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12th IEEE International On-Line Testing Symposium (IOLTS'06)
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
Table of Contents
Introduction
Keynote Talk
Invited Talk
Session 1: Fault Effects and Self-Checking Techniques
D. Leroy, iRoC Technologies SA
S. J. Piestrak, University of Metz, France
F. Monteiro, University of Metz, France
A. Dandache, University of Metz, France
S. Rossignol, iRoC Technologies SA
P. Moitrel, Gemplus
pp. 11-16
C. Metra, University of Bologna, Italy
M. Oma?, University of Bologna, Italy
D. Rossi, University of Bologna, Italy
J. M. Cazeaux, University of Bologna, Italy
TM Mak, Intel Corporation, USA
pp. 17-22
D. Marienfeld, University of Potsdam, Germany
E. S. Sogomonyan, University of Potsdam, Germany
V. Otcheretnij, University of Potsdam, Germany
M. G?ssel, University of Potsdam, Germany
pp. 23-30
Session 2: BIST Techniques
Swaroop Ghosh, Purdue University, USA
Swarup Bhunia, Purdue University, USA
Arijit Raychowdhury, Purdue University, USA
Kaushik Roy, Purdue University, USA
pp. 31-36
Stelios Neophytou, University of Cyprus, Cyprus
Maria K. Michael, University of Cyprus, Cyprus
Spyros Tragoudas, Southern Illinois University, USA
pp. 43-50
Session 3: Technology Robustness
G. Cellere, Padova University, Italy
A. Paccagnella, Padova University, Italy
A. Visconti, STMicroelectronics, Italy
M. Bonanomi, STMicroelectronics, Italy
pp. 51-56
Tino Heijmen, Philips Research Laboratories (WAY41), The Netherlands
Damien Giot, ST Microelectronics, France
Philippe Roche, ST Microelectronics, France
pp. 57-62
G. Hubert, EADS, Corporate Research Center
A. Bougerol, EADS, Corporate Research Center
F. Miller, EADS, Corporate Research Center
N. Buard, EADS, Corporate Research Center
L. Anghel, TIMA Laboratory
T. Carriere, EADS, Space Transportation
F. Wrobel, University of Nice-Sophia Antipolis
R. Gaillard, INFODUC
pp. 63-74
Special Session 1: Memory Reliability Challenges
Embedded Memory Reliability Trends and Solutions
Testing Strategies for Non Volatile Memory Reliability
Rochit Rajsuman, Advantest America Corporation, USA
pp. 76
Special Session 2: Test and Reliability Challenges for Innovative Systems
Panel 1
Embedded Tutorials: Innovative Design for Robustness
Session 4: Soft Errors and Latchup Mitigation
Andre K. Nieuwland, Philips Research Eindhoven, Netherlands
Samir Jasarevic, Philips Semiconductors, UK
Goran Jerin, Lund University, Sweden
pp. 99-104
Sandip Kundu, University of Massachusets, USA
Ilia Polian, Albert-Ludwigs-University of Freiburg, Germany
pp. 105-110
Session 5: Secure Circuits
David H?ly, ST Microelectronics, France
Fr?d?ric Bancel, ST Microelectronics, France
Marie-Lise Flottes, Universit? Montpellier II, France
Bruno Rouzeyre, Universit? Montpellier II, France
pp. 119-124
Y. Monnet, TIMA Laboratory, France
M. Renaudin, TIMA Laboratory, France
R. Leveugle, TIMA Laboratory, France
N. Feyt, Gemplus Card International, France
P. Moitrel, Gemplus Card International, France
F. M'Buwa Nzenguet, Gemplus Card International, France
pp. 125-130
Session 6: Fault Detection Techniques
Cristian Grecu, University of British Columbia, Canada
Andr? Ivanov, University of British Columbia, Canada
Res Saleh, University of British Columbia, Canada
Egor S. Sogomonyan, University of Potsdam, Germany
Partha Pratim Pande, Washington State University, USA
pp. 145-150
Ramtilak Vemu, University of Texas at Austin, USA
Jacob A. Abraham, University of Texas at Austin, USA
pp. 151-158
Session 7: Analog Circuits Dependability
V. Natarajan, Georgia Institute of Technology
G. Srinivasan, Georgia Institute of Technology
A. Chatterjee, Georgia Institute of Technology
pp. 159-164
Session 8: Posters
L. Breveglieri, Politecnico di Milano, Italy
P. Maistri, Politecnico di Milano, Italy
I. Koren, Univ. of Massachusetts, USA
pp. 176-177
G.C. Cardarilli, University of Rome "Tor Vergata", Italy
M. Ottavi, University of Rome "Tor Vergata", Italy
S. Pontarelli,, University of Rome "Tor Vergata", Italy
M. Re, University of Rome "Tor Vergata", Italy
A. Salsano, University of Rome "Tor Vergata", Italy
pp. 178-180
C. Galke, Brandenburg University of Technology Cottbus
R. Kothe, Brandenburg University of Technology Cottbus
S. Schultke, Brandenburg University of Technology Cottbus
K. Winkler, Brandenburg University of Technology Cottbus
J. Honko, Brandenburg University of Technology Cottbus
H. T. Vierhaus, Brandenburg University of Technology Cottbus
pp. 181-182
Mario Garc?a-Valderas, Carlos III University of Madrid. Spain
Marta Portela-Garc?, Carlos III University of Madrid. Spain
Celia L?pez-Ongil, Carlos III University of Madrid. Spain
Luis Entrena, Carlos III University of Madrid. Spain
pp. 183-184
Pavel Kubal?, Czech Technical University in Prague, Czech Republic
Petr Fiser, Czech Technical University in Prague, Czech Republic
Hana Kub?tov?, Czech Technical University in Prague, Czech Republic
pp. 185-186
S. Habermann, Brandenburg University of Technology Cottbus, Germany
R. Kothe, Brandenburg University of Technology Cottbus, Germany
H. T. Vierhaus, Brandenburg University of Technology Cottbus, Germany
pp. 187-188
D. Nikolos, University of Patras, Greece
D. Kagaris, Southern Illinois University, USA
S. Gidaros, University of Patras, Greece
pp. 193-194
Rodrigo Possamai Bastos, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Fernanda Lima Kastensmidt, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Ricardo Reis, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
pp. 195-196
Panel 2
T. M. Mak, Intel Corporation
S. Mitra, Stanford University
pp. 199
Session 9: Reliable Systems
Jacques Henri Collet, Universit? de Toulouse, France
Piotr Zajac, Technical University of Lodz, Poland
Yves Crouzet, Universit? de Toulouse, France
Andrzej Napieralski, Technical University of Lodz, Poland
pp. 219-228
Session 10: Dependability Analysis
P. Kenterlis, University of Athens, Greece
N. Kranitis, University of Athens, Greece
A. Paschalis, University of Athens, Greece
D. Gizopoulos, University of Piraeus, Greece
M. Psarakis, University of Piraeus, Greece
pp. 235-241
Andr? V. Fidalgo, Instituto Superior de Engenharia do Porto, Portugal
Gustavo R. Alves, Instituto Superior de Engenharia do Porto, Portugal
Jos? M. Ferreira, Faculdade de Engenharia da Universidade do Porto, Portugal
pp. 242-250
Session 11: New Topics in Fault Detection
A. Drozd, Odessa National Polytechnic University, Ukraine
M. Lobachev, Odessa National Polytechnic University, Ukraine
J. Drozd, Odessa National Polytechnic University, Ukraine
pp. 251-256
M. Rodr?guez-Irago, IST/INESC-ID Lisboa, Portugal
J.J. Rodr?guez Andina, Univ. of Vigo, Spain
F. Vargas, PUCRS, Brazil
J. Semi?, INESC-ID / Univ. Algarve, Portugal
I.C. Teixeira, IST/INESC-ID Lisboa, Portugal
J.P. Teixeira, IST/INESC-ID Lisboa, Portugal
pp. 257-262
Deepali Koppad, University of Newcastle upon Tyne, UK
Danil Sokolov, University of Newcastle upon Tyne, UK
Alex Bystrov, University of Newcastle upon Tyne, UK
Alex Yakovlev, University of Newcastle upon Tyne, UK
pp. 263-268
Panel 3
Reliability in Automotive
Special Session 3: SER Trends: Vision and Developments from European IDMs
Tino Heijmen, Philips Research Laboratories, The Netherlands
pp. 271
Session 12: Checkers and Error Correction
Daniele Rossi, D.E.I.S. University of Bologna, Italy
Martin x Martin Oma?, D.E.I.S. University of Bologna, Italy
Cecilia Metra, D.E.I.S. University of Bologna, Italy
Andrea Pagni, STMicroelectronics, Italy
pp. 275-280
Frederic Worm, Ecole Polytechnique F?ed?erale de Lausanne
Patrick Thiran, Ecole Polytechnique F?ed?erale de Lausanne
Paolo Ienne, Ecole Polytechnique F?ed?erale de Lausanne
pp. 281-286
Author Index
Author Index (PDF)
pp. 293-294
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