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Mixed-Signals, Sensors, and Systems Test Workshop, IEEE 14th International (2009)
Scottsdale, AZ, USA
June 10, 2009 to June 12, 2009
ISBN: 978-1-4244-4618-6
TABLE OF CONTENTS
Papers
Hans G. Kerkhoff , Testable Design and Test of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
pp. 1-4
D. Belega , Faculty of Electronics and Telecommunications, ¿Politehnica¿ University of Timisoara, Romania
D. Dallet , IMS Laboratory, University of Bordeaux-ENSEIRB, France
pp. 1-6
Seokheun Choi , Department of Electrical Engineering, Arizona State University, USA
Junseok Chae , Department of Electrical Engineering, Arizona State University, USA
pp. 1-3
Xiaoqin Sheng , Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
Hans G. Kerkhoff , Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
pp. 1-5
N. Dumas , Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Azais , Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Mailly , Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
P. Nouet , Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
pp. 1-6
M. A. Jalon , Instituto de Microelectrónica de Sevilla (IMSE), Centro Nacional de Microelectrónica (CNM-CSIC), Spain
E. Peralias , Instituto de Microelectrónica de Sevilla (IMSE), Centro Nacional de Microelectrónica (CNM-CSIC), Spain
pp. 1-6
Sachin Dasnurkar , Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
Jacob Abraham , Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
pp. 1-5
Joonsung Parky , Computer Engineering Research Center, The University of Texas at Austin, USA
Srinadh Madhavapeddiz , Texas Instruments, Dallas, USA
Alessandro Paglieri , Texas Instruments, Dallas, USA
Chris Barrz , Texas Instruments, Dallas, USA
Jacob A. Abrahamy , Computer Engineering Research Center, The University of Texas at Austin, USA
pp. 1-6
Ricardo Veiga , INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
Pedro Mota , INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
Jose Machado da Silva , INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
pp. 1-4
Hsiu-Ming Chang , Department of Electrical and Computer Engineering, University of California, Santa Barbara, U.S.A.
Kwang-Ting Cheng , Department of Electrical and Computer Engineering, University of California, Santa Barbara, U.S.A.
pp. 1-6
Shyam Kumar Devarakond , School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Vishwanath Natarajan , School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Shreyas Sen , School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Abhijit Chatterjee , School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
pp. 1-4
Hussein Al-Chami , Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, V6T 1Z4, Canada
Edmond Cretu , Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, V6T 1Z4, Canada
pp. 1-6
D.C. Keezer , Georgia Institute of Technology, Atlanta, USA
C. Gray , Georgia Institute of Technology, Atlanta, USA
D. Minier , IBM, Bromont, Canada
P. Ducharme , IBM, Bromont, Canada
pp. 1-5
Matthew Giassa , Microinstrumentation Laboratory, Simon Fraser University, USA
Ajit Khosla , Microinstrumentation Laboratory, Simon Fraser University, USA
Bonnie Gray , Microinstrumentation Laboratory, Simon Fraser University, USA
Ash Parameswaran , Engineering Science, Simon Fraser University, USA
Kirpal Kholi , Fraser Valley Cancer Centre, USA
Ramani Rameseshan , Fraser Valley Cancer Centre, USA
pp. 1-5
Zhiwei Wang , Dept. ECE, Concordia University, Montreal, Quebec, Canada
Naeem Abbasi , Dept. ECE, Concordia University, Montreal, Quebec, Canada
Rajeev Narayanan , Dept. ECE, Concordia University, Montreal, Quebec, Canada
Mohamed H. Zaki , Dept. CS, University of British Columbia, Vancouver, Canada
Ghiath Al Sammane , Dept. ECE, Concordia University, Montreal, Quebec, Canada
Sofiene Tahar , Dept. ECE, Concordia University, Montreal, Quebec, Canada
pp. 1-8
Rajeev Narayanan , Dept. of ECE, Concordia University, Montreal, Quebec, Canada
Mohamed H. Zaki , Dept. of CS, University of British Columbia, Vancouver, Canada
Sofiene Tahar , Dept. of ECE, Concordia University, Montreal, Quebec, Canada
pp. 1-8
Sachin Dileep Dasnurkar , Department of Electrical&Computer Engineering, The University of Texas at Austin, 78712 U.S.A.
Jacob A. Abraham , Department of Electrical&Computer Engineering, The University of Texas at Austin, 78712 U.S.A.
pp. 1-5
Yindar Chuo , Center for Integrative Biomedical Engineering Research at Simon Fraser University in Burnaby, British Columbia, Canada
Bozena Kaminska , Center for Integrative Biomedical Engineering Research at Simon Fraser University in Burnaby, British Columbia, Canada
pp. 1-6
Mohamed Amine Miled , Polystim Neurotechnologies Laboratory, Department of Electrical Engineering, École Polytechnique de Montreal, Québec, Canada
Mohamad Sawan , Polystim Neurotechnologies Laboratory, Department of Electrical Engineering, École Polytechnique de Montreal, Québec, Canada
pp. 1-4
Aurelien Tcheghoyz , Department of Analog Design for Test, Infineon Technologies, 85579 Neubiberg, Germany
Sebastian Sattler , Institute for Electronic Design Automation, Technische Universität München, 80333 Munich, Germany
Helmut Graby , Chair of Reliable Circuits and Systems, Friedrich-Alexander-Universität Erlangen-Nürnberg, 91052, Germany
pp. 1-8
Front matter (PDF)
pp. 1
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