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2009 15th IEEE International On-Line Testing Symposium
Evaluating Alpha-induced soft errors in embedded microprocessors
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
ASCII Text
x 
 
P. Rech, S. Gerardin, A. Paccagnella, P. Bernardi, M. Grosso, M. Sonza Reorda, D. Appello, "Evaluating Alpha-induced soft errors in embedded microprocessors," 11th IEEE International On-Line Testing Symposium, pp. 69-74, 2009 15th IEEE International On-Line Testing Symposium, 2009.
 
 
BibTex
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@article{ 10.1109/IOLTS.2009.5195985,
author = {P. Rech and S. Gerardin and A. Paccagnella and P. Bernardi and M. Grosso and M. Sonza Reorda and D. Appello},
title = {Evaluating Alpha-induced soft errors in embedded microprocessors},
journal ={11th IEEE International On-Line Testing Symposium},
volume = {0},
year = {2009},
isbn = {978-1-4244-4596-7},
pages = {69-74},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5195985},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 11th IEEE International On-Line Testing Symposium
TI - Evaluating Alpha-induced soft errors in embedded microprocessors
SN - 978-1-4244-4596-7
SP69
EP74
A1 - P. Rech,
A1 - S. Gerardin,
A1 - A. Paccagnella,
A1 - P. Bernardi,
A1 - M. Grosso,
A1 - M. Sonza Reorda,
A1 - D. Appello,
PY - 2009
VL - 0
JA - 11th IEEE International On-Line Testing Symposium
ER -
 
P. Rech, Università di Padova, Dipartimento di Ingegneria dell'Informazione, Italy
S. Gerardin, Università di Padova, Dipartimento di Ingegneria dell'Informazione, Italy
A. Paccagnella, Università di Padova, Dipartimento di Ingegneria dell'Informazione, Italy
P. Bernardi, Politecnico di Torino, Dipartimento di Automatica e Informatica, Italy
M. Grosso, Politecnico di Torino, Dipartimento di Automatica e Informatica, Italy
M. Sonza Reorda, Politecnico di Torino, Dipartimento di Automatica e Informatica, Italy
D. Appello, STMicroelectronics, Agrate Brianza (MI), Italy
This paper presents the results of Alpha Single Event Upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for different codes implemented as test benchmarks. Test results are then discussed to find the contribution of each available resource to the overall device error rate.
Citation:
P. Rech, S. Gerardin, A. Paccagnella, P. Bernardi, M. Grosso, M. Sonza Reorda, D. Appello, "Evaluating Alpha-induced soft errors in embedded microprocessors," iolts, pp.69-74, 2009 15th IEEE International On-Line Testing Symposium, 2009
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