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Sesimbra-Lisbon, Portugal
June 24, 2009 to June 26, 2009
ISBN: 978-1-4244-4596-7
pp: 179
Dan Alexandrescu , iRoC Technologies, France
Anne-Lise Lhomme-Perrot , iRoC Technologies, France
Erwin Schaefer , iRoC Technologies, France
Cyrille Beltrando , iRoC Technologies, France
ABSTRACT
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
CITATION
Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schaefer, Cyrille Beltrando, "Highs and lows of radiation testing", IOLTS, 2009, 11th IEEE International On-Line Testing Symposium, 11th IEEE International On-Line Testing Symposium 2009, pp. 179, doi:10.1109/IOLTS.2009.5196004
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