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11th IEEE International On-Line Testing Symposium (2007)
Heraklion, Crete, Greece
July 8, 2007 to July 11, 2007
ISBN: 0-7695-2918-6
TABLE OF CONTENTS
Introduction
pp. xiii
Test Technology Educational Program (TTEP) 2007 Full-Day Tutorial
Keynote Talk
Invited Talk
Sanjiv Taneja , Vice President and General Manager of Test Technology Cadence
pp. 11
Session 1: Reliability Issues in Nanometer Technologies
Jaume Abella , Intel Barcelona Research Center
Xavier Vera , Intel Barcelona Research Center
Osman Unsal , Intel Barcelona Research Center
Oguz Ergin , Intel Barcelona Research Center
Antonio Gonz?lez , Intel Barcelona Research Center
pp. 15-22
Ming Zhang , Intel Corporation
T.M. Mak , Intel Corporation
Jim Tschanz , Intel Corporation
Kee Sup Kim , Intel Corporation
Norbert Seifert , Intel Corporation
Davia Lu , Intel Corporation
pp. 23-28
Somnath Paul , Case Western Reserve University, USA
Rajat Subhra. Chakraborty , Case Western Reserve University, USA
Swarup Bhunia , Case Western Reserve University, USA
pp. 29-36
Session 2: Network-on-Chip Reliability and Fault Tolerance
Cristian Grecu , University of British Columbia, Canada
Lorena Anghel , TIMA Laboratory, France
Partha P. Pande , Washington State University
Andre Ivanov , University of British Columbia, Canada
Resve Saleh , University of British Columbia, Canada
pp. 37-42
Daniele Rossi , University of Bologna, Italy
Paolo Angelini , University of Bologna, Italy
Cecilia Metra , University of Bologna, Italy
pp. 43-48
Atefe Dalirsani , University of Tehran, Iran
Mohammad Hosseinabady , University of Tehran, Iran
Zainalabedin Navabi , University of Tehran, Iran
pp. 49-56
Session 3: Secure Systems
G. Di Natale , Universite Montpellier II, France
M.-L. Flottes , Universite Montpellier II, France
B. Rouzeyre , Universite Montpellier II, France
pp. 57-62
Osama Al-Khaleel , Case Western Reserve University, USA
Chris Papachristou , Case Western Reserve University, USA
Francis Wolff , Case Western Reserve University, USA
Kiamal Pekmestzi , National Technical University, Greece
pp. 71-78
Session 4: Large Scale Dependability
Fabian Vargas , Catholic University-PUCRS, Brazil
Leonardo Piccoli , Catholic University-PUCRS, Brazil
Juliano Benfica , Catholic University-PUCRS, Brazil
Antonio A. de Alecrim Jr. , Catholic University-PUCRS, Brazil
Marlon Moraes , Catholic University-PUCRS, Brazil
pp. 93-100
Session 5: Dependability of Processors, SoCs and Asynchronous Circuits
Marta Portela-Garcia , Carlos III University of Madrid, Spain
Celia L?pez-Ongil , Carlos III University of Madrid, Spain
Mario Garcia-Valderas , Carlos III University of Madrid, Spain
Luis Entrena , Carlos III University of Madrid, Spain
pp. 101-106
P. Bernardi , Politecnico di Torino, Italy
L. Bolzani , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
pp. 107-112
Y. Monnet , TIMA Laboratory, France
M. Renaudin , TIMA Laboratory, France
R. Leveugle , TIMA Laboratory, France
pp. 113-120
Special Session 1: Aging and Wearout Issues and Mitigation Approaches
Keynote Talk
Session 6: Radiation Effects
Tino Heijmen , NXP Semiconductors, The Netherlands
pp. 131-136
C. Rusu , TIMA Laboratory, France
A. Bougerol , EADS, France
L. Anghel , TIMA Laboratory, France
C. Weulerse , EADS, France
N. Buard , EADS, France
S. Benhammadi , TIMA Laboratory, France
N. Renaud , ATMEL
G. Hubert , EADS, France
F. Wrobel , University of Nice-Sophia Antipolis
T. Carriere , EADS Astrium Space Transportation
R. Gaillard , INFODUC
pp. 137-145
M. Bagatin , Padova University, Italy
G. Cellere , Padova University, Italy
S. Gerardin , Padova University, Italy
A. Paccagnella , Padova University, Italy
A. Visconti , STMicroelectronics, Italy
S. Beltrami , STMicroelectronics, Italy
M. Maccarrone , STMicroelectronics, Italy
pp. 146-151
Alodeep Sanyal , University of Massachusetts at Amherst, USA
Sandip Kundu , University of Massachusetts at Amherst, USA
pp. 152-160
Session 7: Signal Integrity and Error Compensation
Partha Pratim Pande , Washington State University, USA
Amlan Gangul , Washington State University, USA
Brett Feero , Washington State University, USA
Cristian Grecu , University of British Columbia, Canada
pp. 161-166
J. Semi? , IST/INDESC-ID Lisboa, Portugal; Univ. of Algarve, Portugal
J. Freijedo , IST/INDESC-ID Lisboa, Portugal; Univ. of Vigo, Spain
J.J. Rodr?guez-Andina , Univ. of Vigo, Spain
F. Vargas , PUCRS, Brazil
M.B. Santos , IST/INDESC-ID Lisboa, Portugal
I.C. Teixeira , IST/INDESC-ID Lisboa, Portugal
J.P. Teixeira , IST/INDESC-ID Lisboa, Portugal
pp. 167-172
Muhammad M. Nisar , Georgia Institute of Technology, USA
Maryam Ashouei , Georgia Institute of Technology, USA
Abhijit Chatterjee , Georgia Institute of Technology, USA
pp. 173-182
Session 8: Posters
X. Cano , U. Barcelona, Spain
S. Bota , GTE, U. Illes Balears
R. Graciani , U. Barcelona, Spain
D. Gasc? , U. Barcelona, Spain
A. Herms , U. Barcelona, Spain
A. Comerma , U. Barcelona, Spain
J. Segura , GET, U. Illes Balears.
L. Garrido , U. Barcelona, Spain
pp. 183-184
Olivier Faurax , Ecole des Mines de St Etienne, France; Universite de la Mediterranee, France
Assia Tria , CEA-LETI, France
Laurent Freund , Ecole des Mines de St Etienne, France
Frederic Bancel , STMicroelectronics, France
pp. 185-186
Costas Argyrides , University of Bristol, UK
Dhiraj K. Pradhan , University of Bristol, UK
pp. 189-190
Alodeep Sanyal , University of Massachusetts at Amherst, USA
Kunal Ganeshpure , University of Massachusetts at Amherst, USA
Sandip Kundu , University of Massachusetts at Amherst, USA
pp. 191-193
S. Pontarelli , University of Rome "Tor Vergata", Italy
L. Sterpone , Politecnico di Torino, Italy
G.C. Cardarilli , University of Rome "Tor Vergata", Italy
M. Re , University of Rome "Tor Vergata", Italy
M. Sonza Reorda , Politecnico di Torino, Italy
A. Salsano , University of Rome "Tor Vergata", Italy
M. Violante , Politecnico di Torino, Italy
pp. 194-196
Ioannis Voyiatzis , Technological Educational Institute of Athens, Greece
pp. 197-198
Fabrice Monteiro , University of Metz, France
Stanislaw J. Piestrak , University of Metz, France
Houssein Jaber , University of Metz, France
Abbas Dandache , University of Metz, France
pp. 199-200
Illia Polian , Albert-Ludwigs-University, Germany
Damian Nowroth , Albert-Ludwigs-University, Germany
Bernd Becker , Albert-Ludwigs-University, Germany
pp. 201-202
Franz X. Ruckerbauer , Infineon Technologies AG, Germany
Georg Georgakos , Infineon Technologies AG, Germany
pp. 203-204
Mohammad Hosseinabady , University of Tehran, Iran
M.H. Neishaburi , University of Tehran, Iran
Zainalabedin Navabi , University of Tehran, Iran
Alfredo Benso , Politecnico di Torino, Italy
Stefano Di Carlo , Politecnico di Torino, Italy
Paolo Prinetto , Politecnico di Torino, Italy
Giorgio Di Natale , LIRMM, France
pp. 205-206
J. Mathew , University of Bristol, UK
H. Rahaman , University of Bristol, UK
D.K. Pradhan , University of Bristol, UK
pp. 207-208
Session 9: Fault Tolerance
Karthik Pattabiraman , University of Illinois, USA
Zbigniew Kalbarczyk , University of Illinois, USA
Ravishankar K. Iyer , University of Illinois, USA
pp. 211-216
Manuel G. Gericota , LABORIS/ISEP, Portugal
Luis F. Lemos , LABORIS/ISEP, Portugal
Gustavo R. Alves , LABORIS/ISEP, Portugal
Jose M. Ferreira , FEUP, Portugal
pp. 217-222
K.T. Gardiner , University of Newcastle upon Tyne, UK
A. Yakovlev , University of Newcastle upon Tyne, UK
A. Bystrov , University of Newcastle upon Tyne, UK
pp. 223-230
Session 10: On-Line Testing for Analog, Mixed-Signal, RF and Delay Defect Tolerance
John Liobe , Student Member, IEEE
Martin Margala , Senior Member, IEEE
pp. 231-236
E. Simeu , TIMA Laboratory, France
S. Mir , TIMA Laboratory, France
R. Kherreddine , TIMA Laboratory, France
H.N. Nguyen , TIMA Laboratory, France
pp. 237-243
Swaroop Ghosh , Purdue University, USA
Patrick NDai , Purdue University, USA
Swarup Bhunia , Case Western Reserve University, USA
Kaushik Roy , Purdue University, USA
pp. 244-252
Special Session 3: Fault-Tolerant and Self-Adapting Design to Mitigate Power, Yield and Reliability Issues in Upcoming Process Nodes
Special Session 4: Reconfiguration and Fault Tolerance in Future Massively Parallel Multi-Core Chips
Jacques Henri Collet , LAAS-CNRS, France
Piotr Zajac , LAAS-CNRS, France; Technical University of Lodz, Poland
pp. 259
Xavier Vera , Intel Barcelona Research Center
Jaume Abella , Intel Barcelona Research Center
pp. 260
Session 11: Processor-Based Testing
L. Bolzani , Politecnico di Torino, Italy
E. Sanchez , Politecnico di Torino, Italy
M. Schillaci , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
G. Squillero , Politecnico di Torino, Italy
pp. 265-270
A. Apostolakis , University of Piraeus, Greece
M. Psarakis , University of Piraeus, Greece
D. Gizopoulos , University of Piraeus, Greece
A. Paschalis , University of Athens, Greece
pp. 271-276
R. Frost Brandenburg , University of Technology Cottbus, Germany
D. Rudolph , University of Technology Cottbus, Germany
C. Galke , University of Technology Cottbus, Germany
R. Kothe , University of Technology Cottbus, Germany
H.T. Vierhaus , University of Technology Cottbus, Germany
pp. 277-284
Session 12: Self-Checking and Self-Testing
Snehal Udar , Southern Illinois University, USA
Dimitri Kagaris , Southern Illinois University, USA
pp. 293-298
Author Index
Author Index (PDF)
pp. 299
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