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2009 15th IEEE International On-Line Testing Symposium
Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
N. Battezzati, Politecnico di Torino, Italy
F. Decuzzi, Politecnico di Torino, Italy
M. Violante, Politecnico di Torino, Italy
M. Briet, Atmel Corp., France
Radiation-hardened-by-design (RHBD) SRAM-based FPGAs will play a crucial role in providing new generations of satellites with reliable in-flight reconfiguration ability, which is mandatory to enable the successful use of configurable computing in space. RHBD SRAM-based FPGAs sensitiveness against ionizing radiation is normally evaluated resorting to radiation testing, which provides the device cross-section. However, as a matter of fact, applications implemented on such devices use only a portion of the available resources, and the corresponding configuration memory. As a result, application-oriented sensitiveness analysis tools are needed that, by analyzing how the FPGA resources are actually used by a given application, produce application cross-section that is a reliability figure more accurate than device cross section. This paper presents a novel application-oriented sensitiveness analysis tool we are developing for the new generation of SRAM-based FPGAs from Atmel: the ATF280E.
Citation:
N. Battezzati, F. Decuzzi, M. Violante, M. Briet, "Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs," iolts, pp.89-94, 2009 15th IEEE International On-Line Testing Symposium, 2009
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