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12th IEEE International On-Line Testing Symposium (IOLTS'06)
Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
| ASCII Text | x | ||
| Maico Cassel, Fernanda Lima Kastensmidt, "Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs," 11th IEEE International On-Line Testing Symposium, pp. 139-144, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2006.32, author = {Maico Cassel and Fernanda Lima Kastensmidt}, title = {Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2006}, isbn = {0-7695-2620-9}, pages = {139-144}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.32}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs SN - 0-7695-2620-9 SP139 EP144 A1 - Maico Cassel, A1 - Fernanda Lima Kastensmidt, PY - 2006 KW - null VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.32
This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding styles have a significant influence on the dependability of the machine in presence of bit-flips, known as Single Event Upsets (SEUs). Although the one-hot encoding style presents the best trade-off in terms of reliability, modern synthesis tools tend to optimize crucial characteristic of the one-hot style. Consequently, techniques must be applied in the hardware description language to ensure reliability of protected one-hot FSM. Results present in this paper show that fault-tolerant techniques can be easily optimized by the tools reducing the robustness of the final design. Solutions in the RTL level are proposed to ensure reliability
Citation:
Maico Cassel, Fernanda Lima Kastensmidt, "Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs," iolts, pp.139-144, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
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