A low-cost fault-tolerant technique for Carry Look-Ahead adder

Alireza Namazi; Alireza Ejlali; Yasser Sedaghat; Seyed Ghassem Miremadi

doi:10.1109/IOLTS.2009.5196019

I
IOLTS
2009
2009 15th IEEE International On-Line Testing Symposium
Abstract - A low-cost fault-tolerant technique for Carry Look-Ahead adder

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2009 15th IEEE International On-Line Testing Symposium

A low-cost fault-tolerant technique for Carry Look-Ahead adder

Sesimbra-Lisbon, Portugal

June 24-June 26

ISBN: 978-1-4244-4596-7

	ASCII Text	x
	Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali, "A low-cost fault-tolerant technique for Carry Look-Ahead adder," 11th IEEE International On-Line Testing Symposium, pp. 217-222, 2009 15th IEEE International On-Line Testing Symposium, 2009.

	BibTex	x
	@article{ 10.1109/IOLTS.2009.5196019, author = {Alireza Namazi and Yasser Sedaghat and Seyed Ghassem Miremadi and Alireza Ejlali}, title = {A low-cost fault-tolerant technique for Carry Look-Ahead adder}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2009}, isbn = {978-1-4244-4596-7}, pages = {217-222}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196019}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - A low-cost fault-tolerant technique for Carry Look-Ahead adder SN - 978-1-4244-4596-7 SP217 EP222 A1 - Alireza Namazi, A1 - Yasser Sedaghat, A1 - Seyed Ghassem Miremadi, A1 - Alireza Ejlali, PY - 2009 VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER -

Alireza Namazi, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN

Yasser Sedaghat, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN

Seyed Ghassem Miremadi, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN

Alireza Ejlali, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196019

This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.

Citation:

Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali, "A low-cost fault-tolerant technique for Carry Look-Ahead adder," iolts, pp.217-222, 2009 15th IEEE International On-Line Testing Symposium, 2009

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