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2009 15th IEEE International On-Line Testing Symposium
Designing fault tolerant FSM by nano-PLA
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
ASCII Text
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S. Baranov, I. Levin, O. Keren, M. Karpovsky, "Designing fault tolerant FSM by nano-PLA," 11th IEEE International On-Line Testing Symposium, pp. 229-234, 2009 15th IEEE International On-Line Testing Symposium, 2009.
 
 
BibTex
x
 
@article{ 10.1109/IOLTS.2009.5196021,
author = {S. Baranov and I. Levin and O. Keren and M. Karpovsky},
title = {Designing fault tolerant FSM by nano-PLA},
journal ={11th IEEE International On-Line Testing Symposium},
volume = {0},
year = {2009},
isbn = {978-1-4244-4596-7},
pages = {229-234},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196021},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 11th IEEE International On-Line Testing Symposium
TI - Designing fault tolerant FSM by nano-PLA
SN - 978-1-4244-4596-7
SP229
EP234
A1 - S. Baranov,
A1 - I. Levin,
A1 - O. Keren,
A1 - M. Karpovsky,
PY - 2009
VL - 0
JA - 11th IEEE International On-Line Testing Symposium
ER -
 
S. Baranov, Bar Ilan University/School of Engineering, Ramat Gan, Israel
I. Levin, Tel Aviv University/School of Education, Israel
O. Keren, Bar Ilan University/School of Engineering, Ramat Gan, Israel
M. Karpovsky, Boston University/Department of Electrical, Computer and System Engineering, USA
The paper deals with designing fault tolerant finite state machines (FSMs) by nanoelectronic programmable logic arrays (PLAs). Two main critical parameters of the fault tolerant nano-PLAs, the area and the number of crosspoint devices, are considered as optimization criteria for the synthesis. The paper introduces a method for synthesizing fault tolerant nano-PLA based FSMs. The method is based on decomposing an initial PLA description of the FSM into a three interacting portions. The proposed solution provides significant reduction of the area without meaningful increasing of a number of crosspoint devices in comparison with known solutions and provides a trade-off between the area and the number of devices in designing FSMs by PLAs.
Citation:
S. Baranov, I. Levin, O. Keren, M. Karpovsky, "Designing fault tolerant FSM by nano-PLA," iolts, pp.229-234, 2009 15th IEEE International On-Line Testing Symposium, 2009
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