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2009 15th IEEE International On-Line Testing Symposium
On-line characterization and reconfiguration for single event upset variations
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
Kenneth M. Zick, Advanced Computer Architecture Laboratory, University of Michigan, Ann Arbor, 48109 USA
John P. Hayes, Advanced Computer Architecture Laboratory, University of Michigan, Ann Arbor, 48109 USA
The amount of physical variation among electronic components on a die is increasing rapidly. There is a need for a better understanding of variations in transient fault susceptibility, and for methods of on-line adaptation to such variations. We address three key research questions in this area. First, we investigate accelerated characterization of individual latch susceptibilities. We find that on the order of 10 upsets per latch must be observed for variations to be adequately characterized. Second, we propose a method of on-line hardware reconfiguration using incremental place-and-route on FPGAs. Surprisingly, we find that highly localized place-and-route changes (e.g. restricted to groups of 8 flip-flops) are sufficient for realizing most of the possible benefits. Lastly, we quantify potential improvements in system-level soft error rates via Monte Carlo simulation experiments. The study highlights both what is required for and what can be gained by on-line adaptation.
Citation:
Kenneth M. Zick, John P. Hayes, "On-line characterization and reconfiguration for single event upset variations," iolts, pp.243-248, 2009 15th IEEE International On-Line Testing Symposium, 2009
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