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2009 15th IEEE International On-Line Testing Symposium
A low-cost fault-tolerant technique for Carry Look-Ahead adder
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
Alireza Namazi, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Yasser Sedaghat, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Seyed Ghassem Miremadi, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
Alireza Ejlali, Dependable Systems Laboratory, Department of Computer Engineering, Sharif University of Technology, Azadi St., Tehran, IRAN
This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.
Citation:
Alireza Namazi, Yasser Sedaghat, Seyed Ghassem Miremadi, Alireza Ejlali, "A low-cost fault-tolerant technique for Carry Look-Ahead adder," iolts, pp.217-222, 2009 15th IEEE International On-Line Testing Symposium, 2009
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