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11th IEEE International On-Line Testing Symposium (2004)
Funchal, Madeira Island, Portugal
July 12, 2004 to July 14, 2004
ISBN: 0-7695-2180-0
TABLE OF CONTENTS
pp. xii
pp. 249
Opening Session-Keynote Talk
Session 1: Timing and Transient Faults
D. Barros J?nior , PUCRS, Porto Alegre, Brazil
F. Vargas , PUCRS, Porto Alegre, Brazil
M. B. Santos , IST / INESC-ID Lisboa, Portugal
I. C. Teixeira , IST / INESC-ID Lisboa, Portugal
J. P. Teixeira , IST / INESC-ID Lisboa, Portugal
pp. 5
Yuvraj S. Dhillon , Georgia Institute of Technology, Atlanta, GA
Abdulkadir U. Diril , Georgia Institute of Technology, Atlanta, GA
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta, GA
Adit D. Singh , Auburn University, Auburn, AL
pp. 11
Jos? Manuel Cazeaux , D.E.I.S. University of Bologna, Italy
Martin Oma? , D.E.I.S. University of Bologna, Italy
Cecilia Metra , D.E.I.S. University of Bologna, Italy
pp. 17
Session 2: Self Testing and Self Checking Circuits
V. Saposhnikov , Petersburg State Transport University
Vl. Saposhnikov , Petersburg State Transport University
A. Morozov , University of Potsdam
M. G?ssel , University of Potsdam
pp. 25
V. Ocheretnij , University of Potsdam, Germany
D. Marienfeld , University of Potsdam, Germany
E. S. Sogomonyan , University of Potsdam, Germany
M. G?ssel , University of Potsdam, Germany
pp. 31
Claudia Kretzschmar , Brandenburg University of Technology Cottbus, Germany
Christian Galke , Brandenburg University of Technology Cottbus, Germany
Heinrich T. Vierhaus , Brandenburg University of Technology Cottbus, Germany
pp. 37
Session 3: Checker and Voter Design
A. Rao , Southern Illinois University, USA
Th. Haniotakis , Southern Illinois University, USA
Y. Tsiatouhas , University of Ioannina, Greece
V. Kaky , Southern Illinois University, USA
pp. 52
Jos? Manuel Cazeaux , D.E.I.S. University of Bologna, Italy
Daniele Rossi , D.E.I.S. University of Bologna, Italy
Cecilia Metra , D.E.I.S. University of Bologna, Italy
pp. 58
Session 4: Concurrent Error Detection
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul, Brazil
Luigi Carro , Universidade Federal do Rio Grande do Sul, Brazil
Altamiro A. Susin , Universidade Federal do Rio Grande do Sul, Brazil
pp. 73
L. Bolzani , Pontif?cia Universidade Cat?lica do Rio Grande do Sul (PUCRS), Brazil
M. Rebaudengo , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
F. Vargas , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 79
Panel Session 1: On Emerging Field Reliability and Dependability Challenges
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pp. null
Session 5: Microprocessor On-Line Testing
P. D. Hyde , University of Newcastle upon Tyne, UK
G. Russell , University of Newcastle upon Tyne, UK
pp. 89
Eric F. Weglarz , University of Wisconsin - Madison
Kewal K. Saluja , University of Wisconsin - Madison
T. M. Mak , Intel Corporation, Santa Clara, CA
pp. 95
Hamid R. Zarandi , Sharif University of Technology
Seyed Ghassem Miremadi , Sharif University of Technology
Hamid Sarbazi-Azad , Sharif University of Technology; Institute for Studies in Theoretical Physics & Maths (IPM)
pp. 101
Session 6: On-Line Testing Evaluation
Mario Garc?a-Valderas , University Carlos III of Madrid, Spain
Celia L?pez-Ongil , University Carlos III of Madrid, Spain
Marta Portela-Garc? , University Carlos III of Madrid, Spain
Luis Entrena-Arrontes , University Carlos III of Madrid, Spain
pp. 109
P. Bernardi , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
L. Sterpone , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 115
Y. Monnet , TIMA laboratory, France
M. Renaudin , TIMA laboratory, France
R. Leveugle , TIMA laboratory, France
pp. 121
Session 7: Error Correcting Code Based Fault Tolerance
A. M'Sir , LICM/CESIUM, University of Metz, France
F. Monteiro , LICM/CESIUM, University of Metz, France
A. Dandache , LICM/CESIUM, University of Metz, France
B. Lepley , LICM/CESIUM, University of Metz, France
pp. 129
D. Rossi , DEIS, University of Bologna, Italy
A. Muccio , DEIS, University of Bologna, Italy
A. K. Nieuwland , Philips Research Laboratories, The Netherlands
A. Katoch , Philips Research Laboratories, The Netherlands
C. Metra , DEIS, University of Bologna, Italy
pp. 135
G. C. Cardarilli , University of Rome "Tor Vergata", Italy
M. Ottavi , University of Rome "Tor Vergata", Italy
S. Pontarelli , University of Rome "Tor Vergata", Italy
M. Re , University of Rome "Tor Vergata", Italy
A. Salsano , University of Rome "Tor Vergata", Italy
pp. 141
Session 8: Reconfiguration, Repair, and Reuse for Fault Tolerance
Amit Agarwal , Purdue University, West Lafayette, IN
Bipul C. Paul , Purdue University, West Lafayette, IN
Kaushik Roy , Purdue University, West Lafayette, IN
pp. 149
C. Metra , DEIS-U. of Bologna
A. Ferrari , DEIS-U. of Bologna
M. Oma? , DEIS-U. of Bologna
A. Pagni , STMicroelectronics (Italy)
pp. 161
Portolan Michele , TIMA Laboratory, France
Leveugle R?gis , TIMA Laboratory, France
pp. 167
Session 9: Posters
E. B? , Robert Bosch Company, Stuttgart, Germany
E. Dilger , Robert Bosch Company, Stuttgart, Germany
M. B? , Robert Bosch Company, Stuttgart, Germany
pp. 175
Thomas O'Shea , University of Limerick, Ireland
Ian Grout , University of Limerick, Ireland
pp. 176
Andr? K. Nieuwland , Philips Research Laboratories, The Netherlands
Patrick Gindner , University of Karlsruhe, Germany
pp. 177
R. Picos , Universitat de les Illes Balears, Spain
M. Roca , Universitat de les Illes Balears, Spain
E. Isern , Universitat de les Illes Balears, Spain
S. A. Bota , Universitat de les Illes Balears, Spain
E. Garc? , Universitat de les Illes Balears, Spain
pp. 179
C. A. L. Lisb? , Instituto de Inform?tica and Departamento de Engenharia El?trica - UFRGS
L. Carro , Instituto de Inform?tica and Departamento de Engenharia El?trica - UFRGS
pp. 180
Petr Fiser , Czech Technical University
Hana Kubatova , Czech Technical University
pp. 181
Debjyoti Ghosh , Purdue University, West Lafayette, Indiana
Swarup Bhunia , Purdue University, West Lafayette, Indiana
Kaushik Roy , Purdue University, West Lafayette, Indiana
pp. 182
Santosh Biswas , Indian Institute of Technology, Kharagpur, India
Siddhartha Mukhopadhyay , Indian Institute of Technology, Kharagpur, India
Amit Patra , Indian Institute of Technology, Kharagpur, India
pp. 184
Session 10: Built In Self Test
Patrick Girard , Universit? Montpellier II / CNRS, France
Olivier H?ron , Universit? Montpellier II / CNRS, France
Serge Pravossoudovitch , Universit? Montpellier II / CNRS, France
Michel Renovell , Universit? Montpellier II / CNRS, France
pp. 187
P. Karpodinis , University of Patras, Greece; Computer Technology Institute, Greece
D. Kagaris , Southern Illinois University, Carbondale
D. Nikolos , University of Patras, Greece; Computer Technology Institute, Greece
pp. 193
B. Alorda , Univ. de les Illes Balears
V. Canals , Univ. de les Illes Balears
I. de Pa? , Univ. de les Illes Balears
J. Segura , Univ. de les Illes Balears
pp. 199
Session 11: Safety and Security
Nikolaos G. Bartzoudis , Loughborough University, UK
Alexandros G. Fragkiadakis , Loughborough University, UK
David J. Parish , Loughborough University, UK
Jos? Luis N? , Loughborough University, UK
pp. 207
Elmar Dilger , Robert Bosch GmbH, Stuttgart, Germany
Roland Karrelmeyer , Robert Bosch GmbH, Stuttgart, Germany
Bernd Straube , Fraunhofer-Institut f?r Integrierte Schaltungen, Dresden, Germany
pp. 214
David H?ly , ST Microelectronics, France
Marie-Lise Flottes , LIRMM - UMII, France
Fr?d?ric Bancel , ST Microelectronics, France
Bruno Rouzeyre , LIRMM - UMII, France
Nicolas B?rard , ST Microelectronics, France
Michel Renovell , LIRMM - UMII, France
pp. 219
Session 12: Dependability Evaluation
A. Ammari , TIMA Laboratory, France
K. Hadjiat , TIMA Laboratory, France
R. Leveugle , TIMA Laboratory, France
pp. 227
B. Nicolescu , Ecole Polytechnique de Montr?al, Canada
Y. Savaria , Ecole Polytechnique de Montr?al, Canada
R. Velazco , TIMA Laboratory, France
pp. 233
Amir Rajabzadeh , Sharif University of Technology, Tehran, Iran
Seyed Ghassem Miremadi , Sharif University of Technology, Tehran, Iran
Mirzad Mohandespour , Sharif University of Technology, Tehran, Iran
pp. 239
Panel Session 2: Reliability Implications of Statistical Design
Author Index (PDF)
pp. 247
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