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2009 15th IEEE International On-Line Testing Symposium
Concurrent checking with split-parity codes
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
| ASCII Text | x | ||
| Michael Richter, Michael Goessel, "Concurrent checking with split-parity codes," 11th IEEE International On-Line Testing Symposium, pp. 159-163, 2009 15th IEEE International On-Line Testing Symposium, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2009.5196001, author = {Michael Richter and Michael Goessel}, title = {Concurrent checking with split-parity codes}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2009}, isbn = {978-1-4244-4596-7}, pages = {159-163}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5196001}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Concurrent checking with split-parity codes SN - 978-1-4244-4596-7 SP159 EP163 A1 - Michael Richter, A1 - Michael Goessel, PY - 2009 VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
In this paper the design of error detection circuits for split-parity codes is investigated. In a split-parity code the linear parity bit is split into two nonlinear check bits. Split-parity codes, like parity codes, detect all odd errors with certainty; all even errors - which remain undetected by parity - are detected with a probability of 50%. It is shown that a large variety of split-parity codes exist which can be utilized for the optimization of error detection circuits with respect to area and error detection probability. It is demonstrated that split-parity codes are a cost-effective possibility to design error detection circuits.
Citation:
Michael Richter, Michael Goessel, "Concurrent checking with split-parity codes," iolts, pp.159-163, 2009 15th IEEE International On-Line Testing Symposium, 2009
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