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12th IEEE International On-Line Testing Symposium (2006)
Lake Como
July 10, 2006 to July 12, 2006
ISBN: 0-7695-2620-9
TABLE OF CONTENTS
Introduction
Introduction
Keynote Talk
Invited Talk
Session 1: Fault Effects and Self-Checking Techniques
S. J. Piestrak , University of Metz, France
F. Monteiro , University of Metz, France
A. Dandache , University of Metz, France
S. Rossignol , iRoC Technologies SA
D. Leroy , iRoC Technologies SA
pp. 11-16
M. Oma? , University of Bologna, Italy
D. Rossi , University of Bologna, Italy
C. Metra , University of Bologna, Italy
TM Mak , Intel Corporation, USA
pp. 17-22
E. S. Sogomonyan , University of Potsdam, Germany
V. Otcheretnij , University of Potsdam, Germany
M. G?ssel , University of Potsdam, Germany
pp. 23-30
Session 2: BIST Techniques
Swaroop Ghosh , Purdue University, USA
Swarup Bhunia , Purdue University, USA
Arijit Raychowdhury , Purdue University, USA
Kaushik Roy , Purdue University, USA
pp. 31-36
Stelios Neophytou , University of Cyprus, Cyprus
Spyros Tragoudas , Southern Illinois University, USA
pp. 43-50
Session 3: Technology Robustness
G. Cellere , Padova University, Italy
A. Paccagnella , Padova University, Italy
A. Visconti , STMicroelectronics, Italy
M. Bonanomi , STMicroelectronics, Italy
pp. 51-56
Damien Giot , ST Microelectronics, France
Tino Heijmen , Philips Research Laboratories (WAY41), The Netherlands
pp. 57-62
A. Bougerol , EADS, Corporate Research Center
F. Miller , EADS, Corporate Research Center
N. Buard , EADS, Corporate Research Center
L. Anghel , TIMA Laboratory
T. Carriere , EADS, Space Transportation
G. Hubert , EADS, Corporate Research Center
R. Gaillard , INFODUC
pp. 63-74
Special Session 1: Memory Reliability Challenges
Rochit Rajsuman , Advantest America Corporation, USA
pp. 76
Special Session 2: Test and Reliability Challenges for Innovative Systems
TM Mak , Intel Corporation
pp. 79
Panel 1
Embedded Tutorials: Innovative Design for Robustness
Melanie Berg , NASA Goddard Space Flight Center Radiation Effects and Analysis Group/MEI Technologies
pp. 89-91
Marc Renaudin , TIMA Laboratory, France
Yannick Monnet , TIMA Laboratory, France
pp. 92-95
Session 4: Soft Errors and Latchup Mitigation
Andre K. Nieuwland , Philips Research Eindhoven, Netherlands
Samir Jasarevic , Philips Semiconductors, UK
Goran Jerin , Lund University, Sweden
pp. 99-104
Sandip Kundu , University of Massachusets, USA
pp. 105-110
Michael Nicolaidis , TIMA Laboratory, France
pp. 111-118
Session 5: Secure Circuits
Fr?d?ric Bancel , ST Microelectronics, France
Marie-Lise Flottes , Universit? Montpellier II, France
David H?ly , ST Microelectronics, France
pp. 119-124
M. Renaudin , TIMA Laboratory, France
Y. Monnet , TIMA Laboratory, France
N. Feyt , Gemplus Card International, France
P. Moitrel , Gemplus Card International, France
F. M'Buwa Nzenguet , Gemplus Card International, France
pp. 125-130
Mark G. Karpovsky , Boston University, USA
Konrad J. Kulikowski , Boston University, USA
pp. 131-138
Session 6: Fault Detection Techniques
Cristian Grecu , University of British Columbia, Canada
Andr? Ivanov , University of British Columbia, Canada
Res Saleh , University of British Columbia, Canada
Egor S. Sogomonyan , University of Potsdam, Germany
Partha Pratim Pande , Washington State University, USA
pp. 145-150
Ramtilak Vemu , University of Texas at Austin, USA
Jacob A. Abraham , University of Texas at Austin, USA
pp. 151-158
Session 7: Analog Circuits Dependability
V. Natarajan , Georgia Institute of Technology
A. Chatterjee , Georgia Institute of Technology
pp. 159-164
Session 8: Posters
Steffen Tarnick , 4TECH GmbH, Germany
pp. 173-175
L. Breveglieri , Politecnico di Milano, Italy
P. Maistri , Politecnico di Milano, Italy
I. Koren , Univ. of Massachusetts, USA
pp. 176-177
M. Ottavi , University of Rome "Tor Vergata", Italy
S. Pontarelli, , University of Rome "Tor Vergata", Italy
G.C. Cardarilli , University of Rome "Tor Vergata", Italy
A. Salsano , University of Rome "Tor Vergata", Italy
pp. 178-180
R. Kothe , Brandenburg University of Technology Cottbus
C. Galke , Brandenburg University of Technology Cottbus
K. Winkler , Brandenburg University of Technology Cottbus
J. Honko , Brandenburg University of Technology Cottbus
H. T. Vierhaus , Brandenburg University of Technology Cottbus
pp. 181-182
Marta Portela-Garc? , Carlos III University of Madrid. Spain
Celia L?pez-Ongil , Carlos III University of Madrid. Spain
Mario Garc?a-Valderas , Carlos III University of Madrid. Spain
pp. 183-184
Petr Fiser , Czech Technical University in Prague, Czech Republic
Hana Kub?tov? , Czech Technical University in Prague, Czech Republic
pp. 185-186
S. Habermann , Brandenburg University of Technology Cottbus, Germany
R. Kothe , Brandenburg University of Technology Cottbus, Germany
H. T. Vierhaus , Brandenburg University of Technology Cottbus, Germany
pp. 187-188
D. Nikolos , University of Patras, Greece
D. Kagaris , Southern Illinois University, USA
S. Gidaros , University of Patras, Greece
pp. 193-194
Rodrigo Possamai Bastos , Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Fernanda Lima Kastensmidt , Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Ricardo Reis , Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
pp. 195-196
Panel 2
Session 9: Reliable Systems
Riccardo Mariani , YOGITECH SpA
Peter Fuhrmann , Philips Research Laboratories
Boris Vittorelli , ARM Germany GmbH
pp. 213-218
Piotr Zajac , Technical University of Lodz, Poland
Jacques Henri Collet , Universit? de Toulouse, France
Andrzej Napieralski , Technical University of Lodz, Poland
pp. 219-228
Session 10: Dependability Analysis
M. Sonza Reorda , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 229-234
N. Kranitis , University of Athens, Greece
A. Paschalis , University of Athens, Greece
D. Gizopoulos , University of Piraeus, Greece
P. Kenterlis , University of Athens, Greece
pp. 235-241
Andr? V. Fidalgo , Instituto Superior de Engenharia do Porto, Portugal
Jos? M. Ferreira , Faculdade de Engenharia da Universidade do Porto, Portugal
pp. 242-250
Session 11: New Topics in Fault Detection
M. Lobachev , Odessa National Polytechnic University, Ukraine
A. Drozd , Odessa National Polytechnic University, Ukraine
pp. 251-256
J.J. Rodr?guez Andina , Univ. of Vigo, Spain
F. Vargas , PUCRS, Brazil
M. Rodr?guez-Irago , IST/INESC-ID Lisboa, Portugal
I.C. Teixeira , IST/INESC-ID Lisboa, Portugal
J.P. Teixeira , IST/INESC-ID Lisboa, Portugal
pp. 257-262
Danil Sokolov , University of Newcastle upon Tyne, UK
Deepali Koppad , University of Newcastle upon Tyne, UK
Alex Yakovlev , University of Newcastle upon Tyne, UK
pp. 263-268
Panel 3
Special Session 3: SER Trends: Vision and Developments from European IDMs
Tino Heijmen , Philips Research Laboratories, The Netherlands
pp. 271
G?nter Schindlbeck , Infineon Technologies
pp. 272
Session 12: Checkers and Error Correction
Daniele Rossi , D.E.I.S. University of Bologna, Italy
Martin x Martin Oma? , D.E.I.S. University of Bologna, Italy
Cecilia Metra , D.E.I.S. University of Bologna, Italy
Andrea Pagni , STMicroelectronics, Italy
pp. 275-280
Frederic Worm , Ecole Polytechnique F?ed?erale de Lausanne
Patrick Thiran , Ecole Polytechnique F?ed?erale de Lausanne
Paolo Ienne , Ecole Polytechnique F?ed?erale de Lausanne
pp. 281-286
Petros Oikonomakos , University of Cambridge, UK
Paul Fox , University of Cambridge, UK
pp. 287-292
Author Index
Author Index (PDF)
pp. 293-294
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