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2010 IEEE 16th International On-Line Testing Symposium
Timing error tolerance in nanometer ICs
Corfu, Greece
July 05-July 07
ISBN: 978-1-4244-7724-1
| ASCII Text | x | ||
| S. Valadimas, Y. Tsiatouhas, A. Arapoyanni, "Timing error tolerance in nanometer ICs," 11th IEEE International On-Line Testing Symposium, pp. 283-288, 2010 IEEE 16th International On-Line Testing Symposium, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2010.5560189, author = {S. Valadimas and Y. Tsiatouhas and A. Arapoyanni}, title = {Timing error tolerance in nanometer ICs}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2010}, isbn = {978-1-4244-7724-1}, pages = {283-288}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2010.5560189}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Timing error tolerance in nanometer ICs SN - 978-1-4244-7724-1 SP283 EP288 A1 - S. Valadimas, A1 - Y. Tsiatouhas, A1 - A. Arapoyanni, PY - 2010 VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
Timing error tolerance turns to be an important design parameter in nanometer technology, high speed and high complexity integrated circuits. In this work, we present a low cost, multiple timing error detection and correction technique, which is based on a new Flip-Flop design. The proposed design approach provides timing error tolerance at the small penalty of one clock cycle delay in the circuit operation for each error correction. In addition, it is characterized by very low silicon area requirements compared to previous design schemes in the open literature. The proposed technique has been applied in a 90nm pipeline design of a digital FIR filter and the simulation results validated its efficiency.
Citation:
S. Valadimas, Y. Tsiatouhas, A. Arapoyanni, "Timing error tolerance in nanometer ICs," iolts, pp.283-288, 2010 IEEE 16th International On-Line Testing Symposium, 2010
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