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9th IEEE International On-Line Testing Symposium
Kos Island, Greece
July 07-July 09
ISBN: 0-7695-1968-7
Table of Contents
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Welcome Message
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Opening Session-Keynote Talks
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Session 1: On-Line Testing Approaches
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Whitney J. Townsend, The University of Texas at Austin
Jacob A. Abraham, The University of Texas at Austin
Parag K. Lala, University of Arkansas
pp. 17
Session 2: Self Checking Circuits
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V. Ocheretnij, University of Potsdam
M. G?ssel, University of Potsdam
E. S. Sogomonyan, University of Potsdam
D. Marienfeld, University of Potsdam
pp. 25
Kartik Mohanramy, University of Texas at Austin
Egor S. Sogomonyanz, University of Potsdam
Michael G.osselz, University of Potsdam
Nur A. Toubay, University of Texas at Austin
pp. 35
Session 3: Checker Designs
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A. Matrosova, Tomsk State University, Russia
V. Ostrovsky, Tel Aviv University, Israel
I. Levin, Tel Aviv University, Israel
K. Nikitin, Tomsk State University, Russia
pp. 49
Session 4: Fault Tolerance
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D. Rossi, University of Bologna
V.E.S. van Dijk, Philips Research Laboratories
R.P. Kleihorst, Philips Research Laboratories
A.K. Nieuwland, Philips Research Laboratories
C. Metra, University of Bologna
pp. 61
Joakim Aidemark, Chalmers University of Technology
Peter Folkesson, Chalmers University of Technology
Johan Karlsson, Chalmers University of Technology
pp. 68
Panel Session 1: How Can Defect-Based Test Be Made to Work in a Foundry World?
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Session 5: Built In Self Test and Self Repair
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D. G. Nikolos, University of Partas
D. Nikolos, University of Partas; Computer Technology Institute
H. T. Vergos, University of Partas; Computer Technology Institute
C. Efstathiou, TEI of Athens
pp. 89
Session 6: Analysis and Modelling of Transient and Delay Faults
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Chaowen Yu, University of Iowa
Wei Li, University of Iowa
Sudhakar M. Reddy, University of Iowa
Irith Pomeranz, Purdue University
pp. 106
Martin Oma?, University of Bologna
Giacinto Papasso, University of Bologna
Daniele Rossi, University of Bologna
Cecilia Metra, University of Bologna
pp. 111
Session 7: Analysis and Verification of FPGA Faults
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M. Violante, Politecnico di Torino
M. Ceschia, Universit? di Padova; Istituto Nazionale di Fisica Nucleare
M. Sonza Reorda, Politecnico di Torino
A. Paccagnella, Universit? di Padova; Istituto Nazionale di Fisica Nucleare
P. Bernardi, Politecnico di Torino
M. Rebaudengo, Politecnico di Torino
D. Bortolato, Universit? di Padova
M. Bellato, Istituto Nazionale di Fisica Nucleare
P. Zambolin, Universit? di Padova
A. Candelori, Istituto Nazionale di Fisica Nucleare
pp. 119
P. Girard, Universit? Montpellier II / CNRS
O. H?ron, Universit? Montpellier II / CNRS
S. Pravossoudovitch, Universit? Montpellier II / CNRS
M. Renovell, Universit? Montpellier II / CNRS
pp. 124
M. Alderighi, Istituto di Astrofisica Spaziale e Fisica Cosmica
S. D'Angelo, Istituto di Astrofisica Spaziale e Fisica Cosmica
M. Mancini, Istituto di Astrofisica Spaziale e Fisica Cosmica
G. R. Sechi, Istituto di Astrofisica Spaziale e Fisica Cosmica
pp. 129
Session 8: On-Line Testing of Microprocessor-Based Systems
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Alfredo Benso, Politecnico di Torino
Stefano Di Carlo, Politecnico di Torino
Giorgio Di Natale, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
pp. 144
G. Xenoulis, University of Piraeus, Greece
D. Gizopoulos, University of Piraeus, Greece
N. Kranitis, University of Athens, Greece
A. Paschalis, University of Athens, Greece
pp. 149
Session 9: Posters
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Sobeeh Almukhaizim, Yale University
Petros Drineas, Rensselaer Polytechnic Institute
Yiorgos Makris, Yale University
pp. 157
V. Varshavsky, NNT Israel
I. Levin, Tel Aviv University Israel
V. Ostrovsky, Tel Aviv University Israel
pp. 158
O. Goloubeva, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
M. Violante, Politecnico di Torino
pp. 159
A. Benso, Politecnico di Torino
S. Di Carlo, Politecnico di Torino
G. Di Natale, Politecnico di Torino
P. Prinetto, Politecnico di Torino
I. Solcia, Politecnico di Torino
L. Tagliaferri, Politecnico di Torino
pp. 160
S. R. Seward, University of Arkansas
P. K. Lala, University of Arkansas
pp. 161
M. Alderighi, Istituto di Astrofisica Spaziale e Fisica Cosmica, CNR
F. Casini, Sanitas EG S.R.L.
S. D'Angelo, Istituto di Astrofisica Spaziale e Fisica Cosmica, CNR
F. Faure, TIMA Laboratory
M. Mancini, Istituto di Astrofisica Spaziale e Fisica Cosmica, CNR
S. Pastore, Sanitas EG S.R.L.
G. R. Sechi, Istituto di Astrofisica Spaziale e Fisica Cosmica, CNR
R. Velazco, TIMA Laboratory
pp. 162
F. Vargas, Catholic University - PUCRS
D. Brum, Catholic University - PUCRS
D. Prestes, Catholic University - PUCRS
L. Bolzani, Catholic University - PUCRS
E. Rhod, Catholic University - PUCRS
M. Reorda, Politecnico di Torino
pp. 163
N. Venkateswaran, WAran Research Foundation, India
V. Balaji, Sri Venkateswara College of Engineering, India
V. Mahalingam, Sri Venkateswara College of Engineering, India
T. L. Rajaprabhu, Sri Venkateswara College of Engineering, India
pp. 166
Rodrigo Picos, Universitat Illes Balears
Joan Font, Universitat Illes Balears
Eugeni Isern, Universitat Illes Balears
Miquel Roca, Universitat Illes Balears
Eugenio Garc?, Universitat Illes Balears
pp. 167
Session 10: Merging On-Line and Off-Line Testing
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M. Pflanz, IBM Deutschland Entwicklung GmbH, Germany
H. T. Vierhaus, Brandenburg TU Cottbus, Germany
pp. 173
Christian Galke, Brandenburg University of Technology Cottbus
Marcus Grabow, Brandenburg University of Technology Cottbus
Heinrich Theodor Vierhaus, Brandenburg University of Technology Cottbus
pp. 183
Panel Session 2: When Will Soft Errors Become A Design Constraint?
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Session 11: Industrial Application Cases
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Elmar Dilger, Robert Bosch GmbH
Matthias Gulbins, Fraunhofer-Institut f?r Integrierte Schaltungen
Thomas Ohnesorge, Fraunhofer-Institut f?r Integrierte Schaltungen
Bernd Straube, Fraunhofer-Institut f?r Integrierte Schaltungen
pp. 191
D. J. Beauregard, University of Illinois at Urbana-Champaign
Z. Kalbarczyk, University of Illinois at Urbana-Champaign
R. K. Iyer, University of Illinois at Urbana-Champaign
S. Chau, National Aeronautics and Space Administration
L. Alkalai, National Aeronautics and Space Administration
pp. 202
Session 12: Advanced Testing and Repair Issues
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L. Di Silvio, D.E.I.S. University of Bologna
D. Rossi, D.E.I.S. University of Bologna
C. Metra, D.E.I.S. University of Bologna
pp. 214
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