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2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2008) (2008)
Vancouver, BC
June 18, 2008 to June 20, 2008
ISBN: 978-1-4244-2395-8
TABLE OF CONTENTS
Papers
IEEE copyright form (Abstract)
pp. 1-2
Papers
R. E. Mallard , CMC Microsystems Kingston, Ontario, K7L 3N6, Canada
pp. 1-2
Kuldip N. Modha , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
Ian M. Stockford , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
Roger Light , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
Matt Clark , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
Mark Pitter , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
Barrie Hayes-Gill , SiOS Labs, Applied Optics Group, School of Electrical/Electronic Engineering, University of Nottingham, NG7 2RD, UK
pp. 1-4
Xiao Zhang , Testable Design and Test of Integrated Systems Group, CTIT University of Twente, Enschede, the Netherlands
Frits van Proosdij , Testable Design and Test of Integrated Systems Group, CTIT University of Twente, Enschede, the Netherlands
Hans G. Kerkhoff , Testable Design and Test of Integrated Systems Group, CTIT University of Twente, Enschede, the Netherlands
pp. 1-7
Daniel Davids , Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, 28223, USA
Bharat Joshi , Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, 28223, USA
Arindam Mukherjee , Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, 28223, USA
Arun Ravindran , Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, 28223, USA
pp. 1-4
Zhao Lu , NanoRobotics Laboratory, Department of Computer and Software Engineering, Canada
Jaouad El-Fouladi , NanoRobotics Laboratory, Department of Computer and Software Engineering, Canada
Sylvain Martel , NanoRobotics Laboratory, Department of Computer and Software Engineering, Canada
Yvon Savaria , Department of Electric Engineering, École Polytechnique de Montréal, Campus of the University of Montréal, QC, CANADA
pp. 1-7
Abhilash Goyal , Georgia Institute of Technology, Department of Electrical and Computer Engineering, Atlanta, USA
Madhavan Swaminathan , Georgia Institute of Technology, Department of Electrical and Computer Engineering, Atlanta, USA
pp. 1-5
Chun Wei Lin , Department of Electronic Engineering, National Yunlin University of Science&Technology, Douliou, Taiwan
Sheng Feng Lin , Department of Electronic Engineering, National Yunlin University of Science&Technology, Douliou, Taiwan
Shih Fen Luo , Department of Electronic Engineering, National Yunlin University of Science&Technology, Douliou, Taiwan
pp. 1-5
Z. Xu , Centre for Microsystems Engineering, Engineering Department, Lancaster University, LA1 4YR, UK
D. Koltsov , Centre for Microsystems Engineering, Engineering Department, Lancaster University, LA1 4YR, UK
S. Saha , Centre for Microsystems Engineering, Engineering Department, Lancaster University, LA1 4YR, UK
A. Richardson , Centre for Microsystems Engineering, Engineering Department, Lancaster University, LA1 4YR, UK
A. Sutherland , Ultra Electronics ¿ BCF, Phoenix House, Phoenix Way, Cirencester, GL7 1QG, UK
pp. 1-4
Adam Osseiran , National Networked TeleTest Facility, Edith Cowan University, Joondalup, WA, 6027 Australia
pp. 1-5
Stone Cheng , Department of Mechanical Engineering, National Chiao-Tung University, Hsinchu , China
Po-Chien Chou , Department of Mechanical Engineering, National Chiao-Tung University, Hsinchu , China
pp. 1-6
Reik Muller , Institute for Traffic Communications Engineering, Dresden University of Technology, Germany
Carsten Wegener , Infineon Technologies AG, Munich, Germany
Hans-Joachim Jentschel , Institute for Traffic Communications Engineering, Dresden University of Technology, Germany
pp. 1-6
Xueyi Yu , Department of Electronics Engineering, Tsinghua University, Beijing, China 100084
Guolin Li , Department of Electronics Engineering, Tsinghua University, Beijing, China 100084
Lingwei Zhang , Institute of Microelectronics, Tsinghua University, Beijing, China 100084
Zhihua Wang , Institute of Microelectronics, Tsinghua University, Beijing, China 100084
pp. 1-5
Ebrahim Ghafar-Zadeh , Polystim Neurotechnologies Laboratory, Ecole Polytechnque de Montréal, Canada
Mohamad Sawan , Polystim Neurotechnologies Laboratory, Ecole Polytechnque de Montréal, Canada
Arghavan Shabani , Biosensor devision, Biophage Pharma Inc., Canada
Mohammed Zourob , Biosensor devision, Biophage Pharma Inc., Canada
Vamsy Chodavarapu , Electrical Engineering Department, McGill University, Canada
pp. 1-4
V. L. Geurkov , Ryerson University, ELCE, 350 Victoria Street, Toronto, ON M5B 2K3 Canada
pp. 1-4
Xuan-Lun Huang , Graduate Institute of Electronics Engineering, Department of Electrical Engineering, National Taiwan University, Taipei 106, Taiwan
Yuan-Chi Yu , Graduate Institute of Electronics Engineering, Department of Electrical Engineering, National Taiwan University, Taipei 106, Taiwan
Jiun-Lang Huang , Graduate Institute of Electronics Engineering, Department of Electrical Engineering, National Taiwan University, Taipei 106, Taiwan
pp. 1-6
Sachin Dasnurkar , Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
Jacob Abraham , Computer Engineering Research Center, The University of Texas at Austin, 78712 U.S.A.
pp. 1-6
Benjamin Mustin , Technische Universität Dresden, George-Bähr-Str. 3, 01069, Germany
Boris Stoeber , The University of British Columbia, 2054-6250 Applied Science Lane, Vancouver, B.C. V6T 1Z4, Canada
pp. 1-6
Zhongcheng Gong , Institute for Micromanufacturing, Louisiana Tech University, USA
Tae-Woo Lee , Center for Computation&Technology, Louisiana State University, USA
Long Que , Institute for Micromanufacturing, Louisiana Tech University, USA
pp. 1-6
Jasbir N. Patel , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Bozena Kaminska , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Bonnie L. Gray , School of Engineering Science, Simon Fraser University, Burnaby, BC, Canada
Byron D. Gates , Department of Chemistry, Simon Fraser University, Burnaby, BC, Canada
pp. 1-5
Sumanjit Singh Lubana , Dept. of Electrical and Computer Engineering, University of Waterloo, Canada, N2L 3G1
Hossein Sarbishaei , Dept. of Electrical and Computer Engineering, University of Waterloo, Canada, N2L 3G1
Manoj Sachdev , Dept. of Electrical and Computer Engineering, University of Waterloo, Canada, N2L 3G1
pp. 1-6
Deuk Lee , School of ECE, Georgia Tech, USA
Rajarajan Senguttuvan , School of ECE, Georgia Tech, USA
Abhijit Chatterjee , School of ECE, Georgia Tech, USA
pp. 1-5
Ahcene Bounceur , TIMA Laboratory, 46, Avenue Félix Viallet, 38031 Grenoble Cedex, France
Salvador Mir , TIMA Laboratory, 46, Avenue Félix Viallet, 38031 Grenoble Cedex, France
pp. 1-6
N. Dumas , Laboratoire d¿Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Azais , Laboratoire d¿Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
F. Mailly , Laboratoire d¿Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
P. Nouet , Laboratoire d¿Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM), Université Montpellier II / CNRS, 161 Rue Ada, 34392 Cedex 5, France
pp. 1-6
Xiaoqin Sheng , Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
Hans Kerkhoff , Testable Design and Testing of Integrated Systems Group, CTIT, University of Twente, Enschede, the Netherlands
Amir Zjajo , NXP Semiconductors, HighTech Campus 37, 5656 AE Eindhoven, the Netherlands
Guido Gronthoud , NXP Semiconductors, HighTech Campus 37, 5656 AE Eindhoven, the Netherlands
pp. 1-7
Wael M. El-Medany , Department of Communications and Electrical Engineering, Faculty of Engineering, Fayoum University, Egypt
pp. 1-4
Yang Zhao , Department of Electrical and Computer Engineering, Duke University, Durham, NC 27708, USA
Krishnendu Chakrabarty , Department of Electrical and Computer Engineering, Duke University, Durham, NC 27708, USA
pp. 1-6
T.O. Myers , Department of Engineering, University of Hull, UK
I.M. Bell , Department of Engineering, University of Hull, UK
pp. 1-6
Samar Haroun , Department of Chemistry, Simon Fraser University, Burnaby, BC, V5A 1S6, Canada
Paul C.H. Li , Department of Chemistry, Simon Fraser University, Burnaby, BC, V5A 1S6, Canada
pp. 1-6
Bernard Courtois , CMP, 46 avenue Felix Viallet, 38031 Grenoble Cedex, France
Benoit Charlot , IES/MITEA, Université Montpellier II, place E. Bataillon, 34095 cedex 5, France
Gregory Di Pendina , CMP, 46 avenue Felix Viallet, 38031 Grenoble Cedex, France
Libor Rufer , TIMA Laboratory, 46 avenue Felix Viallet, 38031 Grenoble, France
pp. 1-4
Jonas Flueckiger , Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, Canada
Karen C. Cheung , Department of Electrical&Computer Engineering, University of British Columbia, Vancouver, Canada
pp. 1-6
Bonnie L. Gray , Microinstrumentation Lab, School of Engineering Science, Simon Fraser University, Burnaby, BC V5A1S6, Canada
Seema Jaffer , Microinstrumentation Lab, School of Engineering Science, Simon Fraser University, Burnaby, BC V5A1S6, Canada
Derek G. Sahota , Department of Engineering Physics, McMaster University, Hamilton, ON L8S 4L7, Canada
Stephanie M. Westwood , Microinstrumentation Lab, School of Engineering Science, Simon Fraser University, Burnaby, BC V5A1S6, Canada
pp. 1-5
A. Asquini , STMicroelectronics ¿ Crolles, France
Franck Badets , STMicroelectronics ¿ Crolles, France
Salvador Mir , TIMA Laboratory ¿ Grenoble, France
Jean-Louis Carbonero , STMicroelectronics ¿ Crolles, France
Laroussi Bouzaida , STMicroelectronics ¿ Crolles, France
pp. 1-5
D.C. Keezer , Georgia Institute of Technology, Atlanta, USA
D. Minier , IBM, Bromont, Canada
P. Ducharme , IBM, Bromont, Canada
pp. 1-6
O. Ginez , Université de Provence (Aix-Marseille I), L2MP-UMR CNRS 6137, 13451 Cedex 20, France
J.M. Portal , Université de Provence (Aix-Marseille I), L2MP-UMR CNRS 6137, 13451 Cedex 20, France
H. Aziza , Université de Provence (Aix-Marseille I), L2MP-UMR CNRS 6137, 13451 Cedex 20, France
pp. 1-6
A. Nojeh , Department of Electrical and Computer Engineering, University of British Columbia, 2332 Main Mall, Vancouver, Canada
P. Pande , School of Electrical Engineering and Computer Science, Washington State University, PO Box 642752, Pullman, USA
A. Ganguly , School of Electrical Engineering and Computer Science, Washington State University, PO Box 642752, Pullman, USA
S. Sheikhaei , Department of Electrical and Computer Engineering, University of British Columbia, 2332 Main Mall, Vancouver, Canada
B. Belzer , School of Electrical Engineering and Computer Science, Washington State University, PO Box 642752, Pullman, USA
A. Ivanov , Department of Electrical and Computer Engineering, University of British Columbia, 2332 Main Mall, Vancouver, Canada
pp. 1-6
Yuchun Chen , Department of Chemistry, Simon Fraser University, Burnaby, BC, V5A1S6, Canada
Paul C.H. Li , Department of Chemistry, Simon Fraser University, Burnaby, BC, V5A1S6, Canada
pp. 1-5
Andrew Labun , School of Engineering, University of British Columbia Okanagan, 3333 University Way, Kelowna, V1V 1V7, Canada
pp. 1-5
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