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11th IEEE International On-Line Testing Symposium
Heavy Ion Effects on Configuration Logic of Virtex FPGAs
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
| ASCII Text | x | ||
| M. Alderighi, A. Candelori, F. Casini, S. D'Angelo, M. Mancini, A. Paccagnella, S. Pastore, G. R. Sechi, "Heavy Ion Effects on Configuration Logic of Virtex FPGAs," 11th IEEE International On-Line Testing Symposium, pp. 49-53, 11th IEEE International On-Line Testing Symposium, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/IOLTS.2005.31, author = {M. Alderighi and A. Candelori and F. Casini and S. D'Angelo and M. Mancini and A. Paccagnella and S. Pastore and G. R. Sechi}, title = {Heavy Ion Effects on Configuration Logic of Virtex FPGAs}, journal ={11th IEEE International On-Line Testing Symposium}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {49-53}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.31}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 11th IEEE International On-Line Testing Symposium TI - Heavy Ion Effects on Configuration Logic of Virtex FPGAs SN - 1530-1591 SP49 EP53 A1 - M. Alderighi, A1 - A. Candelori, A1 - F. Casini, A1 - S. D'Angelo, A1 - M. Mancini, A1 - A. Paccagnella, A1 - S. Pastore, A1 - G. R. Sechi, PY - 2005 KW - null VL - 0 JA - 11th IEEE International On-Line Testing Symposium ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.31
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Differently from previous radiation tests, the one here described specifically addresses configuration logic. Previously unreported failure mechanisms have been observed and classified and their corresponding cross sections measured.
Citation:
M. Alderighi, A. Candelori, F. Casini, S. D'Angelo, M. Mancini, A. Paccagnella, S. Pastore, G. R. Sechi, "Heavy Ion Effects on Configuration Logic of Virtex FPGAs," iolts, pp.49-53, 11th IEEE International On-Line Testing Symposium, 2005
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