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2009 15th IEEE International On-Line Testing Symposium
Towards automated fault pruning with Petri Nets
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
P. Maistri, TIMA Laboratory (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet - 38031 Cedex - France
R. Leveugle, TIMA Laboratory (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet - 38031 Cedex - France
Embedded systems design is starting considering dependability issues even for mass-market systems. Soft error consequences must in particular be carefully analyzed. Usually, fault injection campaigns are run to analyze the consequences of transient faults, but the length of a comprehensive evaluation often collides with the severe requirements on design cycle times. We propose a new fault pruning technique to identify harmless components and computation cycles as soon as possible, thus avoiding useless fault injection experiments. The technique is based on a formal model of the system and we show that it can be used for both SEUs and SETs.
Citation:
P. Maistri, R. Leveugle, "Towards automated fault pruning with Petri Nets," iolts, pp.41-46, 2009 15th IEEE International On-Line Testing Symposium, 2009
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