June 24, 2009 to June 26, 2009
Anne-Lise Lhomme-Perrot , iRoC Technologies, France
Erwin Schaefer , iRoC Technologies, France
Dan Alexandrescu , iRoC Technologies, France
The presentation concerns a practical approach for dealing with difficulties associated to real time testing in a natural environment of microelectronic devices.
Anne-Lise Lhomme-Perrot, Erwin Schaefer, Dan Alexandrescu, "Highs and lows of radiation testing", IOLTS, 2009, 11th IEEE International On-Line Testing Symposium, 11th IEEE International On-Line Testing Symposium 2009, pp. 179, doi:10.1109/IOLTS.2009.5196004