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2009 15th IEEE International On-Line Testing Symposium
Multilinear codes for robust error detection
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
| ASCII Text | x | ||
| Zhen Wang, Mark Karpovsky, Berk Sunar, "Multilinear codes for robust error detection," 11th IEEE International On-Line Testing Symposium, pp. 164-169, 2009 15th IEEE International On-Line Testing Symposium, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2009.5196002, author = { Zhen Wang and Mark Karpovsky and Berk Sunar}, title = {Multilinear codes for robust error detection}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2009}, isbn = {978-1-4244-4596-7}, pages = {164-169}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196002}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Multilinear codes for robust error detection SN - 978-1-4244-4596-7 SP164 EP169 A1 - Zhen Wang, A1 - Mark Karpovsky, A1 - Berk Sunar, PY - 2009 VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
We propose an efficient technique for the detection of errors in cryptographic circuits introduced by strong adversaries. Previously a number of linear and non-linear error detection schemes were proposed. Linear codes provide protection only against primitive adversaries which no longer represents practice. On the other hand non-linear codes provide protection against strong adversaries, but at the price of high overhead. Here we propose a novel error detection technique, based on the random selection of linear codes. Under mild assumptions the proposed construction achieves near non-linear code error detection performance at much lower cost due to the fact that no non-linear operations are needed for the encoder and decoder.
Citation:
Zhen Wang, Mark Karpovsky, Berk Sunar, "Multilinear codes for robust error detection," iolts, pp.164-169, 2009 15th IEEE International On-Line Testing Symposium, 2009
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