loading...
  • I
  • IOLTS
  • 2007
  • 13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Advanced Search 
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Heraklion, Crete, Greece
July 08-July 11
ISBN: 0-7695-2918-6
Table of Contents
Introduction
Test Technology Educational Program (TTEP) 2007 Full-Day Tutorial
Keynote Talk
Invited Talk
Sanjiv Taneja, Vice President and General Manager of Test Technology Cadence
pp. 11
Session 1: Reliability Issues in Nanometer Technologies
Jaume Abella, Intel Barcelona Research Center
Xavier Vera, Intel Barcelona Research Center
Osman Unsal, Intel Barcelona Research Center
Oguz Ergin, Intel Barcelona Research Center
Antonio Gonz?lez, Intel Barcelona Research Center
pp. 15-22
Ming Zhang, Intel Corporation
T.M. Mak, Intel Corporation
Jim Tschanz, Intel Corporation
Kee Sup Kim, Intel Corporation
Norbert Seifert, Intel Corporation
Davia Lu, Intel Corporation
pp. 23-28
Somnath Paul, Case Western Reserve University, USA
Rajat Subhra. Chakraborty, Case Western Reserve University, USA
Swarup Bhunia, Case Western Reserve University, USA
pp. 29-36
Session 2: Network-on-Chip Reliability and Fault Tolerance
Cristian Grecu, University of British Columbia, Canada
Lorena Anghel, TIMA Laboratory, France
Partha P. Pande, Washington State University
Andre Ivanov, University of British Columbia, Canada
Resve Saleh, University of British Columbia, Canada
pp. 37-42
Daniele Rossi, University of Bologna, Italy
Paolo Angelini, University of Bologna, Italy
Cecilia Metra, University of Bologna, Italy
pp. 43-48
Session 3: Secure Systems
G. Di Natale, Universite Montpellier II, France
M.-L. Flottes, Universite Montpellier II, France
B. Rouzeyre, Universite Montpellier II, France
pp. 57-62
Osama Al-Khaleel, Case Western Reserve University, USA
Chris Papachristou, Case Western Reserve University, USA
Francis Wolff, Case Western Reserve University, USA
Kiamal Pekmestzi, National Technical University, Greece
pp. 71-78
Session 4: Large Scale Dependability
Fabian Vargas, Catholic University-PUCRS, Brazil
Leonardo Piccoli, Catholic University-PUCRS, Brazil
Juliano Benfica, Catholic University-PUCRS, Brazil
Antonio A. de Alecrim Jr., Catholic University-PUCRS, Brazil
Marlon Moraes, Catholic University-PUCRS, Brazil
pp. 93-100
Session 5: Dependability of Processors, SoCs and Asynchronous Circuits
Marta Portela-Garcia, Carlos III University of Madrid, Spain
Celia L?pez-Ongil, Carlos III University of Madrid, Spain
Mario Garcia-Valderas, Carlos III University of Madrid, Spain
Luis Entrena, Carlos III University of Madrid, Spain
pp. 101-106
P. Bernardi, Politecnico di Torino, Italy
L. Bolzani, Politecnico di Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Italy
pp. 107-112
Special Session 1: Aging and Wearout Issues and Mitigation Approaches
Session 6: Radiation Effects
C. Rusu, TIMA Laboratory, France
A. Bougerol, EADS, France
L. Anghel, TIMA Laboratory, France
C. Weulerse, EADS, France
N. Buard, EADS, France
S. Benhammadi, TIMA Laboratory, France
N. Renaud, ATMEL
G. Hubert, EADS, France
F. Wrobel, University of Nice-Sophia Antipolis
T. Carriere, EADS Astrium Space Transportation
R. Gaillard, INFODUC
pp. 137-145
M. Bagatin, Padova University, Italy
G. Cellere, Padova University, Italy
S. Gerardin, Padova University, Italy
A. Paccagnella, Padova University, Italy
A. Visconti, STMicroelectronics, Italy
S. Beltrami, STMicroelectronics, Italy
M. Maccarrone, STMicroelectronics, Italy
pp. 146-151
Alodeep Sanyal, University of Massachusetts at Amherst, USA
Sandip Kundu, University of Massachusetts at Amherst, USA
pp. 152-160
Session 7: Signal Integrity and Error Compensation
Partha Pratim Pande, Washington State University, USA
Amlan Gangul, Washington State University, USA
Brett Feero, Washington State University, USA
Cristian Grecu, University of British Columbia, Canada
pp. 161-166
J. Semi?, IST/INDESC-ID Lisboa, Portugal; Univ. of Algarve, Portugal
J. Freijedo, IST/INDESC-ID Lisboa, Portugal; Univ. of Vigo, Spain
J.J. Rodr?guez-Andina, Univ. of Vigo, Spain
F. Vargas, PUCRS, Brazil
M.B. Santos, IST/INDESC-ID Lisboa, Portugal
I.C. Teixeira, IST/INDESC-ID Lisboa, Portugal
J.P. Teixeira, IST/INDESC-ID Lisboa, Portugal
pp. 167-172
Muhammad M. Nisar, Georgia Institute of Technology, USA
Maryam Ashouei, Georgia Institute of Technology, USA
Abhijit Chatterjee, Georgia Institute of Technology, USA
pp. 173-182
Session 8: Posters
X. Cano, U. Barcelona, Spain
S. Bota, GTE, U. Illes Balears
R. Graciani, U. Barcelona, Spain
D. Gasc?, U. Barcelona, Spain
A. Herms, U. Barcelona, Spain
A. Comerma, U. Barcelona, Spain
J. Segura, GET, U. Illes Balears.
L. Garrido, U. Barcelona, Spain
pp. 183-184
Olivier Faurax, Ecole des Mines de St Etienne, France; Universite de la Mediterranee, France
Assia Tria, CEA-LETI, France
Laurent Freund, Ecole des Mines de St Etienne, France
Frederic Bancel, STMicroelectronics, France
pp. 185-186
Costas Argyrides, University of Bristol, UK
Dhiraj K. Pradhan, University of Bristol, UK
pp. 189-190
Alodeep Sanyal, University of Massachusetts at Amherst, USA
Kunal Ganeshpure, University of Massachusetts at Amherst, USA
Sandip Kundu, University of Massachusetts at Amherst, USA
pp. 191-193
S. Pontarelli, University of Rome "Tor Vergata", Italy
L. Sterpone, Politecnico di Torino, Italy
G.C. Cardarilli, University of Rome "Tor Vergata", Italy
M. Re, University of Rome "Tor Vergata", Italy
M. Sonza Reorda, Politecnico di Torino, Italy
A. Salsano, University of Rome "Tor Vergata", Italy
M. Violante, Politecnico di Torino, Italy
pp. 194-196
Ioannis Voyiatzis, Technological Educational Institute of Athens, Greece
pp. 197-198
Fabrice Monteiro, University of Metz, France
Stanislaw J. Piestrak, University of Metz, France
Houssein Jaber, University of Metz, France
Abbas Dandache, University of Metz, France
pp. 199-200
Illia Polian, Albert-Ludwigs-University, Germany
Damian Nowroth, Albert-Ludwigs-University, Germany
Bernd Becker, Albert-Ludwigs-University, Germany
pp. 201-202
Franz X. Ruckerbauer, Infineon Technologies AG, Germany
Georg Georgakos, Infineon Technologies AG, Germany
pp. 203-204
Mohammad Hosseinabady, University of Tehran, Iran
M.H. Neishaburi, University of Tehran, Iran
Zainalabedin Navabi, University of Tehran, Iran
Alfredo Benso, Politecnico di Torino, Italy
Stefano Di Carlo, Politecnico di Torino, Italy
Paolo Prinetto, Politecnico di Torino, Italy
Giorgio Di Natale, LIRMM, France
pp. 205-206
J. Mathew, University of Bristol, UK
H. Rahaman, University of Bristol, UK
D.K. Pradhan, University of Bristol, UK
pp. 207-208
Session 9: Fault Tolerance
K.T. Gardiner, University of Newcastle upon Tyne, UK
A. Yakovlev, University of Newcastle upon Tyne, UK
A. Bystrov, University of Newcastle upon Tyne, UK
pp. 223-230
Session 10: On-Line Testing for Analog, Mixed-Signal, RF and Delay Defect Tolerance
E. Simeu, TIMA Laboratory, France
S. Mir, TIMA Laboratory, France
R. Kherreddine, TIMA Laboratory, France
H.N. Nguyen, TIMA Laboratory, France
pp. 237-243
Swaroop Ghosh, Purdue University, USA
Patrick NDai, Purdue University, USA
Swarup Bhunia, Case Western Reserve University, USA
Kaushik Roy, Purdue University, USA
pp. 244-252
Special Session 3: Fault-Tolerant and Self-Adapting Design to Mitigate Power, Yield and Reliability Issues in Upcoming Process Nodes
Special Session 4: Reconfiguration and Fault Tolerance in Future Massively Parallel Multi-Core Chips
Xavier Vera, Intel Barcelona Research Center
Jaume Abella, Intel Barcelona Research Center
pp. 260
Session 11: Processor-Based Testing
L. Bolzani, Politecnico di Torino, Italy
E. Sanchez, Politecnico di Torino, Italy
M. Schillaci, Politecnico di Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Italy
G. Squillero, Politecnico di Torino, Italy
pp. 265-270
A. Apostolakis, University of Piraeus, Greece
M. Psarakis, University of Piraeus, Greece
D. Gizopoulos, University of Piraeus, Greece
A. Paschalis, University of Athens, Greece
pp. 271-276
R. Frost Brandenburg, University of Technology Cottbus, Germany
D. Rudolph, University of Technology Cottbus, Germany
C. Galke, University of Technology Cottbus, Germany
R. Kothe, University of Technology Cottbus, Germany
H.T. Vierhaus, University of Technology Cottbus, Germany
pp. 277-284
Session 12: Self-Checking and Self-Testing
Snehal Udar, Southern Illinois University, USA
Dimitri Kagaris, Southern Illinois University, USA
pp. 293-298
Author Index
Usage of this product signifies your acceptance of the Terms of Use.