Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

Olivier Faurax; Frederic Bancel; Assia Tria; Laurent Freund

doi:10.1109/IOLTS.2007.57

I
IOLTS
2007
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Abstract - Robustness of circuits under delay-induced faults : test of AES with the PAFI tool

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13th IEEE International On-Line Testing Symposium (IOLTS 2007)

Robustness of circuits under delay-induced faults : test of AES with the PAFI tool (PDF)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	Olivier Faurax, Assia Tria, Laurent Freund, Frederic Bancel, "Robustness of circuits under delay-induced faults : test of AES with the PAFI tool," 11th IEEE International On-Line Testing Symposium, pp. 185-186, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.57, author = {Olivier Faurax and Assia Tria and Laurent Freund and Frederic Bancel}, title = {Robustness of circuits under delay-induced faults : test of AES with the PAFI tool}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {185-186}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.57}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Robustness of circuits under delay-induced faults : test of AES with the PAFI tool SN - 0-7695-2918-6 SP185 EP186 A1 - Olivier Faurax, A1 - Assia Tria, A1 - Laurent Freund, A1 - Frederic Bancel, PY - 2007 KW - null VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER -

Olivier Faurax, Ecole des Mines de St Etienne, France; Universite de la Mediterranee, France

Assia Tria, CEA-LETI, France

Laurent Freund, Ecole des Mines de St Etienne, France

Frederic Bancel, STMicroelectronics, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.57

Security of cryptographic circuits is a major concern. Fault attacks are a mean to obtain critical information with the use of physical disturbance and cryptanalysis. We propose a methodology and a tool to analyse the robustness of circuit under faults induced by a delay. We tested a circuit implementing AES and showed that delay faults can permit to perform known fault attacks.

Citation:

Olivier Faurax, Assia Tria, Laurent Freund, Frederic Bancel, "Robustness of circuits under delay-induced faults : test of AES with the PAFI tool," iolts, pp.185-186, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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