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2009 15th IEEE International On-Line Testing Symposium
Highs and lows of radiation testing
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
Dan Alexandrescu, iRoC Technologies, France
Anne-Lise Lhomme-Perrot, iRoC Technologies, France
Erwin Schaefer, iRoC Technologies, France
Cyrille Beltrando, iRoC Technologies, France
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
Citation:
Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schaefer, Cyrille Beltrando, "Highs and lows of radiation testing," iolts, pp.179, 2009 15th IEEE International On-Line Testing Symposium, 2009
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