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2010 IEEE 16th International On-Line Testing Symposium
Timing error tolerance in nanometer ICs
Corfu, Greece
July 05-July 07
ISBN: 978-1-4244-7724-1
S. Valadimas, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
Y. Tsiatouhas, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
A. Arapoyanni, University of Athens, Dept. of Informatics and Telecommunications, 15784 Athens, Greece
Timing error tolerance turns to be an important design parameter in nanometer technology, high speed and high complexity integrated circuits. In this work, we present a low cost, multiple timing error detection and correction technique, which is based on a new Flip-Flop design. The proposed design approach provides timing error tolerance at the small penalty of one clock cycle delay in the circuit operation for each error correction. In addition, it is characterized by very low silicon area requirements compared to previous design schemes in the open literature. The proposed technique has been applied in a 90nm pipeline design of a digital FIR filter and the simulation results validated its efficiency.
Citation:
S. Valadimas, Y. Tsiatouhas, A. Arapoyanni, "Timing error tolerance in nanometer ICs," iolts, pp.283-288, 2010 IEEE 16th International On-Line Testing Symposium, 2010
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