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2009 15th IEEE International On-Line Testing Symposium
Comparing transient-fault effects on synchronous and on asynchronous circuits
Sesimbra-Lisbon, Portugal
June 24-June 26
ISBN: 978-1-4244-4596-7
| ASCII Text | x | ||
| R. Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, M. Renaudin, R. Reis, "Comparing transient-fault effects on synchronous and on asynchronous circuits," 11th IEEE International On-Line Testing Symposium, pp. 29-34, 2009 15th IEEE International On-Line Testing Symposium, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2009.5195979, author = {R. Possamai Bastos and Y. Monnet and G. Sicard and F. Kastensmidt and M. Renaudin and R. Reis}, title = {Comparing transient-fault effects on synchronous and on asynchronous circuits}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2009}, isbn = {978-1-4244-4596-7}, pages = {29-34}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2009.5195979}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Comparing transient-fault effects on synchronous and on asynchronous circuits SN - 978-1-4244-4596-7 SP29 EP34 A1 - R. Possamai Bastos, A1 - Y. Monnet, A1 - G. Sicard, A1 - F. Kastensmidt, A1 - M. Renaudin, A1 - R. Reis, PY - 2009 VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
A methodology to evaluate transient-fault effects on synchronous and asynchronous is presented in this work. It is developed by means of fault-injection simulation campaigns on gate-level circuit implementations. The methodology is able to deal with the particularities of asynchronous circuits. Unlike previous works, it permits to compare the sensitivity of circuits designed by synchronous and asynchronous logics. The resultant metrics allow identifying at high-level abstraction what is the logic that makes the circuit more transient-fault sensitive. As a case study, a crypto-processor in versions synchronous and asynchronous was evaluated.
Citation:
R. Possamai Bastos, Y. Monnet, G. Sicard, F. Kastensmidt, M. Renaudin, R. Reis, "Comparing transient-fault effects on synchronous and on asynchronous circuits," iolts, pp.29-34, 2009 15th IEEE International On-Line Testing Symposium, 2009
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