirbaha, École Nationale Supérieure des Mines de Saint-Étienne (ensmse), Gardanne, France
David Naccache, Équipe de cryptographie, École normale supérieure, Paris, France
Anne-Lise Ribotta, École Nationale Supérieure des Mines de Saint-Étienne (ensmse), Gardanne, France
Assia Tria, Département Systèmes et Architectures Sécurisées (SAS), CEA-LETI, Gardanne, France
pp. 235-239
Zhen Wang, Reliable Computing Laboratory, Boston University, 8 Saint Mary's Street, Boston, MA, USA
Mark Karpovsky, Reliable Computing Laboratory, Boston University, 8 Saint Mary's Street, Boston, MA, USA
pp. 240-245
Michael N. Skoufis, Raytheon Company, Tucson, AZ 85756-9367, USA
Spyros Tragoudas, Southern Illinois University Carbondale, IL 62901, USA
pp. 249-254
Steffen Tarnick, FBE-ASIC GmbH, Eiselenweg 8, D-12555 Berlin, Germany
pp. 255-260
Steffen Zeidler, IHP - Innovations for High Performance Microelectronics Im Technologiepark 25, 15236 Frankfurt (Oder), Germany
Alexander Bystrov, School EECE, Newcastle University Newcastle upon Tyne
Milos Krstica, IHP - Innovations for High Performance Microelectronics Im Technologiepark 25, 15236 Frankfurt (Oder), Germany
Rolf Kraemer, IHP - Innovations for High Performance Microelectronics Im Technologiepark 25, 15236 Frankfurt (Oder), Germany
pp. 261-267
Michael Augustin, BTU Cottbus, Computer Science Institute, P.O. Box 10 13 44 03013 Cottbus, Germany
Michael Gossel, Potsdam University, Computer Science Institute, August-Bebel-Straße 89, 14482 Potsdam, Germany
Rolf Kraemer, IHP GmbH, System Design Department, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany
pp. 268-273
V Prasanth, Computer Design and Test Lab, Indian Institute of Science, Bangalore, India
Virendra Singh, Computer Design and Test Lab, Indian Institute of Science, Bangalore, India
Rubin Parekhji, Texas Instruments (India) Pvt. Ltd., Bangalore
pp. 277-282
S. Valadimas, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
Y. Tsiatouhas, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
A. Arapoyanni, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
pp. 283-288
Joshua W. Wells, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332
Jayaram Natarajan, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332
Abhijit Chatterjee, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332
pp. 289-294
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