• I
  • IMS3TW
  • 2009
  • 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop
Advanced Search 
2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test Workshop
Scottsdale, AZ, USA
June 10-June 12
ISBN: 978-1-4244-4618-6
Table of Contents
Papers
Hans G. Kerkhoff, Testable Design and Test of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
pp. 1-4
D. Belega, Faculty of Electronics and Telecommunications, ¿Politehnica¿ University of Timisoara, Romania
D. Dallet, IMS Laboratory, University of Bordeaux-ENSEIRB, France
pp. 1-6
Seokheun Choi, Department of Electrical Engineering, Arizona State University, USA
Junseok Chae, Department of Electrical Engineering, Arizona State University, USA
pp. 1-3
Xiaoqin Sheng, Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
Hans G. Kerkhoff, Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
pp. 1-5
N. Dumas, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Azais, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Mailly, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
P. Nouet, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
pp. 1-6
M. A. Jalon, Instituto de Microelectrónica de Sevilla (IMSE), Centro Nacional de Microelectrónica (CNM-CSIC), Spain
E. Peralias, Instituto de Microelectrónica de Sevilla (IMSE), Centro Nacional de Microelectrónica (CNM-CSIC), Spain
pp. 1-6
Sachin Dasnurkar, Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
Jacob Abraham, Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
pp. 1-5
Joonsung Parky, Computer Engineering Research Center, The University of Texas at Austin, USA
Srinadh Madhavapeddiz, Texas Instruments, Dallas, USA
Alessandro Paglieri, Texas Instruments, Dallas, USA
Chris Barrz, Texas Instruments, Dallas, USA
Jacob A. Abrahamy, Computer Engineering Research Center, The University of Texas at Austin, USA
pp. 1-6
Ricardo Veiga, INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
Pedro Mota, INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
Jose Machado da Silva, INESC Porto, Faculdade de Engenharia, Universidade do Porto, Rua Dr. Roberto Frias, Campus FEUP, 4200-465, Portugal
pp. 1-4
Hsiu-Ming Chang, Department of Electrical and Computer Engineering, University of California, Santa Barbara, U.S.A.
Kwang-Ting Cheng, Department of Electrical and Computer Engineering, University of California, Santa Barbara, U.S.A.
pp. 1-6
Shyam Kumar Devarakond, School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Vishwanath Natarajan, School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Shreyas Sen, School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
Abhijit Chatterjee, School of Electrical Engineering, Georgia Institute of Technology, Atlanta, 30332, USA
pp. 1-4
Hussein Al-Chami, Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, V6T 1Z4, Canada
Edmond Cretu, Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, V6T 1Z4, Canada
pp. 1-6
D.C. Keezer, Georgia Institute of Technology, Atlanta, USA
C. Gray, Georgia Institute of Technology, Atlanta, USA
D. Minier, IBM, Bromont, Canada
P. Ducharme, IBM, Bromont, Canada
pp. 1-5
Matthew Giassa, Microinstrumentation Laboratory, Simon Fraser University, USA
Ajit Khosla, Microinstrumentation Laboratory, Simon Fraser University, USA
Bonnie Gray, Microinstrumentation Laboratory, Simon Fraser University, USA
Ash Parameswaran, Engineering Science, Simon Fraser University, USA
Kirpal Kholi, Fraser Valley Cancer Centre, USA
Ramani Rameseshan, Fraser Valley Cancer Centre, USA
pp. 1-5
Zhiwei Wang, Dept. ECE, Concordia University, Montreal, Quebec, Canada
Naeem Abbasi, Dept. ECE, Concordia University, Montreal, Quebec, Canada
Rajeev Narayanan, Dept. ECE, Concordia University, Montreal, Quebec, Canada
Mohamed H. Zaki, Dept. CS, University of British Columbia, Vancouver, Canada
Ghiath Al Sammane, Dept. ECE, Concordia University, Montreal, Quebec, Canada
Sofiene Tahar, Dept. ECE, Concordia University, Montreal, Quebec, Canada
pp. 1-8
Rajeev Narayanan, Dept. of ECE, Concordia University, Montreal, Quebec, Canada
Mohamed H. Zaki, Dept. of CS, University of British Columbia, Vancouver, Canada
Sofiene Tahar, Dept. of ECE, Concordia University, Montreal, Quebec, Canada
pp. 1-8
Sachin Dileep Dasnurkar, Department of Electrical&Computer Engineering, The University of Texas at Austin, 78712 U.S.A.
Jacob A. Abraham, Department of Electrical&Computer Engineering, The University of Texas at Austin, 78712 U.S.A.
pp. 1-5
Yindar Chuo, Center for Integrative Biomedical Engineering Research at Simon Fraser University in Burnaby, British Columbia, Canada
Bozena Kaminska, Center for Integrative Biomedical Engineering Research at Simon Fraser University in Burnaby, British Columbia, Canada
pp. 1-6
Mohamed Amine Miled, Polystim Neurotechnologies Laboratory, Department of Electrical Engineering, École Polytechnique de Montreal, Québec, Canada
Mohamad Sawan, Polystim Neurotechnologies Laboratory, Department of Electrical Engineering, École Polytechnique de Montreal, Québec, Canada
pp. 1-4
Aurelien Tcheghoyz, Department of Analog Design for Test, Infineon Technologies, 85579 Neubiberg, Germany
Sebastian Sattler, Institute for Electronic Design Automation, Technische Universität München, 80333 Munich, Germany
Helmut Graby, Chair of Reliable Circuits and Systems, Friedrich-Alexander-Universität Erlangen-Nürnberg, 91052, Germany
pp. 1-8
Usage of this product signifies your acceptance of the Terms of Use.